Bidirectional Reflectometry. Part II.

Abstract

In connection with the work on development of a high resolution laser source bidirectional reflectometer, a large number of papers were collected dealing with various aspects of the geometrical distribution of the radiant energy reflected from surfaces of different types.

Each paper has been classified into one or more classes on the basis of its technical content. There are eight general classes, with several subclasses in some of the general classes.

Because of the interest in this field, the bibliography is being published as a service to the public.

A large number (371) of papers was collected, dealing with various aspects of the geometrical distribution of the radiant energy scattered by reflection from surfaces, and particularly from rough surfaces. These papers were referred to during the development of a high-resolution laser-source bidirectional reflectometer.

Each paper is classified in the Bibliography into one or more of thirteen subject categories on the basis of its technical content. A key to the symbols used in the bibliography is given in table 1.

Table 1.

Subject Categories

Symbol
R	Reflectance
Em	Emittance
T	Transmittance
S	Scattering
P	Polarization
Ma	Mathematics
H	Heat Transfer Between Rough Surfaces
Ex	Experimental
Th	Theoretical
Su	Survey
L	Laser
SM	Surface Roughness Measurement
Ap	Apparatus

In addition, each paper by number has been classified in a second system, consisting of eight primary classes, with several subclasses in several of the primary classes, in table 2.

Table 2.

Primary Classes

NOMENCLATURE AND APPLICATION

8, 42, 50, 52, 97, 101, 102, 113, 125, 132, 141, 143, 144, 154, 155, 180, 195, 216, 237, 238, 243, 275, 314, 315, 327, 341, 345

SURFACE ROUGHNESS MEASUREMENT

3, 12, 13, 16, 36, 61, 64, 65, 66, 69, 73, 80, 87, 95, 98, 99, 111, 115, 127, 133, 135, 136, 149, 157, 162, 171, 176, 190, 226–232, 245, 247, 255, 257, 258, 262, 265, 267, 277, 281, 286, 308, 312, 331, 347, 359, 361–365

THEORY (RANDOM DISTRIBUTION SURFACE ROUGHNESS)

SMALL FACETS SURFACE ASSUMPTION

18–21, 41, 77, 137, 138a, 181, 198, 210, 217, 223, 241, 261, 280, 292, 306, 321, 326, 328, 330

KIRCHHOFF-HUYGENS SOLUTION

9, 11, 32, 34, 36, 54, 81, 82, 90, 91, 92, 114, 116, 121, 137, 140, 150, 153, 160, 166, 178, 179, 254, 263, 264, 268, 299, 304, 311

OTHERS

10, 23, 24, 25, 32, 53, 67, 70, 76, 79, 84, 88, 89, 96, 105, 108, 109, 112, 119, 120, 123, 126, 128, 134, 146, 159, 170, 183, 184, 185, 193, 194, 199, 202, 205, 211, 223, 233, 242, 244, 274, 291, 301, 303, 307, 313, 328, 339, 342, 343

THEORY (PERIODIC DISTRIBUTION SURFACE ROUGHNESS)

CONTINUOUS SURFACES (SINUSOIDAL, GRATING, V-GROOVE, etc.)

1, 5, 6, 7, 14, 17, 22, 29, 32, 49, 51, 55, 59, 60, 114, 142, 156, 161, 167, 168, 169, 188, 209, 213, 214, 215, 219, 233, 234, 284, 353, 367, 370

SPHERES AND DISTRIBUTION

37–40, 43, 44, 56, 57, 104, 158, 177, 187, 207, 246, 248, 272, 332, 334, 335, 337, 352, 355, 356, 366

CYLINDERS AND DISTRIBUTION

56, 68, 110, 147, 164, 174, 220, 222, 239, 250, 289, 293, 294, 332, 333, 336, 338, 340, 349, 350, 351

