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. 2023 Jan 31;14:1087285. doi: 10.3389/fpls.2023.1087285

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Copyright © 2023 Tan, Chen, Gan, Lu, Yan, Chen, Lin, Yang, Zhao, Ba, Zhu, Bu, Liu, Liu, Wang and Zhang

This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.

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Stigma shape and its correlations with grain shape. (A), Stigma shape of the SSSLs and PLs. Scale bar, 0.5 mm. (B-D), Stigma length (B), stigma width (C), and stigma RLW (D) in the SSSLs and PLs. Data are shown as mean ± S.E. of two cropping seasons. Capital letters indicate significant differences at the 0.01 level. (E-G), Correlations between grain length and stigma length (E), between grain width and stigma width (F), and between grain RLW and stigma RLW (G). The average value of each line in two cropping seasons is used to perform correlation analysis. R² represents the percentage of x contribution to y phenotype variation. SSSL, single-segment substitution line. PL, pyramiding line. RLW, ratio of length to width.