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. 2023 Jun 1;9(6):e16838. doi: 10.1016/j.heliyon.2023.e16838

Fig. 8.

Fig. 8

(a) J-V curve with varying ETL/absorber interface defect density in the light condition, (b) QE vs. wavelength of ETL/absorber interface defect density (c) J-V curve with varying absorber/HTM interface defect density in the light condition and (d) QE vs. wavelength of absorber/HTM interface defect density for PSCs with HTM.