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Acta Crystallographica Section E: Structure Reports Online logoLink to Acta Crystallographica Section E: Structure Reports Online
. 2010 Aug 28;66(Pt 9):o2442. doi: 10.1107/S1600536810034173

Tetra­kis(4-tert-butyl­benz­yl)silane

Lauren E Burnham a, Rulla M Kachlan a, Andy A Thomas a, Craig A Ogle a, Daniel S Jones a,*
PMCID: PMC3007930  PMID: 21588764

Abstract

The title compound, C44H60Si, was prepared as an inter­nal standard for diffusion-ordered NMR spectroscopy. The Si atom lies on a special position with Inline graphic site symmetry.

Related literature

For applications of the title compound in NMR spectroscopy, see: Li et al. (2009). For similar structures in the same space group, see: Liao et al. (2002); Laliberté et al. (2004). For a previously reported NMR standard, see: Monroe et al. (2010). For a description of the Cambridge Structural Database, see: Allen (2002).graphic file with name e-66-o2442-scheme1.jpg

Experimental

Crystal data

  • C44H60Si

  • M r = 617.01

  • Tetragonal, Inline graphic

  • a = 17.394 (2) Å

  • c = 6.3613 (6) Å

  • V = 1924.7 (4) Å3

  • Z = 2

  • Cu Kα radiation

  • μ = 0.72 mm−1

  • T = 295 K

  • 0.31 × 0.15 × 0.12 mm

Data collection

  • Enraf–Nonius CAD-4 diffractometer

  • 5204 measured reflections

  • 1738 independent reflections

  • 1056 reflections with I > 2σ(I)

  • R int = 0.036

  • 3 standard reflections every 113 reflections intensity decay: 2%

Refinement

  • R[F 2 > 2σ(F 2)] = 0.041

  • wR(F 2) = 0.135

  • S = 1.02

  • 1738 reflections

  • 106 parameters

  • H-atom parameters constrained

  • Δρmax = 0.13 e Å−3

  • Δρmin = −0.11 e Å−3

Data collection: CAD-4 EXPRESS (Enraf–Nonius, 1994); cell refinement: CAD-4 EXPRESS; data reduction: XCAD4 (Harms & Wocadlo, 1995); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008); molecular graphics: ORTEP-3 for Windows (Farrugia, 1997) and Mercury (Macrae et al., 2006); software used to prepare material for publication: WinGX (Farrugia, 1999).

Supplementary Material

Crystal structure: contains datablocks global, I. DOI: 10.1107/S1600536810034173/su2206sup1.cif

e-66-o2442-sup1.cif (13.9KB, cif)

Structure factors: contains datablocks I. DOI: 10.1107/S1600536810034173/su2206Isup2.hkl

e-66-o2442-Isup2.hkl (83.9KB, hkl)

Additional supplementary materials: crystallographic information; 3D view; checkCIF report

Acknowledgments

This work was supported in part by funds provided by the University of North Carolina at Charlotte. Support for REU participant RMK was provided by the National Science Foundation, award number CHE-0851797. Many helpful discussions with T. Blake Monroe are gratefully acknowledged.

supplementary crystallographic information

Comment

The title compound was prepared as an internal standard for diffusion-ordered NMR spectroscopy. A recent paper on this subject (Li et al., 2009) suggests an internal standard method for correlating diffusion coefficients with formula weights. The title compound was chosen because its shape in solution both approximates that of a spheroid and is similar to that of the species being studied. In addition, it neither reacts with the species under study nor gives interfering NMR signals.

The molecular structure of the title molecule is illustrated in Fig. 1. The molecule sits on a fourfold rotoinversion axis, with the Si atom located at the point of inversion and the four ligands arranged tetrahedrally around the Si atom. The crystal packing of the title compound, viewed along the c axis, is illustrated in Fig. 2.

The space group, P42/n, is relatively rare, comprising fewer than 700 of the half-million-plus structures in the Cambridge Structural Database [Version 5.31; Allen, 2002]. Similar structures which crystallized in the same space group include tetrakis(4-N-t-Butyl-N-aminoxylphenyl)silane (Liao et al., 2002) and tetrakis(4-(Ethoxycarbonylamino)phenyl)silane bis(dioxane) clathrate (Laliberté et al., 2004).

