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. Author manuscript; available in PMC: 2018 Feb 1.
Published in final edited form as: FEBS Lett. 2017 Nov 19;591(23):3850–3860. doi: 10.1002/1873-3468.12898

Fig. 4.

Fig. 4

Reliability of the extended beta distribution fit. (A) Iapp of KcvNTS at 1 M KCl as obtained with the 1-kHz filter (black circles) or from filtering the 10-kHz data from Meca-4 chips to ca. 1 kHz by a moving average filter (blue circles). IOF as determined by the extended beta distribution fit with 1-kHz filter (Eq. 1, open black circles, n = 3) and IOF directly measured with the 10-kHz filter (open red circles n = 4). (B) Representative current traces of KcvNTS in 1 M KCl filtered at 10 kHz. Closed channel and IOF are labelled as C and OF, respectively. (C) Current Iapp measured at 1 kHz for KcvNTS at 0.1 M (black) and 1.5 M KCl (blue) compared with Iapp (gray and orange) as calculated from averaging over O-M and O-F gating (Eq. 2). Mean and standard deviation of 6 and 3 experiments at 0.1 and 1.5 M, respectively.