. 2023 Jan 20;17(3):2399–2410. doi: 10.1021/acsnano.2c09482

Table 2. Calculated n_eff Values for Guided TE and TM Modes and Comparison of the Calculated Thicknesses h of the Waveguide Layer with the Results Obtained from the AFM Measurements at the Corresponding Positions within the Sample.

Table 2. Calculated neff Values for Guided TE and TM Modes and Comparison of the Calculated Thicknesses h of the Waveguide Layer with the Results Obtained from the AFM Measurements at the Corresponding Positions within the Sample.