Supplementary Materials

This PDF file includes:

  • fig. S1. Powder x-ray diffraction pattern for ground single crystals of ZrSiS.
  • fig. S2. AMR measured in other principal directions along with symmetry fitting.
  • fig. S3. Extracted weights from AMR fitting.
  • fig. S4. Quantitative quantum oscillation analysis using band pass filtration.
  • fig. S5. Direct Lifshitz-Kosevich fitting compared with Landau Level fan diagram.
  • References (42–44)

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