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. 1970 Nov;104(2):871–881. doi: 10.1128/jb.104.2.871-881.1970

Genetic and Molecular Characteristics of X-Ray-Sensitive Mutants of Escherichia coli Defective in Repair Synthesis

Takesi Kato 1, Sohei Kondo 1
PMCID: PMC285071  PMID: 4923076

Abstract

Alleles responsible for X-ray-sensitive characteristics of three mutants of Escherichia coli B, which were also sensitive to ultraviolet (UV) irradiation, were mapped near metE locus, and named res-1, res-2, and res-3. All the res− mutants showed no host cell reactivability (Hcr−) for transducing deoxyribonucleic acid (DNA) of P1 phage irradiated by UV but they were Hcr+ for infective DNA of P1 phage. Furthermore, they showed no detectable activity of DNA polymerase. Characteristics of allele res-1 were studied in detail. The mutant res-1 uvr+ showed an extensive degradation of DNA after UV irradiation. Double mutants carrying res-1 uvrA−, res-1 uvrB−, and res-1 uvrC− showed no marked increase in UV sensitivity beyond that of the uvr− single mutants and only negligible UV-induced DNA degradation. The uvr− mutations showed no such suppressive effect on DNA degradation induced by X rays in these double mutants. It is concluded that res− mutants are defective in the second step (repair synthesis) of the excision repair process and that DNA polymerase is partly responsible for the assumed resynthesis step.

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Selected References

These references are in PubMed. This may not be the complete list of references from this article.

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