Fig. 6. Endurance and retention.

a Endurance of a FeFET with L = 800 nm and W = 600 nm. Triangular pulses with a frequency of 100 kHz were applied up to 10¹⁰ cycles. The amplitude of the pulses was ±3 V and ±4 V. The evolution of the HRS and LRS (left axis) and the corresponding dynamic range (right axis) are shown. b Retention measurements at room temperature for a FeFET with L = 300 nm and W = 2 μm showing a good retention of >10 years for the four programmed states. Only the HRS has a small drift. The solid lines are the experimental data and the dashed lines are linear extrapolations in the log-log scale.