Skip to main content
. Author manuscript; available in PMC: 2010 May 12.
Published in final edited form as: J Vac Sci Technol B Microelectron Nanometer Struct Process Meas Phenom. 2009 Dec 4;27(6):3099–3103. doi: 10.1116/1.3264675

Fig. 3.

Fig. 3

The current sensor system has three sources of noise. The device under test (DUT) has thermal noise, then there is the noise from the current amplifier, and finally the A to D noise which is negligible compared to the other two.