Skip to main content
Scientific Reports logoLink to Scientific Reports
. 2017 Apr 10;7:45878. doi: 10.1038/srep45878

Corrigendum: Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways

Xiahan Sang, Andrew R Lupini, Jilai Ding, Sergei V Kalinin, Stephen Jesse, Raymond R Unocic
PMCID: PMC5385964  PMID: 28394316

Scientific Reports 7: Article number: 43585 10.1038/srep43585; published online: March 08 2017; updated: April 10 2017

In this Article, an affiliation has been omitted for Jilai Ding. The correct affiliations are listed below:

Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.

School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA.

In addition, the Acknowledgements section in this Article is incomplete.

“Research supported by Oak Ridge National Laboratory’s (ORNL) Center for Nanophase Materials Sciences (CNMS), which is a U.S. Department of Energy (DOE), Office of Science User Facility (XS, JD, SVK, SJ, RRU), by the Division of Materials Sciences and Engineering, Office of Basic Energy Sciences, DOE (ARL) and by ORNL’s Laboratory Directed Research and Development Program, which is managed by UT-Battelle LLC for the U.S. DOE (SJ)”.

should read:

“Research supported by Oak Ridge National Laboratory’s (ORNL) Center for Nanophase Materials Sciences (CNMS), which is a U.S. Department of Energy (DOE), Office of Science User Facility (XS, SVK, RRU), by the Division of Materials Sciences and Engineering, Office of Basic Energy Sciences, DOE (ARL), by the ORNL GO! Fellowship program (JD) and by ORNL’s Laboratory Directed Research and Development Program, which is managed by UT-Battelle LLC for the U.S. DOE (SJ)”.


Articles from Scientific Reports are provided here courtesy of Nature Publishing Group

RESOURCES