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Acta Crystallographica Section E: Structure Reports Online logoLink to Acta Crystallographica Section E: Structure Reports Online
. 2012 May 23;68(Pt 6):o1856. doi: 10.1107/S160053681202243X

2-Methyl­sulfonyl-4-(trifluoro­meth­yl)benzoic acid

Lin-Shan Yao a, Bo We a, Jin-Sheng Gao a,*
PMCID: PMC3379423  PMID: 22719621

Abstract

In the title mol­ecule, C9H7F3O4S, the S and the methyl C atoms of the methyl­sulfonyl group deviate from the benzene ring plane by 0.185 (2) and −1.394 (3) Å, respectively. In the crystal, O—H⋯O hydrogen bonds link the mol­ecules into chains along [201]. Weak C—H⋯O inter­actions further link these chains into layers parallel to the ac plane.

Related literature  

For details of the synthesis, see: Cain et al. (1998). graphic file with name e-68-o1856-scheme1.jpg

Experimental  

Crystal data  

  • C9H7F3O4S

  • M r = 268.21

  • Monoclinic, Inline graphic

  • a = 5.0804 (10) Å

  • b = 17.345 (4) Å

  • c = 11.576 (2) Å

  • β = 95.41 (3)°

  • V = 1015.6 (4) Å3

  • Z = 4

  • Mo Kα radiation

  • μ = 0.36 mm−1

  • T = 293 K

  • 0.39 × 0.32 × 0.22 mm

Data collection  

  • Rigaku R-AXIS RAPID diffractometer

  • Absorption correction: multi-scan (ABSCOR; Higashi, 1995) T min = 0.871, T max = 0.926

  • 9132 measured reflections

  • 2250 independent reflections

  • 1879 reflections with I > 2σ(I)

  • R int = 0.029

Refinement  

  • R[F 2 > 2σ(F 2)] = 0.044

  • wR(F 2) = 0.123

  • S = 1.11

  • 2250 reflections

  • 158 parameters

  • 1 restraint

  • H atoms treated by a mixture of independent and constrained refinement

  • Δρmax = 0.39 e Å−3

  • Δρmin = −0.38 e Å−3

Data collection: RAPID-AUTO (Rigaku, 1998); cell refinement: RAPID-AUTO; data reduction: CrystalClear (Rigaku/MSC, 2002); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008); molecular graphics: SHELXTL (Sheldrick, 2008); software used to prepare material for publication: SHELXL97.

Supplementary Material

Crystal structure: contains datablock(s) I, global. DOI: 10.1107/S160053681202243X/cv5300sup1.cif

e-68-o1856-sup1.cif (18.9KB, cif)

Structure factors: contains datablock(s) I. DOI: 10.1107/S160053681202243X/cv5300Isup2.hkl

e-68-o1856-Isup2.hkl (110.6KB, hkl)

Supplementary material file. DOI: 10.1107/S160053681202243X/cv5300Isup3.cml

Additional supplementary materials: crystallographic information; 3D view; checkCIF report

Table 1. Hydrogen-bond geometry (Å, °).

D—H⋯A D—H H⋯A DA D—H⋯A
O2—H2⋯O4i 0.82 (1) 1.92 (1) 2.725 (3) 169 (4)
C9—H9B⋯O3ii 0.96 2.35 3.208 (3) 148

Symmetry codes: (i) Inline graphic; (ii) Inline graphic.

Acknowledgments

The authors thank the Project of Innovation Service Platform of Heilongjiang Province (grant No. PG09J001) and Heilongjiang University for support.

supplementary crystallographic information

Comment

The title compound, (I), is a intermediate in the synthesis of sulfonylurea herbicides developed and produced by E. I. du Pont de Nemours and Company. Herein, we report its crystal structure.

In (I) (Fig. 1), the S and the methyl C atoms of the methylsulfonyl group deviate from the benzene ring plane at 0.185 (2) and -1.394 (3) Å, respectively. Intermoleculear O—H···O hydrogen bonds (Table 1) link the molecules into chains along [201] (Fig. 2), and weak C—H···O interactions (Table 1) link further these chains into layers parallel to ac plane.

