Abstract
The title compound, C21H26Cl2O2, a bis-chloromethyl derivative of O-ethylated bisphenol A, exhibits C 2 molecular symmetry. It shows a bent conformation with the two benzene rings nearly perpendicular [dihedral angle = 87.17 (6)°].
Related literature
For more information on the synthesis, see: Miyazawa et al. (1999 ▶). For background to the investigation of new conjugated polymers derived from bisphenols as potential organic semi-conducting materials, see: Jaballah et al. (2006 ▶). For the use of bis-chloromethyl bisphenol A ethers for the control of fungal and bacterial organisms, see: Priddy & Hennis (1970 ▶).
Experimental
Crystal data
C21H26Cl2O2
M r = 381.32
Monoclinic,
a = 13.856 (5) Å
b = 15.185 (6) Å
c = 10.999 (4) Å
β = 118.82 (3)°
V = 2027.7 (13) Å3
Z = 4
Mo Kα radiation
μ = 0.33 mm−1
T = 293 (2) K
0.42 × 0.33 × 0.21 mm
Data collection
Enraf–Nonius TurboCAD-4 diffractometer
Absorption correction: none
2374 measured reflections
1960 independent reflections
1173 reflections with I > 2σ(I)
R int = 0.022
2 standard reflections frequency: 120 min intensity decay: 2%
Refinement
R[F 2 > 2σ(F 2)] = 0.035
wR(F 2) = 0.118
S = 1.02
1960 reflections
166 parameters
H atoms treated by a mixture of independent and constrained refinement
Δρmax = 0.25 e Å−3
Δρmin = −0.21 e Å−3
Data collection: CAD-4 EXPRESS (Enraf–Nonius, 1994 ▶); cell refinement: CAD-4 EXPRESS; data reduction: XCAD4 (Harms & Wocadlo, 1995 ▶); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008 ▶); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008 ▶); molecular graphics: ORTEP-3 for Windows (Farrugia, 1997 ▶); software used to prepare material for publication: WinGX (Farrugia, 1999 ▶).
Supplementary Material
Crystal structure: contains datablocks global, I. DOI: 10.1107/S1600536808018783/kp2175sup1.cif
Structure factors: contains datablocks I. DOI: 10.1107/S1600536808018783/kp2175Isup2.hkl
Additional supplementary materials: crystallographic information; 3D view; checkCIF report
Acknowledgments
The authors gratefully acknowledge financial support from the Ministry of Higher Education, Scientific Research and Technology of Tunisia.
supplementary crystallographic information
Comment
BPAEtCl was synthesized as part of an ongoing program on the investigation of new conjugated polymers derived from bisphenols as potential organic semi-conducting materials (Jaballah et al., 2006). This intermediate is of value in synthetic work inasmuch as the CH2C1 group can be converted to other groups such as CH2CN, CH2OH and CHO. Particularly, the bend-like structure of bisphenol A (BPA) nucleus offers a special interest in metacyclophanes synthesis (Miyazawa et al., 1999). Bis-chloromethyl bisphenol A ethers are also useful as microbicides for control of fungal and bacterial organisms (Priddy & Hennis, 1970). The molecular structure of BPAEtCl is shown in Fig. 1. The two benzene rings are nearly perpendicular, forming a dihedral angle of 87.17 (6)°. The ethoxy group plan [O1—C8—C9] is almost parallel with the benzene ring with the dihedral angle of 6.82 (37)° whereas chloromethyl group plan [C1—C7—Cl] is close to be perpendicular [82.62 (13)°].
Experimental
BPAEtCl was synthesized in two steps from 4,4'-isopropylidenediphenol [Bisphenol A, BPA]. To a stirred mixture of BPA (10 mmoles) and K2CO3 (40 mmoles) in 20 mL of dimethylformamide, was added dropwise bromoethane (30 mmoles). After stirring for 5 h at room temperature, the reaction mixture was poured into distilled water and extracted with diethyl ether. The extract was washed with distilled water, dried over anhydrous MgSO4, and then evaporated. The resultant crude product was purified by recrystallization from ethanol/water (3/1) to afford the 2,2-bis-(4-ethoxyphenyl)propane [BPAEt] as needle-like white crystals. A mixture of BPAEt (10 mmoles), paraformaldehyde (2.5 g), and 37% aqueous HCl (8.5 mL) in acetic acid (30 mL) was heated at 328 K for 5 h. The resulting mixture was then poured into distilled water and extracted with diethyl ether. The organic layer was washed several times with distilled water and dried over anhydrous MgSO4. After solvent removal and two recrystallizations from hexane, we obtained BPAEtCl as colourless crystals. Yield: 75%; mp: 352–354 K.