SHADOWING AND POLARIZATION

28, 30, 57, 62, 74, 103, 117, 118, 119, 122, 124, 129, 138a, 202, 203, 204, 210, 224, 225, 252, 253, 260, 261, 279, 287, 292, 298, 317, 348, 367, 368

EXPERIMENTAL DATA (ON RANDOM DISTRIBUTION SURFACES)

COHERENT SOURCE

15, 75, 84, 85, 131, 189, 191, 192, 194, 208, 283

INCOHERENT SOURCE

4, 26, 27, 33, 35, 45–48, 58, 70, 72, 73, 93, 102, 106, 130, 139, 145, 151, 163, 165, 212, 218, 221, 240, 251, 256, 259, 261, 270, 271, 273, 276, 278, 285, 295, 296, 297, 300, 309, 310, 316–318, 320, 323, 324, 325, 329, 346, 354, 357

EXPERIMENTAL DATA (ON PERIODIC DISTRIBUTION SURFACES)

78, 86, 94, 168, 197, 201, 285, 370, 371

GONIOREFLECTOMETER

COHERENT SOURCE

15, 71, 78, 84, 85, 131, 180, 191, 192, 194, 201, 206, 208, 283

INCOHERENT SOURCE

4, 35, 45, 47, 48, 58, 73, 83, 106, 139, 145, 163, 196, 197, 212, 218, 221, 235, 259, 295, 297, 300, 320, 323, 354, 371

