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. Author manuscript; available in PMC: 2023 Sep 29.
Published in final edited form as: IEEE J Solid-State Circuits. 2022 Sep 29;57(11):3243–3257. doi: 10.1109/jssc.2022.3204508

Fig. 4.

Fig. 4.

The AFE configurations for (a) classifier training with high-density sensing, and (b) channel-selective inference, where any subset of 64 input channels can be selectively processed on a window-by-window basis.