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. Author manuscript; available in PMC: 2020 Sep 8.
Published in final edited form as: ACS Appl Mater Interfaces. 2020 Aug 5;12(33):37732–37740. doi: 10.1021/acsami.0c09630

Figure 3.

Figure 3

(a–c) Helium ion microscopy images and (d–f) mapping of the local Young modulus from the elastic deformations observed by atomic force microscopy of the oCVD thin films elaborated at a substrate temperature of (a, d) 25 °C, (b, e) 150 °C, and (c, f) 200 °C.