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. 2023 Jan 10;6(2):827–831. doi: 10.1021/acsanm.2c04934

Figure 1.

Figure 1

(a) Synchrotron GIXRD diffractogram for our ALD/MLD Cu-BDC thin film compared to the simulated pattern of reported crystal structure ZUBKEO.27 (b) Reciprocal space map of an ALD/MLD Cu-BDC thin film obtained from synchrotron GIXRD. The simulated Bragg peaks for a (320) crystalline orientation are overlaid on the positive qxy side of the map. Red points at the center of circles give the expected positions of the diffraction peaks, and the areas inside the circles give the square of the structure factors, which are proportional to the expected intensities.