Table 3. Reported Encapsulations and Performance Parameters for PSCs Subjected to Long Term Outdoor Tests (η Denotes Power Conversion Efficiency, η0 Denotes Initial Efficiency)a.
| encapsulation | device type, architecture | η (%) | test time, T80 | final η (%) | ref |
|---|---|---|---|---|---|
| butyl rubber edge sealant (Quanex), HelioSeal PVS 101 contact seal | Si/perovskite (inverted) tandem | ∼23 | 6 months, – | ∼45% of initial power density | (46) |
| ThreeBond edge sealant, SiO2 film | PSC, conventional | 14.8 | 432 h, – | ∼11 | (51) |
| polyurethane | module, conventional mesoscopic with C | 10 | 3 months, >3 months | 97.52% of η0 | (48) |
| UV curable epoxy | PSC, conventional | ∼ 5–6 | 560 h, ∼100 h | 0 | (58) |
| UV curable epoxy, glass, waterproof silicone | PSC, conventional mesoscopic with C | ∼5–9 | 30 days, over 30 days | no significant decrease | (59) |
| blanket PIB, UV curable epoxy edge seal | PSC, inverted | ∼20 | 1728 h, >1728 h | 87% of η0 | (41) |
| fluoropolymer coating | PSC, conventional | ∼17 | 2160 h, 2160 h | 95% of η0 | (47) |
| EVA | module, inverted | ∼6–12 | 800–2200 h, 80–1442 h | ∼55% initial power | (44) |
| epoxy, Surlyn, cover glass | PSC, conventional mesoscopic with C | 12.9 | 7 days, >168 h | slight increase | (50) |
| Ossila, Encapsulation Epoxy E131 | PSC, conventional | 11.02 | 1008 h, 846 h | 60% of η0 | (57) |
| glass, Pattex silicon | module, conventional mesoscopic with C | ∼ 8 | 30 days, >30 days | no significant change | (138) |
| hydrophobic zirconia film | PSC, conventional mesoscopic with C | ∼15–16 | 150 days, >150 days | no significant degradation | (63) |
| polyolefin, cover glass | Si/perovskite (inverted) tandem | 25.1 | 1 week, – | – | (64) |
| two component resin edge encapsulation | PSC, inverted | 18.5% | 111 days, 35 days T50 | – | (136) |
| PMMA/SB, Al sheet | PSC, conventional | ∼19 | 500 h, 500 h | 90% of η0 | (76) |
Empty spaces in the table indicate that information was not provided, for example, T80 not given, or if the efficiency was given for different device configuration compared to long term stability test.