Skip to main content
ACS Measurement Science Au logoLink to ACS Measurement Science Au
. 2025 Jun 17;5(4):497–510. doi: 10.1021/acsmeasuresciau.5c00030

Precision in Peak Parameter Estimation for the Pseudo-Voigt Profile: A Novel Optimization Approach for High-Precision Analysis via Mixing Parameter Control

Yuuki Hagiwara 1,*, Tatsu Kuwatani 1
PMCID: PMC12371587  PMID: 40861916

Abstract

High-precision measurement of peak parameters such as intensity (I), peak position (ω c ), full width at half-maximum (Γ), and area (A) is pivotally important for advancing scientific research. Achieving high-precision requires elucidating the physical principles governing measurement precision and establishing guidelines for optimizing analytical conditions. Although the pseudo-Voigt profile is a widely used line-shape model, the underlying principles governing the precision of its parameter estimation remained unclear. For this study, we developed a model to quantify the parameter estimation precision under arbitrary conditions by integrating theoretical analysis, numerical calculations, and Monte Carlo simulations. Our quantification results indicate that when the mixing parameter (η) is fixed, the precision of I, Γ, and A is proportional to {ΔxI}0.5, whereas the precision of ω c is proportional to {ΓΔx/I}0.5, where Δx denotes the sampling interval. Furthermore, the analytical precision exhibits η-dependence: for I and Γ, when the profile becomes more Lorentzian, the absolute value of the covariance between Γ and η as well as between I and η increases, thereby degrading their estimation precision. This finding suggests that in addition to conventional methods such as improving the signal-to-noise ratio and reducing sampling interval, appropriately controlling η can be an effective strategy for optimizing precision. For instance, if broadening effects (e.g., instrumental or Doppler broadening) are deliberately introduced to tune η from 1 to 0, then this alone improves Γ estimation precision by a factor of 3.7, equivalent to a 14-fold increase in signal intensity. Furthermore, when the effect of increased Γ due to broadening is considered, even greater improvements in precision can be achieved. Overall, our model provides a foundational framework for research on peak parameter estimation. It serves as an alternative approach to error estimation when experimental evaluation is challenging and as a quantitative tool for assessing precision gain from instrument upgrades.

Keywords: precision, pseudo-voigt profile, signal processing, curve fitting, Fisher information, Cramér–Rao inequality


graphic file with name tg5c00030_0010.jpg


graphic file with name tg5c00030_0008.jpg


Across a broad range of fields, peak parameters extracted from signal data, such as intensity (I), peak position (ω c ), full width at half-maximum (Γ), and area (A), serve as key indices for evaluating the physicochemical properties of materials. These parameters must be estimated with the highest possible precision to identify subtle phenomena that are difficult to discern and to facilitate more rapid analyses with minimal sample quantities. These demands underscore the importance and challenges of achieving precise estimation in various fields and analytical techniques.

In practice, observed line profiles result from the simultaneous contributions of multiple factors, including Doppler broadening caused by thermal motion, instrumental broadening, crystal size or lattice strain broadening, , and natural, pressure, or power broadening. , Consequently, neither a purely Gaussian profile nor a purely Lorentzian profile describes these profiles adequately; instead, the Voigt profile, defined as the convolution of the two functions, emerges as the most appropriate model. However, because the Voigt profile lacks a closed-form analytical expression, its use in data analysis and curve fitting incurs high computational costs.

To address this issue, the pseudo-Voigt profile (eq ) has been employed as a computationally efficient approximation that retains the essential characteristics of the original Voigt profile. Numerous studies have specifically examined the accuracy of the approximation of the pseudo-Voigt profile and development of methods to estimate the original physical parameters more accurately from the extracted parameters. ,− However, to achieve high-precision measurements efficiently, it is imperative not only to assess the approximation accuracy but also to elucidate the underlying physical principles that define the limits of peak parameter estimation precision, thereby providing guidelines for optimizing analytical instruments and measurement conditions. To date, no study has investigated the physical principles that establish these limits for the pseudo-Voigt profile.

Earlier studies of the precision of peak parameter estimation have predominantly examined Gaussian profiles and Lorentzian profiles. However, most of these studies used assumed conditions in which the peaks have low signal-to-noise ratios (SNR) and the noise follows the Gaussian noise limit. Consequently, their analyses are not applicable to high-precision measurement conditions, where the SNR is high and Poisson noise predominates. Under the Poisson noise limit, noise is intensity-dependent and is more complex. Studies of precision under this limit are scarce, even for Gaussian and Lorentzian profiles individually. ,, Moreover, the precision of area estimation is influenced by the covariance between intensity and bandwidth (as well as with η in the pseudo-Voigt profile), yet few studies have considered this factor, even for the well-studied Gaussian profiles. ,−

Accordingly, this study has three main objectives: (1) to elucidate the physical principles which define the limits of precision in estimating each peak parameter of the pseudo-Voigt profile under the Poisson noise limit, (2) to clarify the effect of optimizing the mixing parameter η on high-precision analysis, alongside conventional strategies such as increasing the SNR and using a finer sampling interval, thereby proposing new guidelines for precision enhancement, and (3) to provide a definitive answer to the longstanding question in analytical chemistry of whether intensity ratios or area ratios serve as more precise indicators. To achieve these objectives, we have developed a model to quantify the estimation precision of each peak parameter, in addition to their ratios and differences, for the pseudo-Voigt profile under the Poisson noise limit, integratively employing theoretical analyses based on the Cramér–Rao inequality and Fisher information, numerical calculations, and Monte Carlo simulations. For this study, we use general peak parameters such as I, Γ, the sampling interval (Δx), and η to establish a methodology that is independent of any specific analytical technique or field. Furthermore, we take advantage of a unique opportunity to compare the estimation precision of peak parameters for the pseudo-Voigt profile directly with those for Gaussian and Lorentzian profiles, thereby elucidating how profile shape differences affect the parameter estimation precision.

The model for peak parameter estimation precision derived in this study is expected to serve as a foundation for extensive research on analytical precision, with various applications including the following: (1) providing an alternative method for estimating errors when experimental error determination is challenging because of limited data; ,, (2) enabling the quantitative assessment of precision improvements resulting from instrumentation upgrades by integrating our model with analyses of the relationship between peak parameters and analytical device performance; (3) providing guidelines for system improvement by determining whether analytical precision has reached its theoretical limit or is constrained by external factors, thereby identifying bottlenecks in precision enhancement; and (4) serving as a benchmark for evaluating novel analytical methods.

Theory

Analytical expressions for the Fisher information matrix are derived under the following seven assumptions: (1) the noise variance equals the signal intensity at all data points. (2) The data sampling interval (Δx) remains constant throughout the analysis region. (3) The peak intensity is zero outside the sampling range. (4) The profile is sampled finely enough for summation to be approximated by integration. (5) The baseline is constant. (6) Peaks do not mutually interfere. (7) Noise at each data point is statistically independent. It can be approximated by a Gaussian probability density function because of the high mean intensity. This approximation is justified by the central limit theorem, which allows the Poisson noise distribution to approximate a Gaussian distribution when the signal intensity is high.

The pseudo-Voigt profile is expressed as a function of intensity (I), peak position (ω c ), full width at half-maximum (Γ), and the mixing parameter (η) by the following equation

γPV(ωi;θ̂)=I[(1η)exp{4ln(2)(ωiωcΓ)2}+η11+4(ωiωcΓ)2] 1

Here, the parameter vector is defined as θ = (θ1, θ2, θ3, θ4) = (I, ω c , Γ, and η). The unit of I is not a digital count but an absolute physical unit that reflects the characteristics of Poisson noise (e.g., photons or electrons). Mixing parameter η represents the contribution of the Lorentzian component, where η = 0 corresponds to a purely Gaussian profile and η = 1 corresponds to a purely Lorentzian profile.

