This PDF file includes:

• fig. S1. Height profile of the solidified droplet of TES ADT.
• fig. S2. Polarized optical micrographs of MoO_x thin films with different thicknesses.
• fig. S3. Illustrative plots of the volumetric and areal nucleation rates with respect to temperature.
• fig. S4. Polarized optical micrographs of MoO_x thin films (100 nm) at different annealing times.
• fig. S5. QCM-D measurements during solvent vapor annealing.
• fig. S6. Atomic force microscopy topography image of a TES ADT film scratched with a needle.
• fig. S7. Optical micrographs of TES ADT and PCBM films crystallized using linear seeding.
• fig. S8. μGIWAXS images of the α_p and α phases.
• fig. S9. Typical OTFT output characteristics of TES ADT thin films using conventional and programmable crystallization.
• Legends for movies S1 to S5
• References (41, 42)

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Other Supplementary Material for this manuscript includes the following:

• movie S1 (format). Conventional crystallization of a TES ADT film proceeding stochastically and incoherently.
  
• movie S2 (format). Linear programmed crystallization of TES ADT proceeding simultaneously and coherently from horizontal seeding lines.
• movie S3 (format). Periodic dot array crystallization of TES ADT proceeding simultaneously and coherently from an array of imprinted seed dots.
• movie S4 (format). Square programmed crystallization of TES ADT proceeding simultaneously and coherently from horizontal and vertical seeding lines.
• movie S5 (format). Square and rectangular programmed crystallization of TES ADT proceeding simultaneously and coherently from horizontal and vertical seeding lines.

Download Movies S1 to S5