This PDF file includes:

• Note S1. Brief description of the DPC STEM system.
• Fig. S1. Schematic of DPC STEM.
• Fig. S2. Reconstruction processes in DPC STEM.
• Fig. S3. Selected-area electron diffraction patterns from 10 numbered areas.
• Fig. S4. HAADF STEM image of the area near the structural grain boundary between grain I and grain II, where we performed STEM EDX characterization.
• Fig. S5. Process to synthesize Fig. 4A.
• Fig. S6. Preliminary quantitative analysis of the flexibility of skyrmions.
• Fig. S7. Another example of magnetic Σ7 domain boundary.
• Table S1. Specimen tilting angles for the selected-area electron diffraction patterns listed in fig. S3.
• Table S2. STEM EDX characterization of the thin film.

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