Next, the lower bound of the variance–covariance matrix C is constrained using the inverse of the Fisher information matrix F , , as expressed by the Cramér–Rao inequality: , CF1 . This inequality implies a fundamental limit to the precision with which the model parameters can be estimated. The Fisher information matrix is defined as one-half of the Hessian matrix H , with its elements given as

Fkl=12Hkl=122χ2θkθl=i(γ(ωi;θ)θkγ(ωi;θ)θl+2γ(ωi;θ)θkθlRi)σi2 2

The quantity χ2 is defined as the weighted sum of squared residuals: in{[γ(ωi;θ̂)γi]/σi}2 ) where the residual at the i-th data point is given as R i (= γ(ωi;θ̂)γi ). Here, σ i represents the total noise variance at each data point. For the pseudo-Voigt profile under the Poisson noise limit, it is given as σi2=γ(ωi;θ̂) . Because the second term in eq is negligible, the matrix elements of F can be approximated as Fkli(γ(ωi;θ)θkγ(ωi;θ)θl)σi2 . Furthermore, the summation in eq can be approximated as

Fkl1Δxγ(ωi;θ)θkγ(ωi;θ)θlσi2dωi 3

From eqs –, the elements of the Fisher information matrix F kl for the pseudo-Voigt profile are given as

F11PV=Γ2IΔx[πln2(1η)+πη] 4
F12PV=F23PV=F24PV=0 5
F13PV=12Δx[πln2(1η)+πη] 6
F14PV=Γ2Δx[ππln2] 7
F22PV=64IΓΔx(ωiωcΓ)2K(ωi)2(1η)G(ωi)+ηL(ωi)dωi 8
F33PV=64IΓΔx(ωiωcΓ)4K(ωi)2(1η)G(ωi)+ηL(ωi)dωi 9
F34PV=8IΓΔx(ωiωcΓ)2K(ωi)[L(ωi)G(ωi)](1η)G(ωi)+ηL(ωi)dωi 10
F44PV=ΓIΔx[L(ωi)G(ωi)]2(1η)G(ωi)+ηL(ωi)dωi 11

Here, the functions are defined as G i ) = exp­[−4ln(2)­{(ω i – ω c )/Γ}2], L i ) = 1/[1 + 4­{(ω i – ω c )/Γ}2], and K i ) = [(1−η) ln(2)G i ) + ηL i )2]. Superscripts PV, G, and L respectively denote that the variable is associated with the pseudo-Voigt, Gaussian, and Lorentzian profile. In eqs –, the integrals include a numerator involving the squared combination of G i ) and L i ), whereas the denominator consists of their weighted sum, (1 – η)G i ) + ηL i ). As a result, these integrals cannot be expressed in terms of their elementary functions. Consequently, only the matrix elements F 11 , F 12 , F 13 , F 14 , F 23 , and F 24 have closed-form analytical expressions. As a result, the Fisher information matrix for the estimated parameter vector, θ̂, in the pseudo-Voigt profile, denoted by FPV , is given as

FPV=(Γ[πln2(1η)+πη]2IΔx0[πln2(1η)+πη]2ΔxΓ[ππln2]2Δx0F22PV00[πln2(1η)+πη]2Δx0F33PVF34PVΓ[ππln2]2Δx0F34PVF44PV) 12

Because the Fisher information matrix is symmetric by definition, the matrix FPV is also symmetric. For the Gaussian and Lorentzian profiles, the Fisher information matrices FG and FL are 3 × 3 matrices. All their elements can be expressed analytically as presented below ,

FG=12πln2(ΓIΔx01Δx08ln2IΓΔx01Δx03IΓΔx) 13
FL=π2(ΓIΔx01Δx02IΓΔx01Δx03I2ΓΔx) 14

It is noteworthy that, for the Gaussian profile, the calculations of FG , CG , and σθk*G were performed after correcting the coefficient error in the F 33 term reported by Hagiwara and Kuwatani (details are provided in another report of our work). Figure presents the values of the matrix elements F kl calculated for the Gaussian, Lorentzian, and pseudo-Voigt profiles based on eqs –. Theoretical values for the Gaussian and Lorentzian profiles (eqs and ) are in agreement with results of our numerical calculations (Figures S1 and S2).

1.

1

Dependence of the Fisher information matrix elements F kl on the mixing parameter (η). Green circles and pink squares respectively represent the values of the Fisher information matrix elements F kl for the Gaussian and Lorentzian profiles, computed under the conditions I = 1000, Γ = 10, and Δx = 0.1 according to eqs and . Gray dashed lines show the analytically derived values of F kl for the pseudo-Voigt profile (specifically F 11, F 12, F 13, F 14, F 23, and F 24). Light blue crosses denote the numerically computed F kl for the pseudo-Voigt profile, together with their corresponding fitted curves. All numerical calculations were performed with I = 1000, ω c = 0, Γ = 10, Δx = 0.1, and η of 0.001–0.999 (Table S1).

Next, using eqs – and the relation C =F1 , we compute the variance–covariance matrix C . For the pseudo-Voigt profile, only C 12 = C 23 = C 24 = 0 can be expressed analytically. By contrast, all elements of the covariance matrix for the Gaussian and Lorentzian profiles can be expressed in closed form as ,

CG=ln2π(3IΔxΓ02Δx014ln2ΓΔxI02Δx0ΓΔxI) 15
CL=2π(3IΔxΓ02Δx0ΓΔx2I02Δx02ΓΔxI) 16

Figure presents the covariance matrix elements C kl for the Gaussian and Lorentzian profiles, as calculated from eqs and . The theoretical values are in agreement with results of our numerical calculations (Figures S3 and S4).

2.

2

Dependence of the variance–covariance matrix elements C kl on the mixing parameter (η). Green circles and pink squares respectively display the values of the variance–covariance matrix elements C kl for the Gaussian and Lorentzian profiles, calculated under the conditions I = 1000, Γ = 10, and Δx = 0.1 based on eqs and . Light blue crosses represent the numerically computed C kl for the pseudo-Voigt profile, along with their fitted curves. Each element C kl was obtained as the inverse of the Fisher information matrix (i.e., C=F1 ). Calculations were performed under the same conditions as those of Figure , with η of 0.001–0.999 (Table S1).

We then note that the standard deviation of each peak parameter σθk is given as Ckk . Using standard error propagation, we compute the relative or absolute standard deviations for I, ω c , Γ, and η, as well as for the intensity ratio (R I = I w /I s ), peak position difference (Δω = |ω w – ω s |), full width at half maximum (fwhm) ratio (R Γ = Γ w s ), and η ratio (Rη = η w s ). Here, subscripts w and s stand for the weaker and stronger peaks. Because an analytical solution for C kl is not available for the pseudo-Voigt profile, the standard deviations cannot be expressed in terms of elementary functions. In contrast, for the Gaussian and Lorentzian profiles, the standard deviations can be expressed analytically, as presented below.

For the Gaussian profile ,

σI*G=σIGI={3ln2πΔxIΓ}1/2 17
σωcG={14πln2ΓΔxI}1/2 18
σΓ*G=σΓGΓ={ln2πΔxIΓ}1/2 19
σRI*G=σRIGRI={3ln2π1Iw(ΔxwΓw+RIΔxsΓs)}1/2 20
σΔωG={14πln21Iw(ΓwΔxw+RIΓsΔxs)}1/2 21
σRΓ*G=σRΓGRΓ={ln2π1Iw(ΔxwΓw+RIΔxsΓs)}1/2 22

For the Lorentzian profile

σI*L=σILI={6ΔxπIΓ}1/2 23
σωcL={ΓΔxπI}1/2 24
σΓ*L=σΓLΓ={4ΔxπIΓ}1/2 25
σRI*L=σRILRI={6πIw(ΔxwΓw+RIΔxsΓs)}1/2 26
σΔωL={1πIw(ΓwΔxw+RIΓsΔxs)}1/2 27
σRΓ*L=σRΓLRΓ={4πIw(ΔxwΓw+RIΔxsΓs)}1/2 28

Here, the asterisk denotes the relative standard deviation.

Next, we derive the standard deviation of the area A PV. Area is a function of I, Γ, and η. It is given as

APV=12πln2(1η)IΓ+π2ηIΓ 29

For this derivation, the integration range is assumed to be infinite. However, for practical analyses, the integration range is finite; it might affect the computed peak area. Because A PV is proportional to the product IΓη, its precision must account for the covariances among these parameters. The variance of A PV, denoted σAPV2 , is given as the product of the covariance matrix CPV and the gradient of A PV with respect to θ̂ as

σAPV2=APVθ̂TCPVAPVθ̂ 30

with APVθ̂T = (APVI,APVωc,APVΓ,APVη)T . Thus, the variance is expressed as

σAPV2=(APVI)2σIPV2+(APVΓ)2σΓPV2+(APVη)2σηPV2+2i<jAPVθiAPVθjCov(θi,θj) 31

The partial derivatives of A PV with respect to I, Γ, and η are

APVI=12πln2(1η)Γ+π2ηΓ 32
APVΓ=12πln2(1η)I+π2ηI 33
APVη=IΓ[π212πln2] 34

Furthermore, the covariance contribution in eq is

i<jAPVθiAPVθjCov(θi,θj)=APVIAPVΓC13PV+APVIAPVηC14PV+APVΓAPVηC34PV 35

In eq the first and third terms are negative, whereas the second term is positive (Figure S5). Because eq includes terms that cannot be expressed analytically, the standard deviation of the area for the pseudo-Voigt profile cannot be represented in the closed form. In contrast, the analytical solutions for the relative standard deviations of the area and the area ratio for the Gaussian and Lorentzian profiles are

σA*G=σAGAG={2ln2πΔxIΓ}1/2 36
σA*L=σALAL={2πΔxIΓ}1/2 37
σRA*G=σRAGRA={2ln2π1Iw(ΔxwΓw+RIΔxsΓs)}1/2 38
σRA*L=σRALRA={2πIw(ΔxwΓw+RIΔxsΓs)}1/2 39

From the equations presented above, the analytical expressions for the relative standard deviations of R I , R Γ, and R A for the Gaussian and Lorentzian profiles are identical, apart from constant coefficients. Consequently, the ratios are ,

σRI*G:σRΓ*G:σRA*G=3:1:2 40
σRI*L:σRΓ*L:σRA*L=3:2:1 41

Figure presents the relative and absolute standard deviations computed based on eqs –.

