Abstract
We have constructed a combined TappingMode atomic force microscope and scanning ion conductance microscope. The design is based on a bent glass pipette that acts as both the force sensor and conductance probe. Measuring the pipette deflection allows more stable feedback than possible with previous versions of the scanning ion conductance microscope. Using this microscope, we have imaged synthetic membranes in both contact and tapping modes under fluid. Although contact mode operation is possible, we found that our microscope provided higher contrast and less apparent sample damage in the topographic and ionic conductance images in the tapping mode.
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