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Journal of Applied Crystallography logoLink to Journal of Applied Crystallography
. 2018 Feb 1;51(Pt 1):230. doi: 10.1107/S1600576718000171

Reconstructing three-dimensional protein crystal intensities from sparse unoriented two-axis X-ray diffraction patterns. Corrigendum

Ti-Yen Lan a, Jennifer L Wierman b,c, Mark W Tate a, Hugh T Philipp a, Veit Elser a, Sol M Gruner a,b,c,d,*
PMCID: PMC5822995  PMID: 29507552

Corrigendum to J. Appl. Cryst. (2017), 50, 985–993.

Keywords: X-ray serial microcrystallography, sparse data, EMC algorithm, protein microcrystallography, synchrotron radiation sources

Abstract

A figure in the article by Lan, Wierman, Tate, Philipp, Elser & Gruner [J. Appl. Cryst. (2017), 50, 985–993] is corrected.


The color code of the curves in Fig. 3 on p. 989 of the article by Lan et al. (2017) is incorrect. The correct code (as shown in Fig. 1) is as follows:

Figure 1.

Figure 1

The corrected version of Fig. 3 of Lan et al. (2017). The average signal-to-noise ratio of the integrated reflections from the converged intensity maps at different stages of the reconstruction. The increase of Inline graphic at high q indicates the reconstruction of high-resolution peaks. The 2.27 Å resolution determined by CC* is marked by the black dashed line.

Topmost (black) curve: local (n c, n f) = (60, 150)

Second from top (blue) curve: local (n c, n f) = (60, 100)

Third from top (red) curve: standard, n = 40

Bottom (green) curve: local (n c, n f) = (40, 60)

References

  1. Lan, T.-Y., Wierman, J. L., Tate, M. W., Philipp, H. T., Elser, V. & Gruner, S. M. (2017). J. Appl. Cryst. 50, 985–993. [DOI] [PMC free article] [PubMed]

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