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. 2023 Feb 15;14:840. doi: 10.1038/s41467-023-36512-1

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© The Author(s) 2023

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 1 — a The side-view (interlayer bc-plane) and b the top-view (intralayer ab-plane) of CCPS atomic structure, Cu, Cr, P, and S ions are represented by green, blue, red, and yellow balls, respectively. c The XRD scan indicating (002), (004), and (008) peak reflections for the ab-plane of as-grown CCPS single crystal. The inset shows a photo of the crystal bulk. d High-resolution TEM image of the ab-plane confirming good single crystalline, with scale-up capture in the inset. e The simulated and f the measured electron diffraction image of monoclinic CCPS structure along the c axis, showing high consistency. The hexagonal patterns connected by dotted red lines in (e) and (f) correspond to the one connected by dotted black lines in (b).