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. 2014 Dec 23;11:122. doi: 10.1186/s12977-014-0122-8

Table 4.

Association between the major drug resistance mutations emerging in treatment failures from the ALIVE cohort, the drug regimens reported at the time of failure, and expected resistance profile based on genotype results

Sample # visit # Drug resistance mutation Gene product Frequency of DR mutation (coverage)* Mutational load (copies/ml) Treatment at time point of failure Stanford resistance profile for major mutations
2v15 M41L RT 13.3%(5316) 6913 ZDV, 3TC H: 3TC, FTC
M184V RT 99.9%(7721) 51926 L: ABC, DDI
5v20 K103N RT 100%(5807) 513564 ZDV, 3TC, H: 3TC, FTC,
M184V RT 82.8%(5266) 425231 ABC, EFV EFV, NVP
L: ABC
PL: DDI
6v20 L90M PI 16.2%(3602) 179820 TDF, FTC, DRVr, RAL H: NFV
I: IDV, SQV
L: ATV, LPV, FPV,
9v33 M184V RT 99.8%(7493) 420158 ZDV, 3TC, ABC, RTV, FTC H: 3TC, FTC
L: ABC
PL: DDI
10v10 K103N RT 100%(5979) 40200 EFV, TDF, FTC H: 3TC, FTC, EFV, NVP
M184V RT 100%(5399) 40200 L: ABC
PL: DDI
16v11 E138K RT 7.6%(8955) 27149 3TC, RTV, LPV H: 3TC, FTC
M184V RT 56.6%(8222) 202190 I: RPV
S147G IN 7.0%(3123) 25006 L: ABC
PL: DDI, EFV, ETR, NVP
23v17 K103N RT 99.8%(6110) 16168 EFV, TDF, FTC H: 3TC, FTC, EFV, NVP
M184V RT 67.1%(6182) 10870
L: ABC
PL: DDI
27v05 M46I** PI 7.3%(3591) 1262 d4T, 3TC, ABC, IDVr L: NFV
PL: ATV, FPV, IDVr, LPV (non-emerging DR related to treatment: H: 3TC, L: ABC)

Boldface: correlation between mutation, treatment and drug resistance profile in each patient sample at the time point of treatment failure. H = high level drug resistance, I = intermediate drug resistance, L = low level drug resistance, PL: potential low level drug resistance. Drug resistance mutations in italics are not associated with any reported drug taken by the patients throughout the course of this study. *Coverage refers to the number of sequencing reads representing a given nucleotide. **Patient 27 virus also harbored I54V, L90M, K103N and M184V at both time points. These mutations did not emerge between treatment success and failure, but likely contributed to overall failure.