Experimental

The title compound was prepared by the reaction of 2-(methylsulphenyl)-4-trifluoromethylbenzoic acid and hydrogen peroxide in acetic acid at 10 ° (Cain et al., 1998). A colourless crystal suitable for single-crystal X-ray diffraction was obtained by the recrystallization from dichloromethane.

Refinement

C-bound H atoms were placed in calculated positions and treated as riding on their parent atoms, with C—H = 0.93 – 0.96 Å , and with Uiso(H) = 1.2 – 1.5 Ueq(C). O-bound H atoms were located in a differece Fourier map and were refined with restraint as O—H = 0.82 (1) Å, and Uiso(H) = 1.5Ueq(O).

Figures

Fig. 1.

Fig. 1.

The molecular structure of (I) showing displacement ellipsoids at the 50% probability level for non-H atoms.

Fig. 2.

Fig. 2.

A portion of the crystal packing showing hydrogen-bonded (dashed lines) chains.

Crystal data

C9H7F3O4S F(000) = 544
Mr = 268.21 Dx = 1.754 Mg m3
Monoclinic, P21/c Mo Kα radiation, λ = 0.71073 Å
Hall symbol: -P 2ybc Cell parameters from 8167 reflections
a = 5.0804 (10) Å θ = 3.0–27.5°
b = 17.345 (4) Å µ = 0.36 mm1
c = 11.576 (2) Å T = 293 K
β = 95.41 (3)° Block, colorless
V = 1015.6 (4) Å3 0.39 × 0.32 × 0.22 mm
Z = 4

Data collection

Rigaku R-AXIS RAPID diffractometer 2250 independent reflections
Radiation source: fine-focus sealed tube 1879 reflections with I > 2σ(I)
Graphite monochromator Rint = 0.029
ω scan θmax = 27.5°, θmin = 3.5°
Absorption correction: multi-scan (ABSCOR; Higashi, 1995) h = −6→6
Tmin = 0.871, Tmax = 0.926 k = −22→22
9132 measured reflections l = −14→14

Refinement

Refinement on F2 Primary atom site location: structure-invariant direct methods
Least-squares matrix: full Secondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.044 Hydrogen site location: inferred from neighbouring sites
wR(F2) = 0.123 H atoms treated by a mixture of independent and constrained refinement
S = 1.11 w = 1/[σ2(Fo2) + (0.0555P)2 + 0.7827P] where P = (Fo2 + 2Fc2)/3
2250 reflections (Δ/σ)max = 0.001
158 parameters Δρmax = 0.39 e Å3
1 restraint Δρmin = −0.38 e Å3

Special details

Geometry. All esds (except the esd in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell esds are taken into account individually in the estimation of esds in distances, angles and torsion angles; correlations between esds in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell esds is used for estimating esds involving l.s. planes.
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > 2sigma(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2)

