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. 2023 Feb 8;23(4):1902. doi: 10.3390/s23041902

Table 15.

Machine learning models in studies.

ML Models Number of Studies Studies Type of Faults Importance of Faults Environment of the Tested Result Efficiency of the Method
Random forests 3 [48,50,59] Machine faults, including vibration, rotation, noise, sealing, oxidation, and elongation. Four types of conditions: no-fault, ball bearing fault, main shaft fault, and combined faults. Important. Laboratory and applied in on mining industry. Level 5
Support vector machine 4 [4,23,40,47] Damage to idler bearing and roller, off-center rotation, drum impact. Important. Laboratory and applied in on mining industry. Level 5
Decision tree 1 [58] Faulty bearings and shafts. Less important. Laboratory. Level 1
Gradient boosting 1 [8] Artificially defected bearings Less important. Laboratory. Level 1
KNN 1 [40] Broken roller and off-center rotation causing drum collision. Important. Laboratory and applied in on mining industry. Level 1
K star 1 [45] Faulty bearings and shafts. Less important. Laboratory. Level 1
Isolation forest 1 [12] Bearing fault, thermo fault, and shell collapse. Important. Validated in the real condition in Western Australia for 10 months
Laboratory.
Level 3
Naïve Baise 1 [46] Damage to bearings and shafts. Less important. Laboratory. Level 1
Multilayer perceptron 1 [50] Abnormal movement of a roller, off-center rotation, excessive noise, inadequate seals, damage from oxidation, and elongation of rollers. Important. Validated in real condition. Level 3
Artificial neural network 4 [23,40,46,60] Damage to idler bearings, main shaft faults, broken roller, off-center roller rotation, and tire wear. Important. Laboratory and validated in real conditions. Level 5
Convolutional Neural network 2 [24,59] Stuck and fracture roller. Important. Laboratory and validated in real conditions. Level 5
LSTM autoencoder 1 [44] Surface of roller tubes, roller unbalance, and radial offset. Important. Laboratory and validated in real conditions. Level 3

Note: Important can lead to device fault; Less-important can lead to incipient fault. Level 5 is the most efficient approach for the efficiency of the method, and level 1 is the least efficient approach.