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Published in final edited form as: Phys Rev B. 2018;98:10.1103/PhysRevB.98.045412. doi: 10.1103/PhysRevB.98.045412

Quantum transport in graphene p-n junctions with moiré superlattice modulation

Jiuning Hu 1,2,*, Albert F Rigosi 1,, Ji U Lee 3, Hsin-Yen Lee 1,4, Yanfei Yang 1,2, Chieh-I Liu 1,5, Randolph E Elmquist 1, David B Newell 1
PMCID: PMC6463535  NIHMSID: NIHMS1506532  PMID: 30997442

Abstract

We present simulations of quantum transport in graphene p-n junctions (pnJs) in which moiré superlattice potentials are incorporated to demonstrate the interplay between pnJs and moiré superlattice potentials. It is shown that the longitudinal and Hall resistivity maps can be strongly modulated by the pnJ profile, junction height, and moiré potentials. Device resistance measurements are subsequently performed on graphene/hexagonal- boron-nitride heterostructure samples with accurate alignment of crystallographic orientations to complement and support the simulation results.

I. INTRODUCTION

Graphene has been established as having unique electrical and optical properties [14]. In particular, the heterostructures of graphene and hexagonal boron nitride (h-BN) have drawn intense attention recently [58]. Some examples of complex and interesting physical phenomena are Hofstadter’s butterfly [913], moiré superlattices [1416], the quantum Hall effect (QHE) in p-n junctions (pnJs) [1730], and Coulomb drag where h-BN is used as an insulating spacer layer [3135]. These phenomena make graphene-based devices a vanguard for exploring two-dimensional physics and can additionally be applied towards electron optics [36], photodetection [3741], and quantum Hall resistance standards [4248].

In a magnetic field, graphene devices display quantized Hall resistance values of

1(4n+2)he2,

where n is an integer, h is Planck’s constant, and e is the elementary charge. The bipolar nature of graphene allows both positive and negative n for fixed magnetic fields and the fabrication of tunable pnJs by external gates. When both sides of a pnJ are in the quantum Hall regime, the longitudinal resistivities across the pnJ depend on which Landauer-Büttiker edge states equilibrate at the junction [17,49,50]. An extensive analysis of this behavior was explored in previous reports, using tunable gates to adjust the pnJ [1720]. The longitudinal and Hall resistivity is measured as a function of the voltages from the two gates, yielding a two-dimensional parameter space, or “map” of the resistivity.

In the past few years, h-BN has been widely used as an encapsulation and supporting material to protect and enhance the quality of graphene and other van der Waals materials [5,6,10,51]. A moiré pattern can form when graphene and h-BN are stacked and electron transport in graphene can be modulated by the moiré pattern potential. Especially when their crystallization orientations are aligned within 1°, the moiré pattern wavelength can be larger than 10 nm, allowing the experimental observation of Hofstadter’s butterfly at accessible magnetic fields [1013], which significantly boosts the relevant theoretical studies [5255].

II. NUMERICAL SIMULATIONS

In this work, we report several numerical simulations describing the effects of a moiré superlattice presence on quantum Hall transport in pnJs. We employ a tight-binding model for a two-dimensional system composed of a graphene layer with an overlaying periodic potential representative of a moiré superlattice with a 10 nm periodicity, as seen in Fig. 1(a). These models were implemented by using the KWANT package [56,57]. The moiré superlattice potential and other details of simulation settings are adapted from Ref. [13], and fully elucidated in the Supplemental Material [58]. Three sets of simulations were performed. The first simulation involved mapping out the longitudinal resistivity of a graphene device with a perfectly straight pnJ profile and a randomized, or “rough,” pnJ profile. Both profiles are first simulated as is and then simulated with a moiré superlattice potential imposed on them. The second set of simulations explores the dependency of Hofstadter’s butterfly on the height of the pnJ energy barrier, and the third set shows the pnJ Hall and longitudinal resistivity maps at high magnetic field. This work is complemented by supporting experimental data collected from graphene/h- BN heterostructure devices, which typically display a moiré superlattice and whose accurate crystal alignment can lead to measurable physical effects such as Hofstadter’s butterfly.

FIG. 1.

FIG. 1.

(a) Illustration of graphene device with an imposed moiré superlattice potential. The chemical potentials are labeled by μL and μR and have a randomized junction profile to more accurately represent an actual device’s junction roughness. The rough pnJ profile appears as a dashed blue and red line along the center of the device. (b) Longitudinal resistivity is plotted as a function of μL and μR for a straight pnJ profile. (c) The same results as in panel (b) are plotted by using a rough pnJ profile. (d) When a moiré superlattice potential is imposed, the resistivity map visibly changes in an asymmetric manner, for both the straight pnJ profile in panel (d) and for the rough pnJ profile in panel (e), with the addition of satellite Dirac peaks. (f) Taking the solid purple and dotted blue lines in panel (e), the behaviors of the longitudinal resistivity are compared. (g) A zoom-in of panel (e) shows that a satellite Dirac peak does exist in this region, albeit at a much smaller value of resistivity. All presented longitudinal resistivity color scales are in units of h/2e2. For all maps, chemical potentials are in units of hvb, where v is the Fermi velocity and b is the reciprocal superlattice constant of approximately 0.53 nm−1 when the alignment between graphene and A-BN is nearly zero [14].