x y z Uiso*/Ueq
C1 0.2822 (5) 0.85011 (13) 0.09229 (19) 0.0319 (5)
C2 0.4291 (5) 0.80387 (12) 0.17524 (19) 0.0284 (5)
C3 0.6265 (5) 0.83602 (13) 0.25122 (19) 0.0304 (5)
H3 0.7242 0.8051 0.3051 0.037*
C4 0.6780 (5) 0.91494 (13) 0.2467 (2) 0.0337 (5)
C5 0.5314 (5) 0.96140 (14) 0.1677 (2) 0.0392 (6)
H5 0.5636 1.0141 0.1658 0.047*
C6 0.3360 (5) 0.92880 (14) 0.0911 (2) 0.0396 (6)
H6 0.2386 0.9602 0.0378 0.048*
C7 0.0778 (5) 0.81875 (14) 0.0022 (2) 0.0353 (5)
C8 0.8793 (5) 0.94984 (14) 0.3342 (2) 0.0389 (6)
C9 0.4951 (5) 0.65356 (15) 0.0879 (2) 0.0436 (6)
H9A 0.4715 0.5992 0.0984 0.065*
H9B 0.6803 0.6649 0.0889 0.065*
H9C 0.4062 0.6691 0.0147 0.065*
F1 1.0869 (4) 0.90478 (10) 0.35927 (19) 0.0655 (5)
F2 0.7743 (4) 0.96498 (13) 0.43239 (16) 0.0743 (6)
F3 0.9734 (4) 1.01622 (10) 0.29917 (18) 0.0648 (5)
O1 0.0598 (4) 0.75293 (11) −0.02770 (17) 0.0511 (5)
O2 −0.0822 (4) 0.87346 (13) −0.0433 (2) 0.0594 (6)
H2 −0.187 (6) 0.853 (2) −0.092 (3) 0.089*
O3 0.0826 (3) 0.69334 (11) 0.19817 (16) 0.0409 (4)
O4 0.5177 (4) 0.68310 (10) 0.30716 (16) 0.0420 (4)
S1 0.36264 (11) 0.70384 (3) 0.20026 (5) 0.02965 (18)

Atomic displacement parameters (Å2)

U11 U22 U33 U12 U13 U23
C1 0.0313 (12) 0.0354 (12) 0.0275 (10) −0.0014 (9) −0.0052 (9) −0.0003 (9)
C2 0.0292 (11) 0.0281 (10) 0.0270 (10) −0.0019 (8) −0.0027 (9) −0.0010 (8)
C3 0.0292 (11) 0.0307 (11) 0.0298 (10) −0.0012 (9) −0.0056 (9) −0.0011 (9)
C4 0.0343 (13) 0.0323 (11) 0.0340 (11) −0.0041 (9) 0.0002 (10) −0.0039 (9)
C5 0.0465 (15) 0.0295 (11) 0.0402 (13) −0.0049 (10) −0.0025 (11) 0.0017 (9)
C6 0.0461 (15) 0.0348 (12) 0.0358 (12) −0.0008 (10) −0.0079 (11) 0.0054 (10)
C7 0.0363 (13) 0.0409 (13) 0.0264 (11) −0.0014 (10) −0.0080 (10) 0.0021 (9)
C8 0.0381 (14) 0.0344 (12) 0.0426 (13) −0.0063 (10) −0.0053 (11) −0.0041 (10)
C9 0.0411 (14) 0.0387 (13) 0.0500 (15) 0.0002 (11) −0.0014 (12) −0.0120 (11)
F1 0.0520 (11) 0.0479 (10) 0.0892 (14) 0.0019 (8) −0.0329 (10) −0.0072 (9)
F2 0.0700 (14) 0.1067 (17) 0.0459 (10) −0.0298 (12) 0.0039 (9) −0.0328 (10)
F3 0.0673 (12) 0.0446 (9) 0.0773 (12) −0.0257 (8) −0.0208 (10) 0.0066 (9)
O1 0.0628 (14) 0.0392 (10) 0.0453 (10) −0.0044 (9) −0.0255 (10) −0.0005 (8)
O2 0.0596 (14) 0.0481 (12) 0.0622 (13) 0.0101 (10) −0.0377 (11) −0.0121 (10)
O3 0.0279 (9) 0.0490 (10) 0.0441 (10) −0.0075 (7) −0.0047 (8) 0.0036 (8)
O4 0.0404 (10) 0.0411 (10) 0.0410 (10) −0.0038 (7) −0.0135 (8) 0.0091 (7)
S1 0.0264 (3) 0.0294 (3) 0.0313 (3) −0.0036 (2) −0.0070 (2) 0.0017 (2)

Geometric parameters (Å, º)

