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. 2023 Feb 16;14:532. doi: 10.1038/s41467-023-36268-8

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© The Author(s) 2023

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 2 — a A high-angle annular dark-field (HAADF)-STEM image of the FIB section from C0040-02-Chd, b a combined elemental map in Mg (red), Si (green), and Ca (blue) X-rays of a rectangle area drawn with the dashed line in panel (a), c a bright field (BF)-TEM image of olivine and diopside in an area of C0040-02-Chd, and d, e selected-area electron diffraction (SAED) patterns from forsterite along the [4 $\bar{1}$ 2] zone axis and diopside along the [215] zone axis. Abbreviations in panel (b): Ol, olivine; Di, diopside; Mtx, matrix. The 120° triple junctions are indicated by the vertex of an open triangle in panel (c). Circled areas in panel (c) represent analysis spots of electron diffraction on forsterite (Fo) and diopside (Di).