III. RESULTS OF NUMERICAL SIMULATIONS

A. Effects of junction profile and moiré potential

Numerical simulations were performed based on the specific device design shown in Fig. 1(a). All contact terminals are labelled with a numerical digit and the chemical potentials for the left and right regions of the sample are defined as μL and μR, respectively. The chemical potentials μL and μR are generally held at different values, but in this example illustration, the left region is marked in blue and held at a lower potential than the right region, which is marked in red. The chemical potentials are smoothly changed from μL and μR in the region enclosed by the blue and red dashed curves. A smaller illustration is included to help the reader visualize a three-dimensional rendering of the pnJ. The junction width of 50 nm is defined to be the average distance between the red and blue dashed curves in Fig. 1(a). The rough pnJ profile such as the one shown in Fig. 1(a) reflects a more accurate representation of the junction’s roughness, as inspired by data acquired from atomic force microscopy images on the real device’s junctions (see the Supplemental Material [58]).

Figures 1(d) and 1(e) show the simulations of longitudinal resistivity, plotted against μL and μR. Compared with the straight pnJ profile, the rough pnJ profile clearly gives rise to weaker interference patterns beside the main [Figs. 1(b)-1(e)] and satellite [Figs. 1(d) and 1(e)] Dirac peaks.

In Figs. 1(d) and 1(e), the simulations include a moiré superlattice potential imposed on the graphene-based device, with a straight and rough pnJ profile, respectively. Clearly, extra Dirac peaks emerge at |μL| = |μR| = 0.5hvb. Looking at the more realistic scenario presented in Fig. 1(e), we find an interesting behavior. The diagonal cut along the solid purple line gives an expected and symmetric behavior for the longitudinal resistivity, whereas the off-diagonal cut along the dark blue line gives an asymmetrical behavior, with both curves plotted in Fig. 1(f). A zoom-in of the seemingly featureless upper-right corner of Fig. 1(e) is shown in Fig. 1(g), demonstrating that the longitudinal resistivity is not strictly zero in this region, but rather has a satellite Dirac peak local maximum along 0.5 hvb = μL and 0.5 hvb = μR,albeit at amuchlower absolute resistivity. Generally, the satellite Dirac peaks arise due to expected dips in the density of states of graphene when it is subject to a superimposed, periodic potential [14,59,60]. Furthermore, the asymmetry in the resistance of those satellite Dirac peaks can be attributed to two main factors: (1) a breaking of electron-hole symmetry as a result of next-nearest-neighbor interlayer hopping and (2) the additional perturbations caused by the differences in on-site energies present in h-BN [14].

B. Hofstadter’s butterfly as a function of junction height

The second set of simulations was performed to predict the behavior of Hofstadter’s butterfly of the Hall and longitudinal resistivities in response to the height of the pnJ. In Fig. 2(a), an illustration depicts the rough pnJ profile while defining the barrier height tj. In Figs. 2(b) and 2(c), Hofstadter’s butterfly can be seen in the Hall and longitudinal resistivities, respectively, when plotted against average chemical potential, in units of the energy associated with Dirac electrons of wave vector b defined in Fig. 1 [11], and magnetic flux within a superlattice unit cell, in units of the magnetic flux quantum. In these two cases, the barrier height of the pnJ is zero, making an effectively homogeneous device. However, when the junction barrier height is 100 meV as in the cases of Figs. 2(d) and 2(e), the Hall resistivity map shifts to higher energy while the longitudinal resistivity map contains wider regions of the parameter space where the values are an order of magnitude higher, particularly within the region near zero energy.

FIG. 2.

FIG. 2.

(a) Illustration of a rough pnJ profile. The barrier height tj and the average chemical potential in the junction, μ are labeled. A moiré pattern potential was applied to the system. (b), (c) The Hall and longitudinal resistivity maps for a normal junctionless device are shown, respectively. They are plotted as a function of average chemical potential μ and the magnetic flux in units of the magnetic flux quantum Φ0. The recursive Hofstadter’s butterfly appears at the representative horizontal dashed lines at 1, 2/3, 1/2, and 1 /3. This graphing style applies to the remaining resistivity maps. (d), (e) The Hall and longitudinal resistivity maps are recalculated with a 200 meV pnJ barrier height. (f), (g) The maps are recalculated with a 400 meV pnJ barrier height.