Refinement
Hydrogen atoms were located in a fourier map and refined freely with isotropic thermal parameters.
Figures
Fig. 1.
The molecular structure of BPAEtCl, showing the atom-labelling scheme. Displacement ellipsoids are drawn at the 50% probability level. H atoms have been omitted. Symmetry code: (i) -x + 1, y, -z + 5/2.
Crystal data
| C21H26Cl2O2 | F000 = 808 |
| Mr = 381.32 | Dx = 1.249 Mg m−3 |
| Monoclinic, C2/c | Mo Kα radiation λ = 0.71073 Å |
| Hall symbol: -C 2yc | Cell parameters from 25 reflections |
| a = 13.856 (5) Å | θ = 11.6–15.7º |
| b = 15.185 (6) Å | µ = 0.33 mm−1 |
| c = 10.999 (4) Å | T = 293 (2) K |
| β = 118.82 (3)º | Prism, colourless |
| V = 2027.7 (13) Å3 | 0.42 × 0.33 × 0.21 mm |
| Z = 4 |
Data collection
| Enraf–Nonius TurboCAD-4 diffractometer | Rint = 0.022 |
| Radiation source: fine-focus sealed tube | θmax = 26.0º |
| Monochromator: graphite | θmin = 2.2º |
| T = 293(2) K | h = −17→17 |
| non–profiled ω scans | k = −6→18 |
| Absorption correction: none | l = −1→13 |
| 2374 measured reflections | 2 standard reflections |
| 1960 independent reflections | every 120 min |
| 1173 reflections with I > 2σ(I) | intensity decay: 2% |
Refinement
| Refinement on F2 | H atoms treated by a mixture of independent and constrained refinement |
| Least-squares matrix: full | w = 1/[σ2(Fo2) + (0.052P)2 + 0.7485P] where P = (Fo2 + 2Fc2)/3 |
| R[F2 > 2σ(F2)] = 0.036 | (Δ/σ)max < 0.001 |
| wR(F2) = 0.118 | Δρmax = 0.25 e Å−3 |
| S = 1.03 | Δρmin = −0.21 e Å−3 |
| 1960 reflections | Extinction correction: none |
| 166 parameters |
Special details
| Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes. |
| Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger. |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2)
| x | y | z | Uiso*/Ueq | ||
| HC2 | 0.2827 (17) | 0.0620 (14) | 1.052 (2) | 0.046 (6)* | |
| HC4 | 0.5740 (19) | 0.1686 (14) | 1.147 (2) | 0.050 (6)* | |
| H111 | 0.641 (2) | 0.0223 (19) | 1.220 (3) | 0.085 (9)* | |
| H211 | 0.6149 (19) | −0.0548 (15) | 1.306 (3) | 0.052 (6)* | |
| H1C7 | 0.124 (2) | 0.1193 (16) | 0.880 (3) | 0.064 (8)* | |
| HC5 | 0.4965 (18) | 0.2588 (15) | 0.961 (2) | 0.051 (6)* | |
| H311 | 0.5386 (19) | −0.0493 (15) | 1.142 (3) | 0.056 (6)* | |
| H2C7 | 0.126 (2) | 0.2044 (18) | 0.786 (3) | 0.077 (8)* | |
| H2C8 | 0.403 (3) | 0.278 (2) | 0.719 (3) | 0.102 (11)* | |
| H1C9 | 0.318 (3) | 0.390 (2) | 0.568 (4) | 0.109 (13)* | |
| H2C9 | 0.217 (3) | 0.403 (3) | 0.598 (4) | 0.128 (14)* | |
| H3C9 | 0.224 (4) | 0.315 (3) | 0.524 (5) | 0.152 (17)* | |
| H1C8 | 0.392 (3) | 0.362 (2) | 0.807 (4) | 0.107 (12)* | |
