5.
Current dependence of ΔM/M s for different YIG thicknesses. The amplitudes for t = 15, 30, 50, and 100 nm are scaled according to variations in the interface quality relative to 10-nm YIG, which is evaluated from R xy,SMR (Section S4). Solid lines present the fits to eq . (b) Estimates of j s1 /j s2 (eq ), taking 100-nm YIG as in ref .