Two noticeable changes can be observed with the Hall resistivity maps. As with the case in Fig. 1, an apparent asymmetry in the map appears to the left of the central parabolic feature and can be attributed to the satellite Dirac cones which form as a result of the superlattice potential and from the interlayer hopping effects mentioned earlier. Furthermore, if Fig. 2(b) is plotted on a logarithmic scale (see Supplemental Material [58]), the right satellite peak can be verified as having a significantly smaller influence on the overall Hall resistivity map than its counterpart on the left half of the graph. The corresponding longitudinal resistivity map also shows a pair of sharp satellite features, further exemplifying the asymmetry resulting from the aforementioned effects [14].

The second noticeable change is the obvious shifting of the Hall resistivity features with junction height. Since the Hall simulations are performed in the n-type region of the device, one may expect that a decrease in the potential will increase the local Fermi energy. In Fig. 2(d), the vertical, black dashed line between the large blue and red regions corresponds exactly to μ = tj = 100 meV (note that hvb is approximately 350 meV).

The trend can continue to be seen with a junction height of 200 meV in Figs. 2(f) and 2(g), where the Hall resistivity map further shifts to higher energy. The longitudinal resistivity map maintains its general appearance but becomes spread apart in parameter space, with the near-zero-energy region forming coherent and complex patterns of high resistivity at high magnetic fields.

The similar shape of the red area in Fig. 2(b) with Hall resistivity value of h/2e2 appeared in Figs. 2(e) and 2(g) with a longitudinal resistivity of h/2e2, a signature result of graphene pnJ [14,17,44]. This is more profound for higher pnJ barrier heights. For example, in Fig. 2(g), the two red areas are further separated along the horizontal axis and less disturbed by the complex patterns of the longitudinal resistivity.

C. Additional simulations for QHE modulations from moiré potential

The third set of simulations involves calculating the effect of a moiré superlattice potential on a rough pnJ profile at 14 T. In Fig. 3(a), the standard behavior of the Hall resistivity in the quantum Hall regime are simulated for reference. The longitudinal resistivity map in Fig. 3(b) resembles a similar map presented in Refs. [17,20], with the upper-left corner having a slightly expanded region of decreasing, step-like resistivity.

FIG. 3.

FIG. 3.

(a) Hall resistivity map plotted against chemical potentials μL and μR at 14 T with no moiré potential. The red and blue colors respectively indicate positive and negative fractions of h/2e2. (b) Longitudinal resistivity map for the same case as in panel (a). (c) Hall resistivity map plotted after including the effects of a moiré potential. The region within the dotted green rectangle is reproduced after an order-of-magnitude rescaling of the resistivity. (d) The longitudinal resistivity map is replotted to incorporate the effects of the moiré potential.

By reintroducing the moiré potential in the system, the simulations produce the responses in Figs. 3(c) and 3(d). The Hall resistivity map in Fig. 3(c) stays relatively intact on the right half of the graph, with the exception of the emerging white strips with zero Hall resistivity between the fractional values of h/2e2. The left half, however, is no longer symmetrical with respect to the right half. The region in the leftmost third of the map becomes more complex, so it is rescaled to highlight the drastic changes. The most obvious change is the reversal of the sign of the resistivity, with one strong feature and two weaker features specifically at μL/hvb = — 0.65,−0.8,−0.9, respectively. These sign reversals are another indication that the h-BN moiré potential introduces asymmetric satellite Dirac peaks whose asymmetric strengths are now to be expected. In the case of the longitudinal resistivity in Fig. 3(d), the moiré pattern potential can be seen strongly impacting the upper-left corner of the map to the extent that much of the parameter space which had a resistivity of 1.5h/2e2 is now zero, leaving behind the fractal-like ripples sustaining the original value. The bottom-right corner was lightly impacted in comparison, but ripples can still be observed in parts of the parameter space.

IV. EXPERIMENTAL METHODS AND RESULTS

As a proof of the basic concept, experimental results were pursued to test the numerical calculations. A heterostructure device based on graphene and h-BN was assembled using the flake pick-up method [51] with an orientation angle of about 1.4°, corresponding to a moiré periodicity of approximately 10 nm [61]. More information about sample fabrication can be found in the Supplemental Material [58]. In Fig. 4(a), an illustration shows the cross section of the device, containing the h-BN/graphene/h-BN sandwich atop the Si3N4 substrate, which has embedded tungsten gates below the surface. The separation between backgates is 50 nm. Each of the inner three gates has a width of 3 μm. The overall structural support comes from the SiO2 and Si layers below all of the other layers. Fig. 4(b) shows an optical image of two adjacent example devices. The contact terminals and backgates are numerically labelled.