| Cl | 0.11729 (5) | 0.08024 (5) | 0.67435 (7) | 0.0780 (3) | |
| C10 | 0.5 | 0.04410 (18) | 1.25 | 0.0424 (7) | |
| O1 | 0.28391 (12) | 0.26525 (10) | 0.77132 (17) | 0.0557 (5) | |
| C3 | 0.43999 (15) | 0.10349 (12) | 1.1219 (2) | 0.0360 (5) | |
| C1 | 0.27565 (15) | 0.15480 (13) | 0.9159 (2) | 0.0395 (5) | |
| C5 | 0.45100 (18) | 0.21933 (13) | 0.9770 (2) | 0.0436 (5) | |
| C2 | 0.32750 (16) | 0.10062 (13) | 1.0324 (2) | 0.0386 (5) | |
| C4 | 0.49939 (17) | 0.16456 (13) | 1.0907 (2) | 0.0420 (5) | |
| C6 | 0.33857 (16) | 0.21428 (12) | 0.8875 (2) | 0.0408 (5) | |
| C7 | 0.15422 (18) | 0.14840 (18) | 0.8252 (3) | 0.0522 (6) | |
| C11 | 0.5796 (2) | −0.01497 (17) | 1.2272 (3) | 0.0600 (8) | |
| C8 | 0.3483 (3) | 0.3195 (2) | 0.7315 (4) | 0.0752 (9) | |
| C9 | 0.2741 (4) | 0.3638 (3) | 0.5969 (4) | 0.0863 (11) |
Atomic displacement parameters (Å2)
| U11 | U22 | U33 | U12 | U13 | U23 | |
| Cl | 0.0520 (4) | 0.0956 (5) | 0.0591 (5) | 0.0027 (3) | 0.0050 (3) | −0.0129 (4) |
| C10 | 0.0475 (15) | 0.0365 (14) | 0.0313 (17) | 0 | 0.0095 (13) | 0 |
| O1 | 0.0532 (9) | 0.0566 (9) | 0.0505 (11) | 0.0097 (7) | 0.0195 (8) | 0.0228 (8) |
| C3 | 0.0406 (10) | 0.0330 (9) | 0.0282 (12) | −0.0002 (7) | 0.0116 (8) | −0.0029 (8) |
| C1 | 0.0371 (10) | 0.0412 (10) | 0.0358 (12) | 0.0050 (8) | 0.0141 (9) | 0.0017 (9) |
| C5 | 0.0467 (11) | 0.0390 (10) | 0.0434 (14) | −0.0058 (9) | 0.0204 (10) | 0.0022 (10) |
| C2 | 0.0382 (10) | 0.0382 (10) | 0.0367 (13) | −0.0020 (8) | 0.0159 (9) | −0.0001 (9) |
| C4 | 0.0358 (10) | 0.0433 (11) | 0.0363 (13) | −0.0055 (8) | 0.0090 (9) | −0.0046 (9) |
| C6 | 0.0450 (11) | 0.0383 (10) | 0.0344 (13) | 0.0055 (8) | 0.0154 (9) | 0.0030 (9) |
| C7 | 0.0400 (11) | 0.0592 (14) | 0.0478 (16) | 0.0077 (10) | 0.0135 (10) | 0.0061 (12) |
| C11 | 0.0727 (17) | 0.0472 (13) | 0.0393 (16) | 0.0191 (12) | 0.0104 (13) | −0.0055 (12) |
| C8 | 0.0762 (19) | 0.078 (2) | 0.071 (2) | 0.0090 (16) | 0.0357 (17) | 0.0314 (17) |
| C9 | 0.102 (3) | 0.087 (2) | 0.080 (3) | 0.027 (2) | 0.052 (2) | 0.042 (2) |
Geometric parameters (Å, °)
| Cl—C7 | 1.808 (3) | C5—HC5 | 0.95 (2) |
| C10—C11i | 1.533 (3) | C2—HC2 | 0.95 (2) |
| C10—C11 | 1.533 (3) | C4—HC4 | 0.92 (2) |
| C10—C3i | 1.537 (3) | C7—H1C7 | 0.99 (3) |
| C10—C3 | 1.537 (2) | C7—H2C7 | 0.95 (3) |
| O1—C6 | 1.368 (2) | C11—H111 | 1.06 (3) |
| O1—C8 | 1.430 (3) | C11—H211 | 0.97 (2) |
| C3—C2 | 1.386 (3) | C11—H311 | 0.98 (3) |
| C3—C4 | 1.388 (3) | C8—C9 | 1.494 (4) |
| C1—C6 | 1.392 (3) | C8—H2C8 | 1.04 (3) |
| C1—C2 | 1.395 (3) | C8—H1C8 | 1.00 (4) |
| C1—C7 | 1.489 (3) | C9—H1C9 | 0.91 (4) |
| C5—C4 | 1.377 (3) | C9—H2C9 | 0.99 (4) |
