FIGURE 1.

Two segmental bone defect models with critical sized defects were studied. Postoperative intramedullary nail (IMN25) X-rays are shown on the left, and dual-plating (ORIF40) X-rays are shown on the right.

Two segmental bone defect models with critical sized defects were studied. Postoperative intramedullary nail (IMN25) X-rays are shown on the left, and dual-plating (ORIF40) X-rays are shown on the right.