3.

3

(a–e, g–k) Light blue crosses denote the standard deviations obtained from the diagonal elements of the numerically computed variance–covariance matrix, with corresponding fitted approximations shown as light blue curves. Green circles and pink squares respectively denote the theoretical standard deviations σθk*G and σθk*L for the Gaussian and Lorentzian profiles, calculated from eqs – and – under the conditions I = 1000, Γ = 10, and Δx = 0.1. (f, l) show the dependence of the relative standard deviation ratios (σ R I R A , σ R Γ R A , and σ R I R Γ ) on the mixing parameter η. Filled circles and squares correspond to theoretical values at η = 0 and η = 1, respectively, as derived from eqs and . Numerical and theoretical results were obtained under I = 1000, ω c = 0, Γ = 10, Δx = 0.1, with η varying from 0.0001 to 0.9999 (Table S1). Open symbols represent results from Monte Carlo simulations, with corresponding data in Table S2. Error bars show the 95% confidence intervals computed using eqs S15 and S16.

The precision of peak parameter estimation for Gaussian profiles under the Poisson noise limit was derived earlier by Hagen et al. and by Hagiwara and Kuwatani. However, their formulations differ in both the coefficients and the variable terms. This discrepancy likely arises from differences in the definition of Poisson noise: Hagen et al. defined the variance as σ i = Δx γG(ωi;θ̂) , whereas Hagiwara and Kuwatani used γG(ωi;θ̂) . As a result, the analytical expression for precision derived by Hagen et al. lacks a Δx term, implying that the sampling interval does not influence precision. This conclusion contradicts both the qualitative reasoning and our simulation results. In contrast, the precision of peak parameter estimation for Lorentzian profiles under the Poisson noise limit has only been derived by Hagiwara and Kuwatani. Hagiwara and Kuwatani verified the consistency of eqs – and – using Monte Carlo simulations, whereas for this study, we further confirm their agreement with numerical calculations (Figures S2 and S4). No report of an earlier study has described the examination of the precision of peak parameter estimation for the pseudo-Voigt profile. Therefore, this study offers a unique opportunity for systematic comparison of the estimation precision of peak parameters for pseudo-Voigt, Gaussian, and Lorentzian profiles.

Methods

Numerical Calculation

For verification of the consistency between the analytical solutions and the numerical results, and for numerical evaluation of the matrix elements of the pseudo-Voigt profile that cannot be expressed in closed form, we performed numerical calculations of the Fisher information matrix F and its inverse, the covariance matrix C . These computations were implemented by using the Python programming language. The matrix elements F kl were computed according to eq and S1–S4 as the integral: (γ(ωi;θ)θkγ(ωi;θ)θl)σi2 , where integration was performed numerically over the interval [−50,000, 50,000] using the function scipy.integrate.quad. The calculations were conducted under the conditions of I = 1000, ω c = 0, Γ = 10, and Δx = 0.1, with η varied from 0.0001 to 0.9999, resulting in a total of 42 distinct parameter sets for FPV . In addition, the inverse of F was computed via the numpy.linalg.inv function to obtain C , thereby evaluating the lower bound of the precision in parameter estimation as stipulated by the Cramér–Rao inequality. The relative standard deviations of the area and area ratio were calculated by combining the obtained variance–covariance matrix with eqs –.

The results obtained for FPV and CPV are depicted in Figures and , where they are represented by light blue cross symbols and corresponding approximation curves. The standard deviation for each peak parameter, computed as σθk=Ckk , is presented in Figure with light blue cross symbols and fitted curves. All numerical data for F , C , and σθk are presented in Table S1.

Monte Carlo Simulation

To validate the precision of peak parameter estimates obtained from theoretical and numerical calculations, we performed Monte Carlo simulations. For this approach, we generated synthetic signal data and conducted curve fitting to extract the peak parameters. The standard deviations were then computed from the dispersion of the fitted parameter values.

In the simulation, two pseudo-Voigt profiles were generated with peak positions set as ω cw = 4000 and ω cs = 12,000. The expected intensities of the two peaks were fixed respectively as I w = 1000 and I s = 10,000. A sampling interval of Δx = 0.1 and a bandwidth of Γ = 10 were used, whereas η was varied in increments of 0.1 from 0.1 to 0.9, yielding data under nine different conditions. Under these simulation conditions, the separation ratio Δω/Γ exceeded 800 in every case. For the Lorentzian function, the intensity at a distance of 800Γ from the peak center decreases to approximately 4 × 10–7 of the peak intensity. For the Gaussian function, the intensity at a distance of 3Γ drops to about 1 × 10–11 of the peak intensity, indicating that interference between the peaks is negligible.

For each condition, 999 data sets were generated. Then peak parameter extraction was performed using Python’s nonlinear fitting library (scipy.optimize.curve_fit). To facilitate rapid convergence to the global minimum, known parameter values were used as initial estimates. A cost function minimizing the weighted sum of the squared residuals was employed. This approach is analogous to those used in widely adopted curve-fitting software such as Fityk and GRAMS/AI (Thermo Fisher Scientific Inc.). The convergence tolerances (xtol = gtol = ftol) were initially set to 1 × 10–15. If convergence was not achieved, then the tolerances were relaxed incrementally by 2 orders of magnitude. The trust region reflective algorithm was adopted as the optimization method, with the maximum number of iterations set to 10,000.

A total of 8991 signal data sets yielded extracted peak parameters, which are presented in Table S2. The mean values and standard deviations of the peak parameters across the nine conditions are presented in Table S3.

Results

Figure a–j displays the η dependence of the Fisher information matrix elements F kl as obtained from both theoretical derivations and numerical calculations. For F 11 , F 12 , F 13 , F 14 , F 23 , and F 24 , all elements with available analytical solutions, and the theoretical and numerical results are in excellent agreement, confirming the high reliability of both methods. Moreover, the values of F 11 , F 12 , F 13 , and F 23 can be expressed as a weighted sum of the Gaussian and Lorentzian components, i.e., F kl = (1 – η)F kl + ηF kl . In contrast, F 22 and F 33 cannot be expressed in this form. However, in the limits as η → 0 and η → 1, F kl converges respectively to F kl and F kl . Additionally, F 34 and F 44 increase exponentially in the vicinity of η ≈ 0, indicating that as η → 0, the information content for η is high, allowing it to be estimated with high precision.

Figure a–j presents a comparison of the variance–covariance matrix elements C kl obtained from theory and numerical calculations. It is noteworthy that for C 11 , C 13 , and C 33 , the values converge to those of the Gaussian profile, C kl , in the limit as η → 0. In contrast, for η → 1, the absolute values satisfy |C kl | > |C kl |, which indicates that the effect of mixing Gaussian and Lorentzian components on the estimation precision is asymmetric with respect to η. Furthermore, although C 22 does not correspond exactly to a weighted sum of C 22 and C 22 , it converges to C 22 and C 22 , respectively, in the limits as η → 0 and η → 1. As with the pure Gaussian and Lorentzian cases, C 22 is given simply as the reciprocal of F 22 . , With the exception of C 12 , C 23 , and C 24 , which are identically zero, no element of the covariance matrix CPV can be expressed as a weighted sum of C kl and C kl .

Figure presents a comparison of the estimation precision of the peak parameters, as found using theoretical analysis, numerical calculations, and Monte Carlo simulations. For all parameters, the numerical and simulation results agree very well. Moreover, for all parameters (with the exception of those pertaining to η), the relative standard deviation σθk*PV for the pseudo-Voigt profile converges to that of the Gaussian profile, σθk*G , in the limit as η → 0. However, in the limit as η → 1, σθk*PV matches σθk*L only for ω c , Δω, A, and R A . For these parameters, σθk*PV can be reasonably approximated using a weighted sum of σθk*G and σθk*L (i.e., σθk*G+Llinear=(1η)σθk*G+ησθk*L , as shown in Figure b,e,h,k). In contrast, for I, R I , Γ, and R Γ, in the limit as η → 1, σθk*PV is up to 2.26 times larger (for Γ and R Γ; Figure c,i) and 1.22 times larger (for I and R I ; Figure a,g) than the values predicted by the weighted sum approximation. The estimation precision for η itself exhibits marked asymmetry with respect to its value, approaching near-zero precision as η → 0 (Figure d). Moreover, for the Gaussian and Lorentzian profiles, the precision values of R A (or A) are superior to those for R I (or I), respectively, by factors of 3/2 and 3 (eqs and ). In the case of the pseudo-Voigt profile, in the limit as η → 1, the ratios σRI*PV/σRA*PV and σ* I /σ* A approach 2.11, indicating that the precision of R A (or A) is up to 2.11 times better than that of R I (or I) (Figures f,l). This finding implies that using R A (or A) instead of R I (or I) allows for precision equivalent to that obtained with a signal that is up to 4.45 times stronger.