We have previously reported on the crystal structure of another NMR standard of smaller molecular weight, bis(2-naphthylmethyl)diphenylsilane (Monroe et al., 2010).

Experimental

The synthesis of the title compound is descibed in Fig. 3. A dry, 250 ml Schlenk flask, equipped with a magnetic stirbar, was charged with 4-tertbutyltoluene (I) (7.13 g, 50 mmol), potassium tert-butoxide (6.72 g, 55 mmol), then purged with nitrogen. 100 ml of freshly distilled dry THF was added and the reaction was cooled to 195 K. n-BuLi (23.91 ml, 2.3M, 55 mmol) was then added dropwise. The Schlenk flask was then capped and kept at 233 K overnight. The solution was again cooled to 195 K and 2.09 ml (1.68 g, 10 mmol) of tetrachlorosilane was added dropwise. The reaction mixture was allowed to warm to room temperature and stirred for two hours. The mixture was then quenched with deionized water and extracted three times with petroleum ether. The combined organic layers were dried with magnesium sulfate, filtered, and evaporated. Bulb-to-bulb distillation gave a tan solid, which was recrystallized from petroleum ether to yield pure colorless crystals of tetrakis(4-tert-butylbenzyl)silane (II) (3.45 g, 56% recovery).

mp 407–409 K; 1H NMR (Toluene-d8, 300 MHz): 1.27 (s)9H, 2.14 (s)2H, 6.85 (d)2H, 7.20 (d)2H. 13C NMR (Toluene-d8, 300 MHz): 31.66, 34.20, 20.71, 124.96, 128.75, 129.52, 147.13. GC/MS (70ev) m/z: 469.4, 57.1

Refinement

The H-atoms were included in calculated positions and treated as riding atoms: C-H = 0.93, 0.97 and 0.96 Å for aromatic CH, CH2, and CH3 H-atoms, respectively, with Uiso(H) = k × Ueq(C), where k = 1.5 for CH3 H-atoms, and k = 1.2 for all other H-atoms.

Figures

Fig. 1.

Fig. 1.

View of title molecule with 50% probability displacement ellipsoids [Symmetry codes: (i) -x + 1/2, -y + 1/2, z (ii) y, -x + 1/2, -z + 1/2 (iii) -y + 1/2, x, -z + 1/2].

Fig. 2.

Fig. 2.

Crystal packing diagram of the title compound viewed along the c axis.

Fig. 3.

Fig. 3.

Synthesis scheme.

Crystal data

C44H60Si Dx = 1.065 Mg m3
Mr = 617.01 Cu Kα radiation, λ = 1.54184 Å
Tetragonal, P42/n Cell parameters from 25 reflections
Hall symbol: -P 4bc θ = 7.8–35.3°
a = 17.394 (2) Å µ = 0.72 mm1
c = 6.3613 (6) Å T = 295 K
V = 1924.7 (4) Å3 Prism, colorless
Z = 2 0.31 × 0.15 × 0.12 mm
F(000) = 676

Data collection

Enraf–Nonius CAD-4 diffractometer θmax = 67.4°, θmin = 3.6°
non–profiled ω/2θ scans h = −20→20
5204 measured reflections k = −20→15
1738 independent reflections l = −7→0
1056 reflections with I > 2σ(I) 3 standard reflections every 113 reflections
Rint = 0.036 intensity decay: 2%

Refinement

Refinement on F2 H-atom parameters constrained
Least-squares matrix: full w = 1/[σ2(Fo2) + (0.0761P)2 + 0.1124P] where P = (Fo2 + 2Fc2)/3
R[F2 > 2σ(F2)] = 0.041 (Δ/σ)max < 0.001
wR(F2) = 0.135 Δρmax = 0.13 e Å3
S = 1.02 Δρmin = −0.11 e Å3
1738 reflections Extinction correction: SHELXL97 (Sheldrick, 2008), Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
106 parameters Extinction coefficient: 0.0033 (6)
0 restraints

