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. 2015 Mar 5;6:6612. doi: 10.1038/ncomms7612

Corrigendum: Dark-field X-ray microscopy for multiscale structural characterization

H Simons, A King, W Ludwig, C Detlefs, W Pantleon, S Schmidt, F Stöhr, I Snigireva, A Snigirev, H F Poulsen
PMCID: PMC4366500  PMID: 25739984

Nature Communications 6: Article number: 6098 10.1038/ncomms7098 (2015); Published: January142015; Updated: March052015

The authors inadvertently omitted Frederik Stöhr, who developed the silicon condenser lens used for the acquisition of data presented in this Article, from the author list. This has now been corrected in both the PDF and HTML versions of the Article.


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