R, Th	1. Adorjan, A. S. and Wierum, F. A., Radiative properties of rough surfaces, AIAA Paper No. 70–862, AIAA 5th Thermophysics Conference, June 1970.
Em, Th	2. Agababov, S. G., Effect of roughness of the surface of a solid body on its radiation properties and methods for their experimental determination, High Temp. 6 (1), 76–85 (1968).
SM	3. Agababov, S. G. and Eksler, L. I., Influence of the geometric characteristics of the relief of the surface of a solid on its radiation properties (determination of the roughness factor), High Temp. 9 (3), 475–479 (1971).
R, Ex	4. Agnew, J. T. and McQuistan, R. B., Experiments concerning infrared diffuse reflectance standards in the range 0.8 to 20.0 microns, J. Opt. Soc. Am. 43 (11), 999–1007 (1953).
S, R, Th	5. Aksenov, V. I., On the scattering of electromagnetic waves from sinusoidal and trochoidal surfaces of finite conductivity, Radio Eng. & Electron. 3 (4), 1–10 (1958).
S, Ex, Ap	6. Aksenov, V. I., Experimental investigation of electromagnetic wave scattering from periodically uneven surfaces, Radio Eng. & Electron. (USSR) 5 (5) 113–129 (1960).
S, Th	7. Aksenov, V. I., Utilization of Kirchhoff’s approximation in the problem of the scattering of radio waves by periodically rough surfaces with finite conductivity, Radio Eng. & Electron. 3, 307–314 (Mar. 1961).
H	8. Amar, R. C. and Edwards, D. K., Reflection and transmission by rough-walled passages, AIAA Paper No. 72-303, 1–9, AIAA 7th Thermophysics Conference, San Antonio, Tex., Apr. 10–12, 1972.
R, Th	9. Ament, W. S., Toward a theory of reflection by a rough surface, Proc. IRE 41, 142–146 (Jan. 1953).
R, S, Th	10. Ament, W. S., Forward- and back-scattering from certain rough surfaces, IRE Trans. AP-4 (3), 369–373 (July 1956).
R, S, Th	11. Ament, W. S., Reciprocity and scattering by certain rough surfaces, IRE Trans. on Antennas and Propagation AP-8 (2), 167–174 (Mar. 1960).
SM	12. American Standard, Surface texture-surface roughness, waviness and lay-ASA B46. 1–1962, UDC 621.9.015 -American Society of Mechanical Engineers.
SM	13. Armand, G., Lapujoulade, J., and Paigne, J., A theoretical relationship between the leakage of gases through the interface of two metals in contact and their superficial micro-geometry, Vacuum 14, 53–57 (1964).
S, Th	14. Artmann, K., Zur Theorie der anomalen reflexion von optischen strichgittern, Z. Physik 119, 529–567 (1942).
Ap, Ex(L)	15. Bair, M. E., Carmer, D. C, and Stewart, S. R., A gonioreflectometer facility using coherent and incoherent sources, Tech. Rept. AFAL–TR–70–161, p. 1–30. Infrared and Optics Lab., Univ. of Michigan, Ann Arbor, Mich. (Aug. 1970).
SM	16. Barash, V. Ya. and Uspenskii, Yu. P., Test metrological characteristics of surface-roughness measuring instruments, Measurement Tech. No. 2, 273–274 (Feb. 1969). (Translated from Izmeritel’naya Tekhnika, No. 2, 83, Feb. 1969).
S, Th	17. Baret, J. F. and Mann, J. A., Role of high-order grating effects in the scattered irradiance of corrugated surfaces, Appl. Opt. 10 (5), 1174–1176 (1971).
R, Th, Ex	18. Barkas, W. W., Analysis of light scattered from a surface of low gloss into its specular and diffuse components, Proc. Phys. Soc. (London) 51, 274–295 (1939).
R, S, Th	19. Barrick, D. E., Rough surface scattering based on the specular point theory, IEEE Trans. Antennas and Propagation AP-16, 449–454 (1968).
R, Th	20. Barrick, D. E., Relationship between slope probability density function and the physical optics integral in rough surface scattering, Proc. IEEE 56, No. 10, 1728–1729 (Oct. 1968).
R, S, Th	21. Barrick, D. E., Correction to “Rough surface scattering based on the specular point theory”, IEEE Trans. on Antennas and Propagation AP-17 (1), 81 (1969).
