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. Author manuscript; available in PMC: 2023 Sep 29.
Published in final edited form as: IEEE J Solid-State Circuits. 2022 Sep 29;57(11):3243–3257. doi: 10.1109/jssc.2022.3204508

Fig. 5.

Fig. 5.

Illustration of EDO fluctuations at the input of the proposed TDM AFE in channel-selective inference mode. Among 256 input channels, up to 64 channels with unique EDOs are multiplexed to the AFE in each feature extraction window. Therefore, the AFE must cancel the EDOs that change abruptly between successive channels and feature extraction windows.