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. Author manuscript; available in PMC: 2018 Mar 20.
Published in final edited form as: Nano Lett. 2018 Feb 21;18(3):1962–1971. doi: 10.1021/acs.nanolett.7b05354

Figure 5.

Figure 5

Example trace (top) of the change in proximity ratio Esm* for a single trapped origami structure (measured and averaged proximity ratio for each voltage step) with steps in voltage (2 seconds, ΔV = 100 mV) from 100 to 400 mV (bottom) for A design A1 and B design A2.