S, Th	22. Barrick, D. E., Low-frequency scatter from a semielliptic groove in a ground plane, J. Opt. Soc. Am. 60 (5), 625–634 (May 1970).
S, Th	23. Barrick, D. E. and Peake, W. H., Scattering from surfaces with different roughness scales: analysis and interpretation, Rept. No. BAT–197A–10–3, Battelle Memorial Institute, Columbus, Ohio (1967). AD–662 751.
S, Th	24. Bass, F. G., On the theory of combination scattering of waves on a rough surface, AFCRL No. 511, 1–12, 1961. (Translated from Izvestiia VUZ, Radiofizika, 4 (1), 58–66, 1961). AD–262 417.
S, Th	25. Bass, F. G. and Bocharov, V. G., On the theory of scattering of electromagnetic waves from a statistically uneven surface, Radio Eng. & Electron. (USSR), 3 (2), 251–258 (1958).
Su(Th) R, T, Ex	26. Beaglehole, D. and Hunderi, O., Study of the interaction of light with rough metal surfaces. I. Experiment, Phys. Rev. B 2 (2), 309–321 (1970).
S, Ex	27. Beard, C. I., Coherent and incoherent scattering of microwaves from the ocean, IRE Trans. on Antennas and Propagation AP-9 (5), 470–483 (Sept. 1961).
P, Th	28. Beckmann, P., The depolarisation of electromagnetic waves scattered from rough surfaces, Acta Technica No. 6, 511–523 (1961).
S, R, Th	29. Beckmann, P., The scattering of waves by a periodic surface, Czech. J. Phys. B11, 863–870 (1961).
R, S, Th	30. Beckmann, P., Shadowing of random rough surfaces, IEEE Trans. on Antennas and Propagation AP–13, 384–388 (May 1965).
S, R, Th	31. Beckmann, P., Scattering from rough surfaces for finite distances between transmitter and receiver, Rept. No. D1–82–0657, 1–39, Boeing Scientific Research Labs., Seattle, Wash., Geoastrophysics Lab. (Oct. 1967). AD–666 593.
R, Th, Su	32. Beckmann, P. and Spizzichino, A., The scattering of electromagnetic waves from rough surfaces, Vol. 4, International Series of Monographs on Electromagnetic Waves (Pergamon Press, Macmillan, New York, N.Y. 1963).
R, Ex	33. Bennett, H. E., Specular reflectance of aluminized ground glass and the height distribution of surface irregularities, J. Opt. Soc. Am. 53 (12), 1389–1394 (1963).
R, Th	34. Bennett, H. E., Influence of surface roughness, surface damage, and oxide films on emittance, NASA SP–55, Symposium on Thermal Radiation of Solids (S. Katzoff, Ed.) pp. 145–152, NASA (1965).
Ex, R	35. Bennett, H. E., Measurement of Light scattered from very smooth surfaces, Preprint of a paper presented at the Optical Society of America 1970 Annual Meeting, Sept. 28–Oct. 2, held at Hollywood, Fla.
R, Th, Ex	36. Bennett, H. E. and Porteus, J. O., Relation between surface roughness and specular reflectance at normal incidence, J. Opt. Soc. Am. 51 (2), 123–129 (Feb. 1961).
R, Th	37. Berreman, D. W., Anomalous reststrahl structure from slight surface roughness, Phys. Rev. 163 (3), 855–864 (Nov. 1967).
R, Th	38. Berreman, D. W., Resonant reflectance anomalies: effect of shapes of surface irregularities, Preprint of 1969 spring meeting, Optical Society of America, San Diego, Calif., March 1969.
R, Th	39. Berreman, D. W., Reflectance and ellipsometry of slightly tarnished, dirty or rough surfaces, Bell Telephone Lab. Inc., Murray Hill, N.J., Preprint of paper ThG 17, Optical Society of America Annual Meeting, Chicago, Ill., Oct. 21–24, 1969.
R, Th	40. Barreman, D. W., Reflectance and ellipsometry when submicroscopic particles bestrew a surface, J. Opt. Soc. Am. 60 (4), 499–505 (Apr. 1970).
R, Th	41. Berry, E. M., Diffuse reflection of light from a matt surface, J. Opt. Soc. Am. 7, 627–633 (1923).
