Correction
Figure 4g in the original version of this article [1] was misused in the typesetting process. The figure 4g is the same as figure 4a. The corrected image for figure 4g is shown here (Figure 1).
Figure 1.
Low-magnification TEM image of the ZFO film on the Si.
Contributor Information
Yuan-Chang Liang, Email: yuanvictory@gmail.com.
Hao-Yuan Hsia, Email: shia790819@hotmail.com.
References
- Liang YC, Hsia HY. Growth and crystallographic feature-dependent characterization of spinel zinc ferrite thin films by RF sputtering. Nanoscale Res Lett. 2013;9:537. doi: 10.1186/1556-276X-8-537. [DOI] [PMC free article] [PubMed] [Google Scholar]