Supplementary Materials
This PDF file includes:
- section S1. Bulk gallium structural analysis
- section S2. Stability of gallenene sheets
- section S3. Effect of thickness on the band structure of gallenene
- section S4. Stamping technique of solid-melt exfoliation
- section S5. AFM analysis of Ga films
- section S6. Contact angle measurements
- section S7. Substrate effects on gallenene
- section S8. Absorption measurements on gallenene
- section S9. XPS measurements on Ga/MoS2 heterostructures
- section S10. Structural stability of Ga/MoS2 heterostructures
- section S11. Thermal conductivity of gallenene
- section S12. Defects in gallenene
- section S13. Polymorphism in gallenene
- section S14. Exfoliation of ultrathin Sn sheets
- fig. S1. Structure of gallium.
- fig. S2. Bonding nature of gallium.
- fig. S3. Phonon dispersion of gallenene.
- fig. S4. Effect of number of layers of gallenene b010.
- fig. S5. Effect of number of layers of gallenene a100.
- fig. S6. Stamping technique used for simultaneous exfoliation of multiple samples.
- fig. S7. AFM analysis.
- fig. S8. Thickness for different substrates.
- fig. S9. Contact angle measurements.
- fig. S10. Gallenene on different substrates.
- fig. S11. Gallenene on Si.
- fig. S12. Gallenene on Si.
- fig. S13. Gallenene on Ag.
- fig. S14. Gallenene on Al.
- fig. S15. Gallenene on Si.
- fig. S16. Gallenene on Ni.
- fig. S17. Gallenene on GaN.
- fig. S18. Band structure of gallenene on different substrates.
- fig. S19. XPS measurements of heterostructures.
- fig. S20. Structure of heterostructure.
- fig. S21. Thermal properties of gallenene.
- fig. S22. Thermal conductivity variation as a function of temperature.
- fig. S23. Defects in gallenene.
- fig. S24. Defects in gallenene.
- fig. S25. Polymorphism.
- fig. S26. Thin film of tin.
- table S1. Contact angle of Ga on different substrates.
- table S2. Structural parameters of the substrate and gallenene.
- References (80–84)
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