H, Th	42. Bevans, J. T. and Edwards, D. K., Radiation exchange in an enclosure with directional wall properties, ASME Paper No. 64-WA/HT-52, 1–21, 1964 ASME Winter Annual Meeting, New York, N.Y.
R, Th	43. Biot, M. A., On the reflection of electromagnetic waves on a rough surface, J. Appl. Phys. 27 (9), 998 (Sept. 1956).
R, Th	44. Biot, M. A., Some new aspects of the reflection of electromagnetic waves on a rough surface, J. Appl. Phys. 28 (12), 1455–1463 (Dec. 1957).
R, Th, Ex	45. Birkebak, R. C., Monochromatic directional distribution of reflected thermal radiation from roughened surfaces, Ph. D. Dissertation, University of Minnesota, Minneapolis, Minn., 1962.
R, Ex	46. Birkebak, R. C., Dawson, J. P., McCullough, B. A., and Wood, B. E., Hemispherical reflectance of metal surfaces as a function of wavelength and surface roughness, Int. J. Heat Mass Transfer 10, 1225–1232 (1967).
R, Th, Ex	47. Birkebak, R. C. and Eckert, E. R. G., Effects of roughness of metal surfaces on angular distribution of monochromatic reflected radiation, J. Heat Transf., Trans. ASME C87, 85–93 (1965).
R, Ex	48. Birkebak, R. C., Sparrow, E. M., Eckert, E. R. G., and Ramsey, J. W., Effect of surface roughness on the total hemispherical and specular reflectance of metallic surfaces, J. Heat. Transf., Trans. ASME C86 (2), 193–199 (May 1964).
Em, Th, Ex	49. Black, W. Z. and Schoenhals, R. J., A study of directional radiation properties of specially prepared V-groove cavities, Trans. ASME (J. Heat Transf.) 90C (4), 420–428 (Nov. 1968).
H, Ex	50. Black, W. Z. and Schoenhals, R. J., An experimental study of radiation heat transfer from parallel plates with direction-dependent properties, ASME Paper No. 70-HT/SpT-1, 1–6 (1970).
R, Th	51. Blakely, J. M. and Olson, D. L., Intensity distribution from a sinusoidal grating and application to diffusion measurements, Appl. Phys. 39 (7), 3476–3479 (June 1968). AD-682 663.
H, Th	52. Bobco, R. P., A script-F matrix formulation for enclosures with arbitrary surface emission and reflection characteristics, ASME Paper No. 70-HT/SpT-3, 1–8 (1970).
S, Th	53. Bocharov, V. G. and Bass, F. G., On the scattering of electromagnetic waves from a statistically inhomogeneous surface, Radio Eng. & Electron. (USSR), 3 (4), 184–187 (1958).
R, Th	54. Boerner, W. M., Compatibility studies. Vol. IV. appendix 3, Scattering of a beam with finite beam width from an impedance surface, Rept. No. 68-16, pp. 1–208, School of Electrical Engineering, Pennsylvania Univ. (Feb. 1968). AD-829 846.
R, Th	55. Bonzel, H. P. and Gjostein, N. A., Diffraction theory of sinusoidal gratings and application to in situ surface self-diffusion measurements, J. Appl. Phys. 39 (7), 3480–3491 (June 1968).
S, Th	56. Bowman, J. J., Senior, T. B. A., and Uslenghi, P. L. E., Electromagnetic and acoustic scattering by simple shapes, Wiley Interscience Div. (John Wiley and Sons, Inc., New York, N.Y., 1970). AD-699 859.
R, Th	57. Brand, K. W. and Spagnolo, F. A., Lambert diffuse reflection from general quadric surfaces, Rept. No. RE-278J, 1–30, Grumman Aircraft Engineering Corp., Bethpage, N.Y., Research Dept. (Jan. 1967). AD-805 421.
R, Ex	58. Brandenburg, W. M. and Neu, J. T., Undirectional reflectance of imperfectly diffuse surfaces, J. Opt. Soc. Am. 56 (1), 97–103 (Jan. 1966).
S, Th	59. Brekhovskikh, L. M., Diffraction of waves on a rough surface I. General theory, Zhurnal Eksperimental’nol I Theoreticheskoi Fiziki (J. Exptl. Theo. Phys. USSR) 23, 275–288 (1952). Translated by Goss, R. N., U.S. Naval Electronics Lab., San Diego, Calif., in Three papers on diffraction of waves from a rough surface. pp. 1–22a.