Figure presents the relative error distributions of the parameters obtained from Monte Carlo simulations alongside the standard deviation ellipses computed numerically from eqs –, demonstrating excellent agreement between the two approaches. It is noteworthy that a negative correlation between I and Γ is observed, which is consistent with the negative value of C 13 (Figure c). In other words, as I increases, Γ tends to decrease; as I decreases, Γ tends to increase. This tendency is more pronounced for the Lorentzian profile than for the Gaussian profile. In fact, it becomes even stronger for the pseudo-Voigt profile at η > 0.42 (Figures c and b). In the pseudo-Voigt profile, as η → 1, C 13 decreases further below that of the Lorentzian profile (Figure c), thereby leading to a stronger correlation between I and Γ (Figure b). The observed positive correlation between I and η (Figure c) is consistent with the positive value of C 14 (Figure d), indicating that as I increases, η also increases. This finding suggests that in the pseudo-Voigt profile, a larger η corresponds to a stronger contribution from the Lorentzian component, which, in turn, results in a higher peak intensity. By contrast, the negative correlation between Γ and η (Figure f) corresponds to the negative value of C 34 (Figure i) and indicates that as η increases, Γ tends to decrease. Finally, no significant correlation is observed among I and ω c , ω c and Γ, or ω c and η, which is consistent with the fact that C 12, C 23, and C 24 are all zero (Figure a,d,e).

4.

4

Correlation between relative errors of peak parameters in the pseudo-Voigt profile: (a) intensity vs. peak position, (b) intensity vs. fwhm, (c) intensity vs. mixing parameter, (d) peak position vs. fwhm, (e) peak position vs. mixing parameter, and (f) fwhm vs. mixing parameter. Blue symbols represent 999 data points obtained from simulated signal data under the conditions I = 1000, ω c = 4000, Γ = 10, Δx = 0.1, and η = 0.5. Black solid, dashed, and dotted lines respectively show covariance ellipses corresponding to 1σ, 2σ, and 3σ levels, computed from the Fisher information matrix under these conditions. Green and pink dotted lines respectively show the 3σ covariance ellipses for the Gaussian and Lorentzian profiles, calculated under I = 1000, ω c = 0, Γ = 10, and Δx = 0.1. Simulation data are presented in Table S2.

Discussion

Empirical Expression for Peak Parameter Estimation Precision in the Pseudo-Voigt Profile

For Gaussian and Lorentzian profiles, the estimation precision of peak parameters can be derived analytically as functions of I, Γ, and Δx (eqs –). However, for the pseudo-Voigt profile, elements F 22, F 33, F 34, and F 44 cannot be expressed in terms of elementary functions (eqs –). Consequently, an analytical solution for the standard deviation is not available. For this subsection, we therefore derive an empirical expression for the estimation precision of peak parameters in the pseudo-Voigt profile.

Because the pseudo-Voigt profile is a weighted sum of Gaussian and Lorentzian functions (eq ), one of the most straightforward methods for expressing the estimation precision of peak parameters is to approximate it as a weighted sum of the analytical solutions for the precision of the Gaussian and Lorentzian components (i.e., σθk*G+Llinear=(1η)σθk*G+ησθk*L ). Indeed, for ω c , Δω, A, and R A , it has been confirmed that σθk*PV can be reasonably approximated by σθk*G+Llinear (Figure b,e,h,k). Because σθk*G and σθk*L are known (eqs –), an empirical formula for estimating σθk*PV under arbitrary conditions of I, Γ, Δx, and η is obtainable if the ratio between σθk*PV and σθk*G+Llinear can be modeled. To ascertain the relation between I, Γ, Δx, η, and σθk*PV , we performed numerical calculations of σθk*PV over a total of 237,600 conditions with I = 103–106, Γ = 1–10, Δx = 0.01–1.0, and η = 0.001–0.999. The results were compared with σθk*G+Llinear (Table S4 presents related details). These calculations were performed for values of Γ/Δx ranging from 1 to 1000, corresponding to cases where between 1 and 1000 data points are included within the fwhm: a range that covers many practical scenarios in chemical analysis.

Figure presents that, for all peak parameters, the ratio σθk*PV/σθk*G+Llinear depends solely on η: it is independent of Γ and Δx. To model the η dependence of this ratio, we performed curve fitting using various candidate models, including first–24th order polynomials, exponential functions, logarithmic functions, rational functions, and combinations of polynomials with other functions. Particularly, numerical calculations demonstrated that for I and Γ, the model function must satisfy f θ k (0) = 1. For ω c and A, it must satisfy both g θ k (0) = 1 and g θ k (1) = 1. Also, for η, it must satisfy h θ k (0) = 0. Consequently, we selected model functions that fulfill these boundary constraints. To avoid convergence to local minima, the fitting procedure was repeated with random initial guesses for the parameters. The model was selected by comparing the residual sum of squares, Akaike’s information criterion, Bayesian information criterion, and 5-fold cross-validation results for all candidate models. Detailed information related to the evaluated model functions, the model selection procedure, and the fitting results is provided in the Supporting Information and Table S5. As a result, for I and Γ, the function defined by eq was chosen, whereas for ω c and A, the function defined by eq was adopted, as presented below.

fθk(η)=1+i=18(piηi)+p9ln(1+p10η) 42
gθk(η)=1+η(η1)[i=18(piηi1)+p9ln(1+p10η)] 43

The fitted parameters p i are presented in Table . Using eqs and , the empirical formulas for σθk*PV as functions of I, Γ, Δx, and η are given as

σI*PV=fI(η)[(1η)σI*G+ησI*L] 44
σωcPV=gωc(η)[(1η)σωcG+ησωcL] 45
σΓ*PV=fΓ(η)[(1η)σΓ*G+ησΓ*L] 46
σA*PV=gA(η)[(1η)σA*G+ησA*L] 47

5.

5

Dependence of the normalized standard deviation of peak parameters in the pseudo-Voigt profile’s peak parameters on the mixing parameter η, together with the best-fit model. The normalized standard deviation is defined as the ratio σθk*PV/σθk*G+Llinear , where the predicted standard deviation based on the weighted sum of the Gaussian and Lorentzian contributions is σθk*G+Llinear=(1η)σθk*G+ησθk*L . (a–d) respectively present results for (a) intensity, (b) peak position, (c) full width at half-maximum (fwhm), and (d) area. Blue symbols are values of σθk*PV/σθk*G+Llinear obtained from numerical calculations performed under 237,600 conditions spanning the parameter ranges I = 103–106, Γ = 1–10, Δx = 0.01–1.0, and η = 0.001–0.999 (Table S4). The best-fit model is described by eqs and , with corresponding model parameters presented in Table .

1. Fitting Parameters for Eqs. – and .

  f I (η) gω(η) fΓ(η) g A (η) fη(η)
p 1 0.18048 –0.65277 1.60950 0.06110 4.34923
p 2 –0.78572 –0.71219 –5.36278 0.04935 –16.23451
p 3 3.84928 2.23240 23.01545 0.04500 75.01915
p 4 –10.29070 –6.01379 –60.20845 –0.26126 –204.52516
p 5 17.18979 10.75665 98.70767 0.76342 344.59331
p 6 –16.91906 –11.78860 –96.21326 –1.19016 –342.02286
p 7 8.97672 7.11471 50.90463 0.93835 184.20357
p 8 –2.00891 –1.80230 –11.32548 –0.29406 –41.63627
p 9 0.00477 0.13412 0.02385 –0.28274 0.04816
p 10 308.75319 383.23065 275.06340 0.23319 1857.31525

For these equations, the maximum relative errors, defined as 100 × max1in|σθk*PViσθk*PVi^|/σθk*PVi , are 0.26%, 0.05%, 0.89%, and 0.002%, respectively, for eqs –, which is sufficiently precise for practical purposes. By combining eqs – with standard error propagation, we can calculate the η-dependence of the standard deviations for I, ω c , Γ, and A, as well as for R I , Δω, R Γ, and R A (Figure ).

6.

6

Dependence of standard deviations of various parameters on Γ/Δx or ΓΔx in the pseudo-Voigt profile. Panels show the standard deviations of intensity, peak position, bandwidth, area, intensity ratio, peak position difference, bandwidth ratio, and area ratio as predicted using the empirical equations (eqs –). Green and pink dashed lines respectively show theoretical solutions for pure Gaussian and pure Lorentzian cases (eqs – and –). Results are presented for four values of the mixing parameter: η = 0.01, 0.33, 0.66, and 0.99.

