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. Author manuscript; available in PMC: 2016 Jun 6.
Published in final edited form as: Interface Focus. 2015 Jun 6;5(3):20140083. doi: 10.1098/rsfs.2014.0083

Figure 1.

Figure 1

Scanning electron micrographs from secondary electrons (SEI) (top view & inset: cross section) of NiO films. (A) shows a triple-layer of NiO synthesized with PS-b-P2VP as template, (B) to (D) show F108-templated NiO with increasing number of layers from 1 to 3.