S, Th	60. Brekhovskikh, L. M., Diffraction of waves on a rough surface II. Applications of the general theory, Zhurnal Eksperimental’nol I Theoreticheskoi (J. Exptl. Theo. Phys. USSR) 23, 289–304 (1952). Translated by Goss, R. N., U.S. Naval Electronics Lab., San Diego, Calif., In Three papers on diffraction of waves from a rough surface. pp. 23–38g.
SM	61. Broadston, J. A., Education for surface texture assessment, Proceedings 1967–68 of International Conference on Properties and Metrology of Surfaces, Vol. 182, Part 3K. Institution of Mechanical Engineers, London (Millson, R. J., Ed.).
R, Th	62. Brockelman, R. A. and Hagfors, T., Note on the effect of shadowing on the backscattering of waves from a random rough surface, IEEE Trans. on Antennas and Propagation, AP-14, 621–629 (Sept. 1966).
S, Ex	63. Bruehlman, R. J., Thomas, L. W., and Gonick, E., Effect of particle size and pigment volume concentration on hiding power of titanium oxide, (E. I. du Pont de Nemours and Co., Inc.), Official Digest, 252–267 (Feb. 1961).
SM	64. Bryan, J., Resume and critique of papers in part eight, International Research in Production Engineering, pp. 647–658 (1963). Published by ASME.
SM	65. Bryan, J. B. and Mohl, O., Microinterferometric scanning for full surface metrology, ASME Paper No. 64-WA/PROD-15, 1–7, Winter Annual Meeting, New York, N.Y., Nov. 29–Dec. 4, 1964 of ASME.
SM	66. Bufalini, J. J., An Investigation of methods of determining surface roughness of metals, Master Thesis, Dept. of Chemistry, Univ. of Arkansas (1958).
R, Th	67. Bullington, K., Reflection coefficients of irregular terrain, Proc. IRE 42, 1258–1262 (Aug. 1954).
S, Th	68. Burke, J. E. and Twersky, V., On Scattering of waves by an elliptic cylinder and by a semielliptic protuberance on a ground plane, J. Opt. Soc. Am. 54 (6), 732–744 (June 1964).
SM	69. Butler, R. D. and Pope, R. J., Surface roughness and lubrication in sheet metal working, pp. 162–170, PMS* Proceedings, 1967–68.
Em	70. Caren, R. P. and Liu, C. K., Thermal radiation from a microscopically roughened dielectric surface, J. Heat Transfer, 73–79 (Feb. 1972).
Ap(L)	71. Carpenter, R. L. and Dalton, W. A. J., A laser bidirectional reflectometer, Rept. MDC 69-023, pp. 1–10, McDonnell Aircraft Company, McDonnell Douglas Corp. (1969).
R, Ex	72. Chaabane, G., Pieroway, C, and Francis, J., Reflectance measurements of dielectric coatings on a conductor substrate, AIAA Paper No. 71-448 AIAA 6th Thermophysics Conference, Tullahoma, Tenn., Apr. 26–28, 1971.
SM	73. Chamberlin, J. L., Centerline correction for precision roughness specimens, J. Res. Nat. Bur. Stand. (U.S.) 69C (Eng. & Instr.), No. 4, 303–305 (Oct.–Dec. 1965).
R, P	74. Chen, Hsi-Shu, and Nagaraja, C. R., Polarization of light on reflection by some natural surfaces, Brit. J. Appl. Phys. (J. Phys. D.) 1, Ser. 2, 1191–1200 (1968).
S, P, Ex(L)	75. Cheo, P. K. and Renau, J., Wavelength dependence of total and depolarized back-scattered laser light from rough metallic surfaces, J. Opt. Soc. Am. 59 (7), 821–826 (1969).
S, Th	76. Chia, R. C., The theory of radar scatter from the ocean, Rept. No. CRES-TR-112-1, 1-125, Kansas Univ. Lawrence center for Research (Oct. 1968). AD-849 139.
R, Th	77. Christie, A. W., The luminous directional reflectance of snow, J. Opt. Soc. Am. 43, 621–622 (1953).
R(Ex)L, Th	78. Christie, F. A. and Devriendt, A. B., Bidirectional reflectance from surfaces formed by the ruling of orthogonal parallel V-grooves, AIAA Paper No. 72-55, 1–9, AIAA 10th Aerospace Sciences Meeting, San Diego, Calif., Jan. 17–19, 1972.
S, Th	79. Chu, C. M. and Churchill, S. W., Multiple scattering by randomly distributed obstacles–Methods of solution, IRE Trans. AP-4 (2), 142–148 (Apr. 1956).
