Laser desorption postionization mass spectrometer (LDPI-MS) instrument schematic with inset showing expanded view of (a) ionization/extraction region ion optics. (b) is reflectron time-of-flight mass analyzer, (c) is reflectron detector, (d) is vacuum compatible translation stage, (e) is load lock, (f) is 349 nm Nd:YLF desorption laser, (g) is 157 nm fluorine laser for VUV postionization, and (h) is camera for optical imaging of sample.