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Proceedings of the National Academy of Sciences of the United States of America logoLink to Proceedings of the National Academy of Sciences of the United States of America
. 1972 May;69(5):1097–1099. doi: 10.1073/pnas.69.5.1097

The Size of Localized States Near the Mobility Edge

P W Anderson 1,2
PMCID: PMC426638  PMID: 16591981

Abstract

The “mobility edge” is the critical point at which a transition from localized to extended character of the eigenfunctions occurs in the random lattice problem. We study the behavior of the eigenfunctions as this critical point is approached, and produce arguments that suggest that they fall off, on the average, as exp(-α)R with range R, and that α α [E - Ec]0.6

Keywords: amorphous semiconductors, localizability

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