. Author manuscript; available in PMC: 2023 Sep 29.
Published in final edited form as: IEEE J Solid-State Circuits. 2022 Sep 29;57(11):3243–3257. doi: 10.1109/jssc.2022.3204508
Personal use is permitted, but republication/redistribution requires IEEE permission. See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.
Fig. 9.
Configurable TDM FIR filter and multi-symptom TDM FEE.