Because η is a parameter that is not present in the Gaussian or Lorentzian profiles, its standard deviation cannot be expressed as a weighted sum of σθk*G and σθk*L as in eqs –. However, based on the same 237,600 data sets, we determined empirically that the standard deviation of η, ση, is proportional to (ΔxI)0.5, similar to I, Γ, and A. To account for the effect of η on ση, we tested several models, which revealed that the function h η(η) defined by the following equation performed best.

hη(η)=i=18(piηi)+p9ln(1+p10η) 48

Consequently, we modeled ση as

σηPV=hη(η){ΔxIΓ}1/2 49

The parameters for h η(η) obtained from the fitting are presented in Table . As shown in Figure , the numerical results for ση agree extremely well with those in eq . The maximum relative error was 8.6% at η = 0.001 and 0.7% for η ≥ 0.01, demonstrating that the model explains the numerical results with practically sufficient precision.

7.

7

Comparison of the standard deviations of the mixing parameter (η) for the pseudo-Voigt profile obtained from the empirical formula (eq ) and numerical calculations. Results were obtained under five conditions with η = 0.01, 0.25, 0.5, 0.75, and 0.99. Cross symbols denote σ η values obtained from numerical calculations under the conditions I = 1000, Γ = 1–10, Δx = 0.01–1.0, and η = 0.001–0.999 (Table S4).

The deviation between σωcPV and σωcG+Llinear reaches a maximum of 2.7% at η ≈ 0.33, whereas that between σ* A and σ* A reaches a maximum of 1.4% at η ≈ 0.48 (Figure b,d). Because uncertainties are generally reported to one or two significant digits, these minor deviations are practically negligible. Consequently, for ω c , Δω, A, and R A , it is acceptable to approximate σθk*PV by σθk*G+Llinear . In contrast, for I (or R I ), in the limit η → 1, σ* I is up to 22% larger than σ* I (Figure a). Moreover, the uncertainties predicted by the weighted-sum model are up to ten times worse than those for ω c or A. Even so, because uncertainties are typically reported to one or two significant digits, an increase by a factor of approximately 1.22 is generally negligible. Therefore, the estimation precision for I and R I can also be approximated as σθk*PV ∼ σ* I without any important practical issue. By contrast, the deviation between σ*Γ and σ*Γ reaches a maximum of 126% in the limit as η → 1 (Figures c and c), implying that the signal intensity required to achieve a given target precision could be underestimated by as much as a factor of 2.262 (∼5.11). Consequently, we recommend using eq instead of the simple weighted-sum model for estimating σ*Γ .

Guidelines for Instrument and Measurement Condition Optimization in High-Precision Analysis

This paper presents a novel approach that extends conventional strategies for optimizing instrumentation and measurement conditions for the high-precision estimation of peak parameters I, ω c , Γ, and A. Traditionally, under the Poisson noise limit for Gaussian and Lorentzian profiles, it has been considered that a wide bandwidth, fine sampling interval, and high signal intensity, i.e., minimizing ΔxI, are key factors for improving the precision of I, Γ, and A estimation. , From the present study, we have demonstrated that this principle also applies to the pseudo-Voigt profile when the shape parameter η remains constant, as shown by eqs , , and and Figure . Furthermore, when the condition Δx w w R I Δx s s is satisfied, the precision of the estimated intensity ratio, fwhm ratio, and area ratio is governed primarily by two factors: the number of sampling intervals spanning the fwhm of the weaker peak (quantified by Γ w x w ) and the intensity of the weaker peak (I w ). Consequently, achieving high precision requires minimizing the Δx w w I w . However, if the bandwidth of the stronger peak is exceptionally narrow, the sampling interval for the stronger peak is coarse, or the intensity ratio approaches unity, then the characteristics of the stronger peak might also strongly influence the precision of R I , R Γ, and R A estimations.

Similarly to the optimization of I, Γ, and A, for Gaussian and Lorentzian profiles, the precision of ω c is enhanced by refining the sampling interval and increasing the signal intensity. However, in contrast, a narrower bandwidth is preferable for ω c estimation. , For our study, we demonstrated further that, for the pseudo-Voigt profile, minimizing ΓΔx/I is effective for reducing σωcPV (eq ; Figure ). Moreover, regarding the precision of the peak position difference Δω, if the condition Γ w Δx w R I Γ s Δx s is met, then minimizing Γ w Δx w /I w is effective for enhancing precision. However, if the bandwidth of the stronger peak is exceptionally wide, its sampling interval is coarse, or the intensity ratio is nearly 1, then the characteristics of the stronger peak might strongly affect the precision of the Δω estimation.

A central finding of this study is that even when I, Γ, and Δx are held constant, the precision of parameter estimation varies significantly with η (Figure ). Particularly as η approaches 1, as the profile becomes increasingly Lorentzian, the precision of both the Γ and I estimation deteriorates considerably (Figure a,c). Traditional approaches have primarily emphasized improvement of the signal-to-noise ratio and refining the sampling interval to enhance precision. Our results suggest that appropriate control of η provides a novel strategy for precision improvement.

Parameters Γ and η in the signal data are influenced by various broadening effects. For instance, when Doppler or instrumental broadening predominates, the profile tends to be Gaussian. , In contrast, when natural, pressure, or power broadening is dominant, the profile becomes more Lorentzian. , These effects can be modulated by adjusting the sample’s temperature and pressure conditions , as well as the analytical settings (e.g., slit width, grating constant, focal length of spectrometer, and detector pixel size). , Consequently, deliberately inducing broadening that yields a more Gaussian-like profile is particularly effective at enhancing the precision of I and Γ estimations (Figure a,c).

Specifically, changing η from 1 to 0 improves the precision of Γ estimation by up to 3.7-fold, an effect that is equivalent to increasing the signal intensity by approximately 14-fold. Similarly, the precision of both intensity and intensity ratio estimations improves by a factor of 1.4 when η is altered from 1 to 0, which is comparable to doubling the signal intensity. Moreover, because the precision of I and Γ estimation is proportional to (ΔxI)0.5 (eqs , , and ), an increase in Γ because of broadening also enhances precision. For example, if Γ doubles, then the precision improves further by a factor of 2 , which is equivalent to the improvement achieved by doubling the signal intensity.

In many analytical applications, such as comparison of the concentration or isotope ratios between two substances, the primary goal is to achieve a high-precision estimation of peak parameters rather than determine their absolute values directly. In these cases, any broadening-induced modifications to peak shape are of little consequence because calibration using standard samples ensures that the absolute parameter values remain reliable for comparative purposes.

Nonetheless, these high-precision measurement strategies have inherent limitations. For instance, in practical analyses, adjusting η is not always feasible due to methodological constraints and analyte-specific behaviors. In addition, factors such as fluctuations in I caused by changes in analytical conditions and the impact of increased Γ on peak interference must be addressed comprehensively to maintain precision. Despite these limitations, this study’s insights reveal that controlling η beyond conventional methods such as enhancing the signal-to-noise ratio and refining the sampling interval offers a deeper understanding of the impact of analytical conditions on precision. Ultimately, this approach provides effective guidelines for optimizing analytical systems.

Finally, based on the theoretical framework developed by previous studies, , we briefly demonstrate how our precision models can inform the design and optimization of common grating-based spectrometers, such as those used in Raman, fluorescence, and absorption spectroscopy, in which dispersed light is detected by an area detector. In a system characterized by focal length f, grating constant k, and half the angle between the incident and diffracted beams (α/2), the reciprocal dispersion (RD) is given by

RD=cos(α/2+Φ)×kf 50

where the grating angle Φ for first-order diffraction is

Φ=sin1[λ2kcosα/2] 51

Here, λ denotes the wavelength. The sampling interval Δx is then expressed as

Δx=wdet×RD 52

where w det denotes the pixel width of the detector. The effective fwhm, Γ, of a peak can be approximated as the convolution of the true line width ΓNat, the instrumental spectral resolution ΓSpec, and additional broadening effects ΓOther, including excitation laser line width, Doppler broadening, and natural-, pressure-, or power-induced broadening

Γ=ΓNat2+ΓSpec2+ΓOther2 53

The instrumental contribution ΓSpec is expressed as

ΓSpec=kbimgfcos{sin1[λ2kcos(α/2)]+α2} 54

where b img is the width of the slit image on the detector, determined by the entrance slit width b ent and the optical configuration. By substituting these expressions for Δx and Γ into our precision models (eqs – and ), we provide a method for quantitatively predicting how instrumental changes, such as pixel size, slit width, grating groove density, and focal length, affect the precision of I, ω c , Γ, and A. While the above example assumes a grating-based spectrometer with area detection, the procedure is equally applicable to other analytical systems: one needs only to express Δx and Γ as functions of the instrument’s performance parameters and substitute them into our models to derive a direct relationship between measurement precision and hardware specifications. For a concrete illustration of how variations in focal length, pixel size, grating groove density, and slit width influence the precision of area ratios in Gaussian and Lorentzian profiles, see Figure of Hagiwara and Kuwatani. These relationships are particularly valuable for guiding instrument design and upgrades to meet specific precision requirements as well as for optimizing research budgets by identifying cost-effective performance enhancements.