| C5—C6 | 1.387 (3) | C9—H3C9 | 1.07 (5) |
| C8—C9 | 1.494 (4) | ||
| C11i—C10—C11 | 108.4 (3) | C1—C7—Cl | 112.38 (17) |
| C11i—C10—C3i | 107.90 (14) | C1—C7—H1C7 | 107.3 (15) |
| C11—C10—C3i | 112.29 (13) | Cl—C7—H1C7 | 106.6 (15) |
| C11i—C10—C3 | 112.29 (13) | C1—C7—H2C7 | 109.6 (16) |
| C11—C10—C3 | 107.90 (14) | Cl—C7—H2C7 | 102.7 (17) |
| C3i—C10—C3 | 108.1 (2) | H1C7—C7—H2C7 | 118 (2) |
| C6—O1—C8 | 117.78 (18) | C10—C11—H111 | 111.7 (16) |
| C2—C3—C4 | 116.32 (18) | C10—C11—H211 | 108.1 (14) |
| C2—C3—C10 | 123.99 (17) | H111—C11—H211 | 109 (2) |
| C4—C3—C10 | 119.69 (16) | C10—C11—H311 | 109.7 (14) |
| C6—C1—C2 | 119.21 (18) | H111—C11—H311 | 109 (2) |
| C6—C1—C7 | 121.3 (2) | H211—C11—H311 | 109.5 (18) |
| C2—C1—C7 | 119.5 (2) | O1—C8—C9 | 109.2 (3) |
| C4—C5—C6 | 120.0 (2) | O1—C8—H2C8 | 107.3 (17) |
| C4—C5—HC5 | 118.4 (14) | C9—C8—H2C8 | 109.7 (19) |
| C6—C5—HC5 | 121.6 (14) | O1—C8—H1C8 | 110 (2) |
| C3—C2—C1 | 122.58 (19) | C9—C8—H1C8 | 113 (2) |
| C3—C2—HC2 | 119.3 (13) | H2C8—C8—H1C8 | 108 (3) |
| C1—C2—HC2 | 118.1 (13) | C8—C9—H1C9 | 107 (2) |
| C5—C4—C3 | 122.72 (19) | C8—C9—H2C9 | 115 (2) |
| C5—C4—HC4 | 118.3 (14) | H1C9—C9—H2C9 | 115 (3) |
| C3—C4—HC4 | 119.0 (14) | C8—C9—H3C9 | 109 (2) |
| O1—C6—C5 | 123.96 (19) | H1C9—C9—H3C9 | 110 (3) |
| O1—C6—C1 | 116.89 (18) | H2C9—C9—H3C9 | 101 (3) |
| C5—C6—C1 | 119.15 (19) |
Symmetry codes: (i) −x+1, y, −z+5/2.
Footnotes
Supplementary data and figures for this paper are available from the IUCr electronic archives (Reference: KP2175).
References
- Enraf–Nonius (1994). CAD-4 EXPRESS Software Enraf–Nonius, Delft, The Netherlands.
- Farrugia, L. J. (1997). J. Appl. Cryst.30, 565.
- Farrugia, L. J. (1999). J. Appl. Cryst.32, 837–838.
- Harms, K. & Wocadlo, S. (1995). XCAD4 University of Marburg, Germany.
- Jaballah, N., Trad, H., Majdoub, M., Jouini, M., Roussel, J. & Fave, J. L. (2006). J. Appl. Polym. Sci.99, 2997–3004.
- Miyazawa, A., Suzuki, Y., Sawada, T., Mataka, S. & Tashiro, M. (1999). J. Chem. Res. Synop.7, 426–427.
- Priddy, D. B. & Hennis, H. E. (1970). US Patent 3 546 299.
- Sheldrick, G. M. (2008). Acta Cryst. A64, 112–122. [DOI] [PubMed]
Associated Data
This section collects any data citations, data availability statements, or supplementary materials included in this article.
Supplementary Materials
Crystal structure: contains datablocks global, I. DOI: 10.1107/S1600536808018783/kp2175sup1.cif
Structure factors: contains datablocks I. DOI: 10.1107/S1600536808018783/kp2175Isup2.hkl
Additional supplementary materials: crystallographic information; 3D view; checkCIF report