Special details

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2)

x y z Uiso*/Ueq
Si 0.25 0.25 0.25 0.0599 (4)
C4 0.50538 (12) 0.30509 (12) 0.4293 (4) 0.0780 (7)
H4 0.5263 0.2856 0.5529 0.094*
C1 0.33661 (10) 0.25820 (11) 0.0742 (4) 0.0674 (7)
H1A 0.3507 0.2069 0.0288 0.081*
H1B 0.3217 0.2868 −0.0502 0.081*
C5 0.54015 (10) 0.36783 (10) 0.3360 (3) 0.0535 (5)
C7 0.44050 (11) 0.35854 (12) 0.0714 (4) 0.0668 (6)
H7 0.4193 0.3779 −0.0519 0.08*
C8 0.61357 (11) 0.40291 (11) 0.4257 (4) 0.0624 (6)
C2 0.40700 (10) 0.29575 (10) 0.1652 (4) 0.0580 (5)
C6 0.50509 (12) 0.39375 (12) 0.1556 (4) 0.0674 (6)
H6 0.5255 0.4365 0.0876 0.081*
C3 0.44105 (12) 0.27021 (12) 0.3468 (4) 0.0837 (8)
H3 0.42 0.2281 0.4163 0.1*
C9 0.62982 (15) 0.48273 (14) 0.3328 (5) 0.0951 (9)
H9A 0.634 0.4789 0.1827 0.143*
H9B 0.6771 0.5023 0.3896 0.143*
H9C 0.5885 0.517 0.3682 0.143*
C10 0.68066 (12) 0.35026 (15) 0.3687 (5) 0.0992 (9)
H10A 0.672 0.3001 0.4269 0.149*
H10B 0.7275 0.3711 0.4249 0.149*
H10C 0.6848 0.3465 0.2186 0.149*
C11 0.60896 (17) 0.41111 (18) 0.6619 (5) 0.1047 (9)
H11A 0.5674 0.445 0.6977 0.157*
H11B 0.6564 0.432 0.714 0.157*
H11C 0.6002 0.3616 0.7241 0.157*

Atomic displacement parameters (Å2)

U11 U22 U33 U12 U13 U23
Si 0.0473 (4) 0.0473 (4) 0.0852 (9) 0 0 0
C4 0.0612 (12) 0.0722 (13) 0.101 (2) −0.0089 (11) −0.0143 (12) 0.0413 (13)
C1 0.0543 (11) 0.0616 (11) 0.0863 (18) 0.0010 (9) 0.0016 (11) 0.0004 (11)
C5 0.0496 (10) 0.0501 (10) 0.0609 (12) 0.0033 (8) 0.0116 (10) 0.0070 (9)
C7 0.0658 (12) 0.0750 (13) 0.0596 (15) −0.0063 (10) 0.0042 (10) 0.0141 (11)
C8 0.0584 (11) 0.0644 (12) 0.0645 (15) −0.0057 (9) 0.0067 (10) 0.0059 (10)
C2 0.0477 (10) 0.0504 (10) 0.0759 (14) 0.0042 (8) 0.0086 (10) 0.0056 (10)
C6 0.0688 (12) 0.0698 (13) 0.0638 (14) −0.0169 (10) 0.0105 (12) 0.0169 (11)
C3 0.0617 (12) 0.0677 (13) 0.122 (2) −0.0127 (10) −0.0093 (14) 0.0472 (14)
C9 0.0946 (17) 0.0790 (15) 0.112 (2) −0.0315 (13) −0.0090 (16) 0.0155 (15)
C10 0.0538 (12) 0.111 (2) 0.133 (3) 0.0025 (13) 0.0030 (14) −0.0136 (19)
C11 0.118 (2) 0.120 (2) 0.0760 (19) −0.0328 (17) 0.0054 (17) −0.0061 (17)

Geometric parameters (Å, °)

