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. 2022 Dec 19;7(2):170–181. doi: 10.1038/s41550-022-01841-6

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© The Author(s) 2022

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Extended Data Fig. 2 — Secondary electron (SE) images of (a) a smooth layer on the Ryugu grain A0104–02909600. (b, c) A surface of the non-space weathered Ryugu grain C0107–HE01 (b) before and (c) after a 4 keV He+ irradiation experiment. (d, e) Bright-field (BF) TEM images, diffraction maps, and electron diffraction patterns of (d) natural and (e) artificial smooth layers on Ryugu grains, which are described in (a) and (b), respectively. In both cases, the smooth layers in the cross-section samples A0104–02809802 and C0107–HE01 are amorphized as shown in the insets of electron diffraction patterns #1 in (d) and (e).

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