Representative optical melting data at 260 nm and van't Hoff analysis, shown for duplexes D-I and D-V. Samples are in 10 mM NaHEPES, pH 7.5, and 1.0 M added NaCl. Melting data (circles) in (A) and (B) have been normalized for direct comparison and shown with two-state fits (solid line). (A) Data for thermal melting of 2.5 μM duplex D-I and for component strands D-I S1 and D-I S2, each at 2.5 μM. (B) Data for thermal melting of 2.5 μM duplex D-V and for component strands D-V S1 and D-V S2, each at 2.5 μM. (C) Plot of TM−1 versus ln(CT/4) for duplex D-I, reflecting thermal melts conducted at 0.5–15 μM CT, where solid circles represent individual melting experiments. The solid line represents a linear least-squares fit of the data to a van't Hoff model, as described in Materials and Methods, van't Hoff estimates of ΔH and ΔS for duplex melting are extracted from the fitted slope and intercept and reported in Table 1. (D) Plot of TM−1 versus ln(CT/4) for duplex D-V. All conventions are the same as in (C).