Supporting information for Jonas et al. (2002) Proc. Natl. Acad. Sci. USA 99 (8), 5034–5039. (10.1073/pnas.082634799)

Fig. 5. (A) Atomic force microscopy image (height range of 10 nm) of a substrate surface obtained by a nonoptimized [3-(triethoxy-silanyl)-propyl]carbamic acid 4,5-dimethoxy-2-nitrobenzyl ester (NVoc) silanization process (100 mg of 1 N NaOH catalyst). (B) Smooth NVoc silane layer (height range of 3 nm) from optimized process (50 mg of 1 N NaOH).