Which is More Precise for the Pseudo-Voigt Profile: The Intensity Ratio or Area Ratio?

The question of whether the intensity ratio (R I ) or the area ratio (R A ) yields higher estimation precision has been a longstanding debate in analytical chemistry because this choice directly influences researchers’ decision-making regarding the precise estimation of target variables during data analysis. ,− Because of various factors, including noise and instrumental differences, distortions in signal data, and large uncertainties associated with variance estimation, earlier experimental studies undertaken to address this issue faced challenges in drawing definitive conclusions. To minimize the effects of experimental uncertainties and to provide a more definitive answer, a combination of theoretical analysis, numerical calculations, and Monte Carlo simulations is highly effective.

Using a theoretical approach, we demonstrated that, for Gaussian and Lorentzian profiles, the relative standard deviations of the intensity ratio and area ratio are given respectively as σRI*G/σRA*G=3/2 and σRI*L/σRA*L=3 (eqs and ), confirming that the estimation precision of the area ratio is superior. In practical terms, using the area ratio instead of the intensity ratio is equivalent to achieving the same precision under signal conditions that are 1.5 and 3 times stronger. For this study, we extended this analysis to the pseudo-Voigt profile and showed that in the limit as η → 1, the ratio σRI*PV/σRA*PV to 2.11 suggests that the precision advantage of the area ratio is even greater, corresponding to a precision equivalent to that achieved under signal conditions up to 4.45 times stronger (Figure l). In this subsection, we discuss (1) why the estimation precision of R A is superior to that of R I and (2) why, as η approaches 1, the ratio σRI*G/σRA*G exceeds the values 3/2 and 3 observed respectively for Gaussian and Lorentzian profiles.

Earlier studies , have demonstrated that, for Gaussian and Lorentzian profiles, the superior precision of the area ratio over the intensity ratio is attributable to the negative covariance between I and Γ. Specifically, when I increases, Γ tends to decrease and vice versa. Therefore, the product IΓ, which is proportional to the area, remains approximately constant (Figure b). However, this negative covariance also means that the uncertainty in one parameter amplifies the uncertainty in the other, making it difficult to estimate I or Γ independently with high precision. This interplay among the peak parameters ultimately results in R A being estimated more precisely than R I .

For the pseudo-Voigt profile, the influence of η must also be considered. In the limit of η → 0, the correlations between I and η and between Γ and η vanish (Figure d,i), meaning that η does not affect the estimation of other parameters. Consequently, the estimation precision of the pseudo-Voigt profile converges to that of the Gaussian profile in this limit. The ratio σRI*PV/σRA*PV asymptotically approaches 3/2 . Conversely, as η approaches 1, the correlation between I and η increases monotonically (Figure d), whereas the correlation between Γ and η decreases monotonically (Figure i). Therefore, near η = 1, η begins to influence the estimation of both I and Γ considerably. Particularly in the limit as η → 1, the correlation coefficient between Γ and η (i.e., C13/C11C33 ) reaches −0.90, indicating a very strong negative correlation that degrades the precision of independently estimating Γ (Figures c,f and c). Moreover, the correlation coefficient between I and η (i.e., C14/C11C44 ) reaches 0.57 in this limit, signifying a moderate correlation that also adversely affects the precision of I estimation (Figures a,c and a). As a consequence, the precision of the intensity ratio worsens, causing the ratio σRI*PV/σRA*PV to increase. In contrast, the estimation precision of the area and area ratio remains unaffected because the negative covariances between I and Γ and between Γ and η tend to preserve the product IΓη (i.e., the area remains nearly constant). In fact, when comparing the contributions of individual terms in eq to the precision of the area, the covariance terms APVIAPVΓC13PV and APVΓAPVηC34PV contribute greatly to the improvement in precision (Figure S5). Therefore, to maximize the estimation precision of the target variable, it is imperative not only to control the mixing parameter η but also to judiciously select the peak parameters.

Conclusions

For this study, we employed a multifaceted approach combining theoretical analysis, numerical calculations, and Monte Carlo simulations to elucidate the physical principles governing the estimation precision of pseudo-Voigt profile parameters: intensity (I), peak position (ω c ), full width at half-maximum (Γ), mixing parameter (η), and area (A). We developed a model that expresses estimation precision in terms of I, Γ, η, and the sampling interval (Δx), providing a comprehensive framework that bridges theoretical precision limits with practical experiment parameters.

Our analysis revealed that under constant η, the precision of I, Γ, and A improves as the ratio ΔxI is minimized, whereas the precision of ω c is enhanced by reducing ΓΔx/I. Furthermore, our investigation into the η-dependence of peak parameter estimations demonstrated that decreasing η from 1 to 0 improves the estimation precision of Γ by up to 3.7-fold: an effect equivalent to increasing the signal intensity by approximately 14-fold. Similarly, the precision of the I estimation increases by a factor of 1.4, which is comparable to the effect of doubling the signal intensity.

These findings underscore that beyond conventional strategies such as enhancing the signal-to-noise ratio and optimizing the sampling interval, controlling the mixing parameter η offers a useful approach to precision optimization. For instance, inducing controlled Doppler or instrument-induced broadening to shift the profile toward a more Gaussian shape (i.e., reducing η) can simultaneously improve the precision of both I and Γ. Furthermore, because the estimation precision of I and Γ is proportional to (ΔxI)0.5, any increase in Γ caused by such broadening further enhances the precision. This strategy provides practical guidelines for designing and optimizing analytical instruments and experiment conditions.

In summary, findings from our study not only deepen the understanding of the interplay between analytical parameters and estimation precision but also pave the way for novel optimization strategies in high-precision quantitative analysis. The precision model derived herein is anticipated to serve as a foundational tool for further research related to measurement precision, providing an alternative method for error estimation in cases where direct experimental error quantification is challenging and offering a means for quantitative assessment of improvements in precision resulting from instrument upgrades.

Supplementary Material

tg5c00030_si_001.xlsx (22.4MB, xlsx)
tg5c00030_si_002.pdf (1.1MB, pdf)

Acknowledgments

This work was supported by JSPS KAKENHI Grant-in-Aid for JSPS Fellows (JP19J21537) and Grant-in-Aid for Early-Career Scientists (JP22J00081), and by the Earthquake Research Institute Joint Usage/Research Program (ERI JURP) 2024-B-01 at the University of Tokyo.

The Supporting Information is available free of charge at https://pubs.acs.org/doi/10.1021/acsmeasuresciau.5c00030.

  • Detailed numerical data obtained from computational analysis and Monte Carlo simulations (XLSX)

  • Details of the Fisher information matrix derivation, confidence interval estimation, model fitting constraints, and evaluation metrics are provided, along with supplementary figures illustrating how the Fisher information matrix elements and variance-covariance matrix elements depend on profile type, sampling interval, and bandwidth. (PDF)

The authors declare no competing financial interest.