C1—C6 1.392 (3) C7—O1 1.194 (3)
C1—C2 1.410 (3) C7—O2 1.326 (3)
C1—C7 1.502 (3) C8—F1 1.322 (3)
C2—C3 1.387 (3) C8—F3 1.325 (3)
C2—S1 1.796 (2) C8—F2 1.326 (3)
C3—C4 1.396 (3) C9—S1 1.753 (3)
C3—H3 0.9300 C9—H9A 0.9600
C4—C5 1.383 (3) C9—H9B 0.9600
C4—C8 1.498 (3) C9—H9C 0.9600
C5—C6 1.387 (4) O2—H2 0.816 (10)
C5—H5 0.9300 O3—S1 1.4325 (18)
C6—H6 0.9300 O4—S1 1.4484 (18)
C6—C1—C2 118.2 (2) O2—C7—C1 112.0 (2)
C6—C1—C7 118.1 (2) F1—C8—F3 106.1 (2)
C2—C1—C7 123.6 (2) F1—C8—F2 107.8 (2)
C3—C2—C1 120.5 (2) F3—C8—F2 106.0 (2)
C3—C2—S1 114.94 (17) F1—C8—C4 112.9 (2)
C1—C2—S1 124.32 (17) F3—C8—C4 112.8 (2)
C2—C3—C4 119.8 (2) F2—C8—C4 110.8 (2)
C2—C3—H3 120.1 S1—C9—H9A 109.5
C4—C3—H3 120.1 S1—C9—H9B 109.5
C5—C4—C3 120.3 (2) H9A—C9—H9B 109.5
C5—C4—C8 120.2 (2) S1—C9—H9C 109.5
C3—C4—C8 119.3 (2) H9A—C9—H9C 109.5
C4—C5—C6 119.6 (2) H9B—C9—H9C 109.5
C4—C5—H5 120.2 C7—O2—H2 107 (3)
C6—C5—H5 120.2 O3—S1—O4 116.25 (11)
C5—C6—C1 121.5 (2) O3—S1—C9 112.01 (13)
C5—C6—H6 119.3 O4—S1—C9 107.14 (13)
C1—C6—H6 119.3 O3—S1—C2 108.76 (11)
O1—C7—O2 122.8 (2) O4—S1—C2 106.40 (11)
O1—C7—C1 125.2 (2) C9—S1—C2 105.64 (12)

Hydrogen-bond geometry (Å, º)

D—H···A D—H H···A D···A D—H···A
O2—H2···O4i 0.82 (1) 1.92 (1) 2.725 (3) 169 (4)
C9—H9B···O3ii 0.96 2.35 3.208 (3) 148

Symmetry codes: (i) x−1, −y+3/2, z−1/2; (ii) x+1, y, z.

Footnotes

Supplementary data and figures for this paper are available from the IUCr electronic archives (Reference: CV5300).

References

  1. Cain, P. A., Cramp, S. M., Lambert, C., Wallis, D. I., Yarwood, T. D., Little, G. M., Morris, J., Musil, T., Pettit, S. N. & Smith, P. H. G. (1998). US Patent No. 5804532.
  2. Higashi, T. (1995). ABSCOR Rigaku Corporation, Tokyo, Japan.
  3. Rigaku (1998). RAPID-AUTO Rigaku Corporation, Tokyo, Japan.
  4. Rigaku/MSC (2002). CrystalClear Rigaku/MSC Inc., The Woodlands, Texas, USA.
  5. Sheldrick, G. M. (2008). Acta Cryst. A64, 112–122. [DOI] [PubMed]

Associated Data

This section collects any data citations, data availability statements, or supplementary materials included in this article.

Supplementary Materials

Crystal structure: contains datablock(s) I, global. DOI: 10.1107/S160053681202243X/cv5300sup1.cif

e-68-o1856-sup1.cif (18.9KB, cif)

Structure factors: contains datablock(s) I. DOI: 10.1107/S160053681202243X/cv5300Isup2.hkl

e-68-o1856-Isup2.hkl (110.6KB, hkl)

Supplementary material file. DOI: 10.1107/S160053681202243X/cv5300Isup3.cml

Additional supplementary materials: crystallographic information; 3D view; checkCIF report


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