Figure 6. Robustness to spike time jitter.

(A) Example electrode showing the mean estimation accuracy as a function of the spike time jittering for an example electrode in V1 (spontaneous activity). For each value of σ_jitter, we randomly shifted each spike train by an amount taken from a gaussian distribution with mean=0 and standard deviation σ_jitter (see scheme at the top). We show the mean estimation accuracy averaged across all test trials. Error bars indicate one SEM. “r₀” denotes the estimation accuracy obtained for σ_jitter=0. The continuous line indicates a fit with the following function: $r=r_0-\frac{r_0·{\sigma }_{\text{jitter}}^n}{{\sigma }_{\text{jitter}}^n+{{}_{50}\sigma }_{\text{jitter}}^n}$ where ₅₀σ_jitter and n are free parameters.

(B) For each electrode, we repeated the procedure described in (A) and normalized r by dividing it by r₀ (“Normalized estimation accuracy”). We show the mean normalized estimation accuracy across all electrodes (n=88) using the “electrode-specific” filters.

(C) Distribution of ₅₀σ_jitter for all V1 electrodes recorded during spontaneous activity (n=88). The black arrow shows the position of the example from part (A). The dashed vertical line indicates the mean value: the mean value of ₅₀σ_jitter was 172 ± 89 ms (mean±SD). Bin size = 25 ms.