References

  1. Samson J. A. R.. Line Broadening in Photoelectron Spectroscopy. Rev. Sci. Instrum. 1969;40(9):1174–1177. doi: 10.1063/1.1684192. [DOI] [Google Scholar]
  2. Arora A. K., Umadevi V.. Instrumental Distortions of Raman Lines. Appl. Spectrosc. 1982;36(4):424–427. doi: 10.1366/0003702824639682. [DOI] [Google Scholar]
  3. Bhakar A., Taxak M., Rai S. K.. Significance of Diffraction Peak Shapes in Determining Crystallite Size Distribution: A Peak Shape Analysis Procedure for Pseudo-Voigt Profiles and Its Application. J. Appl. Crystallogr. 2023;56(5):1466–1479. doi: 10.1107/S1600576723007367. [DOI] [Google Scholar]
  4. Scardi P.. Diffraction Line Profiles in the Rietveld Method. Cryst. Growth Des. 2020;20(10):6903–6916. doi: 10.1021/acs.cgd.0c00956. [DOI] [Google Scholar]
  5. Petrakis L.. Spectral Line Shapes: Gaussian and Lorentzian Functions in Magnetic Resonance. J. Chem. Educ. 1967;44(8):432. doi: 10.1021/ed044p432. [DOI] [Google Scholar]
  6. Vitanov N. V., Shore B. W., Yatsenko L., Böhmer K., Halfmann T., Rickes T., Bergmann K.. Power Broadening Revisited: Theory and Experiment. Opt. Commun. 2001;199(1–4):117–126. doi: 10.1016/S0030-4018(01)01495-X. [DOI] [Google Scholar]
  7. Langford J. I.. A Rapid Method for Analysing the Breadths of Diffraction and Spectral Lines Using the Voigt Function. J. Appl. Crystallogr. 1978;11(1):10–14. doi: 10.1107/S0021889878012601. [DOI] [Google Scholar]
  8. van de Hulst H. C., Reesinck J. J. M.. Line Breadths and Voigt Profiles. Astrophys. J. 1947;106:121. doi: 10.1086/144944. [DOI] [Google Scholar]
  9. Posener D. W.. The Shape of Spectral Lines: Tables of the Voigt Profile. Aust. J. Phys. 1959;12(2):184. doi: 10.1071/PH590184. [DOI] [Google Scholar]
  10. Kielkopf J. F.. New Approximation to the Voigt Function with Applications to Spectral-Line Profile Analysis. J. Opt. Soc. Am. 1973;63(8):987. doi: 10.1364/JOSA.63.000987. [DOI] [Google Scholar]
  11. Wertheim G. K., Butler M. A., West K. W., Buchanan D. N. E.. Determination of the Gaussian and Lorentzian Content of Experimental Line Shapes. Rev. Sci. Instrum. 1974;45(11):1369–1371. doi: 10.1063/1.1686503. [DOI] [Google Scholar]
  12. Whiting E. E.. An Empirical Approximation to the Voigt Profile. J. Quant. Spectrosc. Radiat. Transfer. 1968;8(6):1379–1384. doi: 10.1016/0022-4073(68)90081-2. [DOI] [Google Scholar]
  13. Pain J.-C.. Extracting Physical Information from the Voigt Profile Using the Lambert W Function. Plasma. 2024;7(2):427–445. doi: 10.3390/plasma7020023. [DOI] [Google Scholar]
  14. Wang Y., Zhou B., Zhao R., Wang B., Liu Q., Dai M.. Super-Accuracy Calculation for the Half Width of a Voigt Profile. Mathematics. 2022;10(2):210. doi: 10.3390/math10020210. [DOI] [Google Scholar]
  15. AlOmar A. S.. Line Width at Half Maximum of the Voigt Profile in Terms of Gaussian and Lorentzian Widths: Normalization, Asymptotic Expansion, and Chebyshev Approximation. Optik. 2020;203(163919):163919. doi: 10.1016/j.ijleo.2019.163919. [DOI] [Google Scholar]
  16. Schreier F.. Notes: An Assessment of Some Closed-Form Expressions for the Voigt Function III: Combinations of the Lorentz and Gauss Functions. J. Quant. Spectrosc. Radiat. Transfer. 2019;226:87–91. doi: 10.1016/j.jqsrt.2019.01.017. [DOI] [Google Scholar]
  17. Liu Y., Lin J., Huang G., Guo Y., Duan C.. Simple Empirical Analytical Approximation to the Voigt Profile. J. Opt. Soc. Am. B. 2001;18(5):666. doi: 10.1364/JOSAB.18.000666. [DOI] [Google Scholar]
  18. Di Rocco H. O., Cruzado A.. The Voigt Profile as a Sum of a Gaussian and a Lorentzian Functions, When the Weight Coefficient Depends Only on the Widths Ratio. Acta Phys. Polym. A. 2012;122(4):666–669. doi: 10.12693/APhysPolA.122.666. [DOI] [Google Scholar]
  19. Ida T., Ando M., Toraya H.. Extended Pseudo-Voigt Function for Approximating the Voigt Profile. J. Appl. Crystallogr. 2000;33(6):1311–1316. doi: 10.1107/S0021889800010219. [DOI] [Google Scholar]
  20. Olivero J. J., Longbothum R. L.. Empirical Fits to the Voigt Line Width: A Brief Review. J. Quant. Spectrosc. Radiat. Transfer. 1977;17(2):233–236. doi: 10.1016/0022-4073(77)90161-3. [DOI] [Google Scholar]
  21. Thompson P., Cox D. E., Hastings J. B.. Rietveld Refinement of Debye–Scherrer Synchrotron X-Ray Data from Al2O3 . J. Appl. Crystallogr. 1987;20(2):79–83. doi: 10.1107/S0021889887087090. [DOI] [Google Scholar]
  22. Young R. A., Wiles D. B.. Profile Shape Functions in Rietveld Refinements. J. Appl. Crystallogr. 1982;15(4):430–438. doi: 10.1107/S002188988201231X. [DOI] [Google Scholar]
  23. Hesse R., Streubel P., Szargan R.. Product or Sum: Comparative Tests of Voigt, and Product or Sum of Gaussian and Lorentzian Functions in the Fitting of Synthetic Voigt-based X-ray Photoelectron Spectra. Surf. Interface Anal. 2007;39(5):381–391. doi: 10.1002/sia.2527. [DOI] [Google Scholar]
  24. Minin S., Kamalabadi F.. Uncertainties in Extracted Parameters of a Gaussian Emission Line Profile with Continuum Background. Appl. Opt. 2009;48(36):6913–6922. doi: 10.1364/AO.48.006913. [DOI] [PubMed] [Google Scholar]
  25. Hagen N., Kupinski M., Dereniak E. L.. Gaussian Profile Estimation in One Dimension. Appl. Opt. 2007;46(22):5374–5383. doi: 10.1364/AO.46.005374. [DOI] [PMC free article] [PubMed] [Google Scholar]
  26. Hagen N., Dereniak E. L.. Gaussian Profile Estimation in Two Dimensions. Appl. Opt. 2008;47(36):6842–6851. doi: 10.1364/AO.47.006842. [DOI] [PubMed] [Google Scholar]
  27. Ireland J.. Precision Limits to Emission-Line Profile Measuring Experiments. Astrophys. J. 2005;620(2):1132–1139. doi: 10.1086/427230. [DOI] [Google Scholar]
  28. Lenz, D. D. ; Ayres, T. R. . Errors Associated with Fitting Gaussian Profiles to Noisy Emission-Line Spectra; Publications of the Astronomical Society of the Pacific, 1992; Vol. 104, pp 1104–1106. 10.1086/133096. [DOI] [Google Scholar]
  29. Lading L., Jensen A. S.. Estimating the Spectral Width of a Narrowband Optical Signal. Appl. Opt. 1980;19(16):2750–2756. doi: 10.1364/AO.19.002750. [DOI] [PubMed] [Google Scholar]
  30. Winick K. A.. Cramér–Rao Lower Bounds on the Performance of Charge-Coupled-Device Optical Position Estimators. J. Opt. Soc. Am. A Opt. Image Sci. Vis. 1986;3(11):1809. doi: 10.1364/JOSAA.3.001809. [DOI] [Google Scholar]
  31. Hagiwara Y., Kuwatani T.. Precision Comparison of Intensity Ratios and Area Ratios in Spectral Analysis. Sci. Rep. 2024;14(1):22898–22911. doi: 10.1038/s41598-024-71653-3. [DOI] [PMC free article] [PubMed] [Google Scholar]
  32. Ebel S., Karger A.. Precision of Parameters Determined by Spectrophotometric Measurements. Chemometr. Intell. Lab. Syst. 1989;6(4):301–311. doi: 10.1016/0169-7439(89)80099-1. [DOI] [Google Scholar]
  33. Öztürk H., Noyan I. C.. Expected Values and Variances of Bragg Peak Intensities Measured in a Nanocrystalline Powder Diffraction Experiment. J. Appl. Crystallogr. 2017;50(5):1307–1322. doi: 10.1107/S1600576717010494. [DOI] [Google Scholar]
  34. Sćepanović O. R., Bechtel K. L., Haka A. S., Shih W.-C., Koo T.-W., Berger A. J., Feld M. S.. Determination of Uncertainty in Parameters Extracted from Single Spectroscopic Measurements. J. Biomed. Opt. 2007;12(6):064012. doi: 10.1117/1.2815692. [DOI] [PubMed] [Google Scholar]
  35. Posener D. W.. Precision in Measuring Resonance Spectra. J. Magn. Reson. 1974;14(2):121–128. doi: 10.1016/0022-2364(74)90266-2. [DOI] [Google Scholar]
  36. Chen L., Cottrell C. E., Marshall A. G.. Effect of Signal-to-Noise Ratio and Number of Data Points upon Precision in Measurement of Peak Amplitude, Position and Width in Fourier Transform Spectrometry. Chemometrics Intellig. Lab. Syst. 1986;1(1):51–58. doi: 10.1016/0169-7439(86)80025-9. [DOI] [Google Scholar]