Si—C1i 1.882 (2) C8—C11 1.512 (3)
Si—C1ii 1.882 (2) C8—C10 1.527 (3)
Si—C1iii 1.882 (2) C8—C9 1.535 (3)
Si—C1 1.882 (2) C2—C3 1.372 (3)
C4—C3 1.377 (3) C6—H6 0.93
C4—C5 1.382 (3) C3—H3 0.93
C4—H4 0.93 C9—H9A 0.96
C1—C2 1.504 (3) C9—H9B 0.96
C1—H1A 0.97 C9—H9C 0.96
C1—H1B 0.97 C10—H10A 0.96
C5—C6 1.375 (3) C10—H10B 0.96
C5—C8 1.526 (3) C10—H10C 0.96
C7—C2 1.374 (3) C11—H11A 0.96
C7—C6 1.387 (3) C11—H11B 0.96
C7—H7 0.93 C11—H11C 0.96
C1i—Si—C1ii 110.68 (7) C3—C2—C7 116.09 (19)
C1i—Si—C1iii 107.08 (14) C3—C2—C1 122.34 (18)
C1ii—Si—C1iii 110.68 (7) C7—C2—C1 121.6 (2)
C1i—Si—C1 110.68 (7) C5—C6—C7 122.44 (19)
C1ii—Si—C1 107.08 (14) C5—C6—H6 118.8
C1iii—Si—C1 110.68 (7) C7—C6—H6 118.8
C3—C4—C5 122.7 (2) C2—C3—C4 121.94 (19)
C3—C4—H4 118.7 C2—C3—H3 119
C5—C4—H4 118.7 C4—C3—H3 119
C2—C1—Si 117.14 (16) C8—C9—H9A 109.5
C2—C1—H1A 108 C8—C9—H9B 109.5
Si—C1—H1A 108 H9A—C9—H9B 109.5
C2—C1—H1B 108 C8—C9—H9C 109.5
Si—C1—H1B 108 H9A—C9—H9C 109.5
H1A—C1—H1B 107.3 H9B—C9—H9C 109.5
C6—C5—C4 115.05 (19) C8—C10—H10A 109.5
C6—C5—C8 123.50 (17) C8—C10—H10B 109.5
C4—C5—C8 121.4 (2) H10A—C10—H10B 109.5
C2—C7—C6 121.8 (2) C8—C10—H10C 109.5
C2—C7—H7 119.1 H10A—C10—H10C 109.5
C6—C7—H7 119.1 H10B—C10—H10C 109.5
C11—C8—C5 111.41 (19) C8—C11—H11A 109.5
C11—C8—C10 109.4 (2) C8—C11—H11B 109.5
C5—C8—C10 108.13 (17) H11A—C11—H11B 109.5
C11—C8—C9 107.9 (2) C8—C11—H11C 109.5
C5—C8—C9 111.83 (18) H11A—C11—H11C 109.5
C10—C8—C9 108.09 (19) H11B—C11—H11C 109.5

Symmetry codes: (i) −y+1/2, x, −z+1/2; (ii) −x+1/2, −y+1/2, z; (iii) y, −x+1/2, −z+1/2.

Footnotes

Supplementary data and figures for this paper are available from the IUCr electronic archives (Reference: SU2206).

References

  1. Allen, F. H. (2002). Acta Cryst. B58, 380–388. [DOI] [PubMed]
  2. Enraf–Nonius (1994). CAD-4 EXPRESS Enraf–Nonius, Delft, The Netherlands.
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  4. Farrugia, L. J. (1999). J. Appl. Cryst.32, 837–838.
  5. Harms, K. & Wocadlo, S. (1995). XCAD4 University of Marburg, Germany.
  6. Laliberté, D., Maris, T. & Wuest, J. (2004). Can. J. Chem.82, 386–398.
  7. Li, D., Kagan, G., Hopson, R. & Williard, P. G. (2009). J. Am. Chem. Soc.131, 5627–5634. [DOI] [PMC free article] [PubMed]
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  11. Sheldrick, G. M. (2008). Acta Cryst. A64, 112–122. [DOI] [PubMed]

Associated Data

This section collects any data citations, data availability statements, or supplementary materials included in this article.

Supplementary Materials

Crystal structure: contains datablocks global, I. DOI: 10.1107/S1600536810034173/su2206sup1.cif

e-66-o2442-sup1.cif (13.9KB, cif)

Structure factors: contains datablocks I. DOI: 10.1107/S1600536810034173/su2206Isup2.hkl

e-66-o2442-Isup2.hkl (83.9KB, hkl)

Additional supplementary materials: crystallographic information; 3D view; checkCIF report


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