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. 2023 Jan 13;10(7):2206029. doi: 10.1002/advs.202206029

Figure 3.

Figure 3

a) FT‐IR spectra of Co‐Ni‐MOF‐0, Co‐Ni‐MOF‐0.1, and Co‐Ni‐MOF‐0.2. b) X‐ray diffraction (XRD) patterns and c) Raman spectra of CoSe2‐NiSe2/NPFC, CoSe2/NPFC, and NiSe2/NPFC. XPS peaks of d) Ni 2p, e) Co 2p, and f) Se 3d for CoSe2‐NiSe2/NPFC, NiSe2/NPFC, and Ni foil. XANES spectra at the g) Ni K‐edge and h) Co K‐edge for CoSe2‐NiSe2/NPFC and other materials. The corresponding FT EXAFS data at the i) Ni K‐edge and j) Co K‐edge for CoSe2‐NiSe2/NPFC and other materials. WT EXAFS plots at the k) Ni K‐edge and l) Co K‐edge for CoSe2‐NiSe2/NPFC and other materials.