SM	80. Chunin, B. A., Measuring depth of point defects in polished surfaces by means a linnik microinterferometer, Measurement Tech. No. 2, 276–277 (Feb. 1969). Translated from Izmeritel’naya Tekhnika, No. 2, 84–85 (Feb. 1969).
R, Th	81. Clarke, R. H., Theoretical characteristics of radiation reflected obliquely from a rough conducting surface, Proc. IEE 110 (1), 91–100 (Jan. 1963).
R, Th, Ex	82. Clarke, R. H. and Hendry, G. O., Prediction and measurement of the coherent and incoherent power reflected from a rough surface, IEEE Trans. on Antennas and Propagation, AP-12 (3), 353–363 (1964).
R, Ap	83. Comstock, D. F., Reflectance measurement by three-dimensional goniometry, Preprint (Appl. Opt.) (Arthur D. Little, Inc., 1968).
R, Th, Ex(L)	84. Condie, M. A., An experimental investigation of the statistics of diffusely reflected coherent light, Tech. Report No. AFAL-TR-66-387, Oct. 1966.
R, Th, Ex	85. Considine, P. S., Cronin, D. J., and Reynolds, G. O., Angular dependence of radiance of rough surfaces in imaging systems, J. Opt. Soc. Am. 56 (7), 877–883 (July 1966).
S, P, Ex	86. Cooke, D. D. and Kerker, M., Light scattering from long thin glass cylinders at oblique incidence, J. Opt. Soc. Am. 59 (1), 43–48 (1969).
S(L), Th	87. Crane, R. B., Use of a laser-produced speckle pattern to determine surface roughness, J. Opt. Soc. Am. 60 (12), 1658–1663 (Dec. 1970).
R, Th	88. Crowell, J. and Ritchie, R. H., Surface-plasmon effect in the reflectance of a metal, J. Opt. Soc. Am. 60 (6), 794–799 (June 1970).
S, Th(L)	89. Dainty, J. C, Some statistical properties of random speckle patterns in coherent and partially coherent illumination, Optica Acta 17 (10), 761–772 (1970).
R, Th	90. Daniels, F. B., Radar determination of the scattering properties of the moon, Nature 187 No. 4735, 399 (July 1960).
R, Th	91. Davies, H., The reflection of electromagnetic waves from a rough surface, Proc. Inst. Elec. Engr. 101, 118 (1954).
R, Th	92. Davies, H., The reflection of electromagnetic waves from a rough surface, Proc. IEE 101, 209–214 (1954).
R, Ex	93. Davies, J. M. and Zagieboylo, W., An integrating sphere system for measuring average reflectance and transmittance, Appl. Opt. 4 (2), 167–174 (1965).
R, Ex	94. Drummeter, L. F., Jr., and Fowler, W. B., Some angular reflectance properties of light-trapping surfaces, NRL Report No. 5753, 1–14, U.S. Naval Research Lab. (1962). AD-276 052.
SM	95. Dunin-Barkovsky, I. V., Analysis of surface irregularities by the spectral method, pp. 211–215, PMS* Proceedings, 1967–68.
R, Su	96. Dunn, S. T., A possible approach to evaluation of flux scattered by roughened surfaces, AIAA 3rd Aerospace Sciences Meeting, AIAA Paper No. 66–20 (Jan. 1966).
R, Em Su(Ex)	97. Dunn, S. T., Richmond, J. C., and Parmer, J. F., Survey of infrared measurement techniques and computational methods in radiant heat transfer, J. Spacecraft and Rockets, 962–975 (July 1966).
SM	98. Dupuy, M. O., High-precision optical prorilometer for the study of micro-geometrical surface defects, pp. 255–259, PMS* Proceedings, 1967–68.
SM	99. Eberle, O. A., Graphical method for statistical assessment of surface roughness comparison specimens, pp. 368–396, PMS* Proceedings, 1967–68.
R, Su	100. Edward, D. K., Radiative transfer characteristics of materials, J. Heat Transfer, Trans. ASME C91, 1–15 (1969).
H, Th	101. Edwards, D. K. and Bertak, I. V., Imperfect reflections in thermal radiation transfer, AIAA Paper No. 70-860, AIAA 5th Thermophysics Conference, June 1970.
R, Em, Th, Ex	102. Edwards, D. K. and Catton, I., Radiation characteristics of rough and oxidized metals, Symposium on Thermophysical properties, held at Purdue Univ., 1965, pp. 189–199.