  37. Török P., Foreman M. R.. Precision and Informational Limits in Inelastic Optical Spectroscopy. Sci. Rep. 2019;9(1):6140. doi: 10.1038/s41598-019-42619-7. [DOI] [PMC free article] [PubMed] [Google Scholar]
  38. Hagiwara Y., Kuwatani T.. Precision in Peak Parameter Estimation for Gaussian and Lorentzian Profiles: Guidelines for Instrument Optimization. Phys. Rev. Res. 2025;7:023163. doi: 10.1103/physrevresearch.7.023163. [DOI] [Google Scholar]
  39. Kipiniak W. A.. Basic Problemthe Measurement of Height and Area. J. Chromatogr. Sci. 1981;19:332–337. doi: 10.1093/chromsci/19.7.332. [DOI] [Google Scholar]
  40. Robards, K. ; Ryan, D. . Principles and Practice of Modern Chromatographic Methods; Academic Press, 2022. [Google Scholar]
  41. Pauls R. E., McCoy R. W., Ziegel E. R., Fritz G. T., Marmion D. M., Krieger D. L.. Results of a Cooperative Study on the Precision of Liquid Chromatographic Measurements at Low Signal-to-Noise Ratios. J. Chromatogr. Sci. 1988;26(10):489–493. doi: 10.1093/chromsci/26.10.489. [DOI] [Google Scholar]
  42. Pauls R. E., McCoy R. W., Ziegel E. R., Wolf T., Fritz G. T., Marmion D. M.. Results of a Cooperative Study Comparing the Precision of Peak Height and Area Measurements in Liquid Chromatography. Part II. J. Chromatogr. Sci. 1986;24(7):273–277. doi: 10.1093/chromsci/24.7.273. [DOI] [Google Scholar]
  43. McCoy R. W., Aiken R. L., Pauls R. E., Ziegel E. R., Wolf T., Fritz G. T., Marmion D. M.. Results of a Cooperative Study Comparing the Precision of Peak Height and Area Measurements in Liquid Chromatography. J. Chromatogr. Sci. 1984;22(10):425–431. doi: 10.1093/chromsci/22.10.425. [DOI] [Google Scholar]
  44. Asnin L. D.. Peak Measurement and Calibration in Chromatographic Analysis. Trends Analyt. Chem. 2016;81:51–62. doi: 10.1016/j.trac.2016.01.006. [DOI] [Google Scholar]
  45. Snyder, L. R. ; Kirkland, J. J. ; Dolan, J. W. . Introduction to Modern Liquid Chromatography; John Wiley & Sons, 2009. [Google Scholar]
  46. Ball D. L., Harris W. E., Habgood H. W.. Errors in Manual Integration Techniques for Chromatographic Peaks. J. Chromatogr. Sci. 1967;5(12):613–620. doi: 10.1093/chromsci/5.12.613. [DOI] [Google Scholar]
  47. Kadjo A. F., Dasgupta P. K., Su J., Liu S., Kraiczek K. G.. Width Based Quantitation of Chromatographic Peaks: Principles and Principal Characteristics. Anal. Chem. 2017;89(7):3884–3892. doi: 10.1021/acs.analchem.6b04857. [DOI] [PubMed] [Google Scholar]
  48. De Paepe A. T. G., Dyke J. M., Hendra P. J., Langkilde F. W.. The Use of Reference Materials in Quantitative Analyses Based on FT-Raman Spectroscopy. Spectrochim. Acta, Part A. 1997;53(13):2267–2273. doi: 10.1016/S1386-1425(97)00166-2. [DOI] [PubMed] [Google Scholar]
  49. Hagiwara Y., Yokokura L., Yamamoto J.. Unlocking Ultimate Precision of Intensity and Area Ratio Measurements in Raman Spectroscopy: Insights from Simulation, Experimentation, and Theory and Implications for Isotope Ratio Analysis. J. Raman Spectrosc. 2023;54:1440–1464. doi: 10.1002/jrs.6594. [DOI] [Google Scholar]
  50. Hagiwara Y., Takahata K., Torimoto J., Yamamoto J.. CO2 Raman Thermometer Improvement: Comparing Hot Band and Stokes and Anti-Stokes Raman Scattering Thermometers. J. Raman Spectrosc. 2018;49(11):1776–1781. doi: 10.1002/jrs.5461. [DOI] [Google Scholar]
  51. Brookes A., Dyke J. M., Hendra P. J., Strawn A.. The Investigation of Polymerisation Reactions in Situ Using FT-Raman Spectroscopy. Spectrochim. Acta, Part A. 1997;53(13):2303–2311. doi: 10.1016/S1386-1425(97)00170-4. [DOI] [Google Scholar]
  52. Yokokura L., Hagiwara Y., Yamamoto J.. Pressure Dependence of Micro-Raman Mass Spectrometry for Carbon Isotopic Composition of Carbon Dioxide Fluid. J. Raman Spectrosc. 2020;51(6):997–1002. doi: 10.1002/jrs.5864. [DOI] [Google Scholar]
  53. Park J. H., Hussam A., Couasnon P., Carr P. W.. The Precision of Area and Height Measurements with Flame Ionization Detectors in Temperature-Programmed Capillary Gas Chromatography. Microchem. J. 1987;35(2):232–239. doi: 10.1016/0026-265X(87)90080-4. [DOI] [Google Scholar]
  54. Hayashi Y., Matsuda R.. Deductive Prediction of Measurement Precision from Signal and Noise in Liquid Chromatography. Anal. Chem. 1994;66(18):2874–2881. doi: 10.1021/ac00090a013. [DOI] [Google Scholar]
  55. Liu C., Berg R. W.. Determining the Spectral Resolution of a Charge-Coupled Device (CCD) Raman Instrument. Appl. Spectrosc. 2012;66(9):1034–1043. doi: 10.1366/11-06508. [DOI] [Google Scholar]
  56. Neumann, W. Fundamentals of Dispersive Optical Spectroscopy Systems; SPIE Press, 2014; p 279. [Google Scholar]
  57. Fisher R. A.. On the Mathematical Foundations of Theoretical Statistics. Philos. Trans. R. Soc. London. 1922;222(594–604):309–368. doi: 10.1098/rsta.1922.0009. [DOI] [Google Scholar]
  58. Cramér, H. Mathematical Methods of Statistics; Princeton Mathematical Series; Princeton University Press46, 1946. [Google Scholar]
  59. Rao, C. R. Information and the Accuracy Attainable in the Estimation of Statistical Parameters; Springer, 1922, 235–247. [Google Scholar]
  60. Kay, S. M. Fundamentals of Statistical Signal Processing: Estimation Theory; Prentice-Hall, Inc.: USA, 1993. [Google Scholar]
  61. Bevington, P. ; Robinson, D. . Data Reduction and Error Analysis for the Physical Sciences; McGraw-Hill Education, 2003. [Google Scholar]
  62. Nocedal, J. ; Wright, S. . Numerical Optimization; Springer Science & Business Media, 2006. [Google Scholar]
  63. Martens J.. New Insights and Perspectives on the Natural Gradient Method. arXiv. 2020:arXiv:1412.1193. [Google Scholar]
  64. Press, W. H. ; Teukolsky, A. A. ; Vetterling, W. T. ; Flannery, B. P. . Numerical Recipes 3rd ed.: The Art of Scientific Computing; Cambridge University Press: Cambridge, England, 2007. [Google Scholar]
  65. Kendall, M. G. The Advanced Theory of Statistics; Charles Griffin and Co Ltd.: London, 1946. [Google Scholar]
  66. Virtanen P., Gommers R., Oliphant T. E., Haberland M., Reddy T., Cournapeau D., Burovski E., Peterson P., Weckesser W., Bright J., van der Walt S. J., Brett M., Wilson J., Millman K. J., Mayorov N., Nelson A. R. J., Jones E., Kern R., Larson E., Carey C. J., Polat İ., Feng Y., Moore E. W., VanderPlas J., Laxalde D., Perktold J., Cimrman R., Henriksen I., Quintero E. A., Harris C. R., Archibald A. M., Ribeiro A. H., Pedregosa F., van Mulbregt P.. et al. SciPy 1.0: fundamental algorithms for scientific computing in Python. Nat. Methods. 2020;17(3):261–272. doi: 10.1038/s41592-019-0686-2. [DOI] [PMC free article] [PubMed] [Google Scholar]
  67. Wojdyr M.. Fityk: A General-Purpose Peak Fitting Program. J. Appl. Crystallogr. 2010;43(5):1126–1128. doi: 10.1107/S0021889810030499. [DOI] [Google Scholar]
  68. Taylor, J. Introduction to Error Analysis, the Study of Uncertainties in Physical Measurements, 2 ed.; ui.adsabs.harvard.edu, 1997. [Google Scholar]
  69. Tashkun S. A., Perevalov V. I.. CDSD-4000: High-Resolution, High-Temperature Carbon Dioxide Spectroscopic Databank. J. Quant. Spectrosc. Radiat. Transfer. 2011;112(9):1403–1410. doi: 10.1016/j.jqsrt.2011.03.005. [DOI] [Google Scholar]
  70. Li J., Yu B., Zhao W., Chen W.. A Review of Signal Enhancement and Noise Reduction Techniques for Tunable Diode Laser Absorption Spectroscopy. Appl. Spectrosc. Rev. 2014;49(8):666–691. doi: 10.1080/05704928.2014.903376. [DOI] [Google Scholar]

Associated Data

This section collects any data citations, data availability statements, or supplementary materials included in this article.

Supplementary Materials

tg5c00030_si_001.xlsx (22.4MB, xlsx)
tg5c00030_si_002.pdf (1.1MB, pdf)

Articles from ACS Measurement Science Au are provided here courtesy of American Chemical Society

RESOURCES