P(L), Ex	103. Egan, W. G. and Hallock, H. B., Coherence-polarization, 1–38, Grumman Aircraft Engineering Corp., Bethpage, N.Y., Research Dept. (Mar. 1969). AD-849 398.
S, R, Th	104. Erma, V. A., Exact solution for the scattering of electromagnetic waves from bodies of arbitrary shape. III. obstacles with arbitrary electromagnetic properties, Phys. Rev. 179 (5), 1238–1246 (1969).
S, Ex(L)Th	105. Estes, L. E., Narducci, L. M., and Tuft, R. A., Scattering of light from a rotating ground glass, J. Opt. Soc. Am. 61 (10), 1301–1306 (Oct. 1971).
R, Ex, Ap	106. Euler, J., Reflexionsmessungen an gesandetem aluminium, Z. Angen Physik 1 (12), 569–573 (1949).
R, Th	107. Evans, L. B., Chu, C. M., and Churchill, S. W., The effect of anisotropic scattering on radiant transport J. Heat Transfer Trans. ASME C87 (3), 381–387 (1965).
S, R, Th	108. Fante, R. L., Discussion of a model for rough surface scattering, IEEE Trans, on Antennas and Propagation, AP-13 (4), 652–653 (1965).
R, Th	109. Fedders, P. A., Surface roughness and the absorption of electromagnetic waves in simple metals, Phys. Rev. 181 (3), 1053–1058 (1969).
S, Th	110. Felsen, L. B., Comment on the paper, The scattering of electromagnetic waves by a corrugated sheet, by T. B. A. Senior, Can. J. Phys. 37, 1563–1565 (1959).
SM	111. Felstead, E. B., Additional optical data processing techniques for surface roughness studies, Proc. IEEE 57 (3), 343–344 (Mar. 1969).
R, Th	112. Fenstermaker, C. A. and McCrackin, F. L., Errors arising from surface roughness in ellipsometric measurement of the refractive index of a surface, Surface Sci. 16, 85–96 (1969).
H	113. Fischer, W. D. and Hering, R. G., Radiant heat transfer between nongray directional surfaces, AIAA Paper No. 72-306, 1–7, AIAA 7th Thermophysics Conference, San Antonio, Tex., Apr. 10–12, 1972.
R, S, Su	114. Friedhoffer, J. A., Scattering of electromagnetic waves by rough surfaces, Rept. No. BRL-MR-1805, 1–29, Ballistic Research Labs., Aberdeen Proving Ground, Md. (Nov. 1966). AD-813 377.
SM	115. Funai, A. I. and Rolling, R. E., Inspection techniques for characterization of smooth, rough, and oxidized surfaces, AIAA Progress in Aeronautics and Astronautics: Thermophysics of Spacecraft and Planetary Bodies (G. B. Heller, ed.), 20, 41–64 (Academic Press, New York, N.Y., 1967).
R, S, Th	116. Fung, A. K., Theory of radar scatter from rough surfaces, bistatic and monostatic, with application to lunar radar return, J. Geophys. Res. 69 (6), 1063–1073 (Mar. 1964).
S, P, Th	117. Fung, A. K., Scattering and depolarization of EM waves from a rough surface, Proc. IEEE 54, 395–396 (1966).
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^*Properties and Metrology of Surface–Proceedings 1967–68, Vol. 82, part 3k, Presented at International Conference organized by the Institution of Mechanical Engineers at Oxford, 1st to 4th April 1968.

The bibliography, while extensive, is by no means complete. Few additions have been made since about 1972. However, it is sufficiently extensive to be of significant help to workers in the field, and particularly to those just beginning work in the field.

The references from archival journals should be available in any good technical library. Most of the reports that have not been published in the archival literature are available from the National Technical Information Service. Most of these are identified by an AD number, or other identifying number by which they can be ordered.

Copies of all papers listed are on file in the Radiometric Physics Section of the National Bureau of Standards, and may be read at NBS if not otherwise available.