FIG. 4.

FIG. 4.

(a) Illustration of a real graphene-based device showing the cross-section of the chip and the configuration of the embedded gates. (b) Optical image of an example device along with a drawing of the contact configuration along the larger device in the center of the image. The gold text in the drawing indicates the backgate contact number. (c) The data were acquired at 1.65 K with no magnetic field and are presented for the case of equal chemical potentials on the middle and rightmost regions of the device. (d) A resistance map is acquired for the voltages between —9 and 9 V for both regions of the pnJ, which is equivalent to modifying the chemical potential in Fig. 1(e).

After device processing, resistance measurements were performed to gauge the validity of our numerical calculations for a system with a moiré potential of approximately the same periodicity as well as a rough, 50 nm channel pn J profile. One result is shown in Fig. 4(c), where longitudinal resistance data were acquired on two sets of contacts while keeping the middle and rightmost section of the device at equal chemical potentials. The longitudinal resistance curves display the satellite Dirac peaks and matched the expected asymmetrical behavior shown in Fig. 1(f). The longitudinal resistance map in Fig. 4(d) can be compared with the corresponding resistivity map in Fig. 1(e). The experimental results are in agreement with the first and more foundational set of calculations involving the moiré potential’s influence on longitudinal resistivity. A faint cross can also be seen in the upper right corner of the map. The two maps’ trends are identical, giving supporting evidence for the basis of the presented numerical calculations.

V. CONCLUSIONS

In conclusion, we reported several numerical simulations that incorporate moiré superlattice potentials into graphene pnJs so that effects on quantum transport behaviors could be predicted for a more realistic h-BN/graphene/h-BN heterostructure device. Longitudinal and Hall resistivity maps were modulated by using various parameters, giving results on how the maps were altered by the junction profile, junction height, and moiré potentials. We also supported some of the numerical calculations with experimental data from device resistance measurements.

Supplementary Material

2

ACKNOWLEDGMENTS

A.F.R. would like to thank the National Research Council’s Research Associateship Program for the opportunity. The authors thank J. A. Stroscio for his assistance. Work done by Y.Y. was supported by federal Grant no. 70NANB12H185.

Footnotes

The authors declare no competing financial interest.

References

  • [1].Geim AK and Novoselov KS, Nat. Mater 6,183 (2007). [DOI] [PubMed] [Google Scholar]
  • [2].Castro Neto AH, Guinea F, Peres NMR, Novoselov KS, and Geim AK, Rev. Mod. Phys 81, 109 (2009). [Google Scholar]
  • [3].Novoselov KS, Fal’ko VI, Colombo L, Gellert PR, Schwab MG, and Kim KA, Nature (London) 490, 192 (2012). [DOI] [PubMed] [Google Scholar]
  • [4].Das Sarma S, Adam S, Hwang EH, and Rossi E, Rev. Mod. Phys 83, 407 (2011). [Google Scholar]
  • [5].Geim AK and Grigorieva IV, Nature (London) 499, 419 (2013). [DOI] [PubMed] [Google Scholar]
  • [6].Novoselov KS, Mishchenko A, Carvalho A, and Castro Neto AH, Science 353, aac9439 (2016). [DOI] [PubMed] [Google Scholar]
  • [7].Slotman GJ, van Wijk MM, Zhao P-L, Fasolino A, Katsnelson MI, and Yuan S, Phys. Rev. Lett 115, 186801 (2015). [DOI] [PubMed] [Google Scholar]
  • [8].Dean CR, Young AF, Meric I, Lee C, Wang L, Sorgenfrei S, Watanabe K, Taniguchi T, Kim P, Shepard KL, and Hone J, Nat. Nanotechnol 5, 722 (2010). [DOI] [PubMed] [Google Scholar]
  • [9].Hofstadter DR, Phys. Rev. B 14, 2239 (1976). [Google Scholar]
  • [10].Dean CR, Wang L, Maher P, Forsythe C, Ghahari F, Gao Y,Katoch J, Ishigami M, Moon P, Koshino M, Taniguchi T, Watanabe K, Shepard KL, Hone J, and Kim P, Nature (London) 497, 598 (2013). [DOI] [PubMed] [Google Scholar]
  • [11].Hunt B, Sanchez-Yamagishi JD, Young AF, Yankowitz M, LeRoy BJ, Watanabe K, Taniguchi T, Moon P, Koshino M, Jarillo-Herrero P, and Ashoori RC, Science 340, 1427 (2013). [DOI] [PubMed] [Google Scholar]
  • [12].Ponomarenko LA, Gorbachev RV, Yu GL, Elias DC, Jalil R, Patel AA, Mishchenko A, Mayorov AS, Woods CR, Wallbank JR, Mucha-Kruczynksi M, Piot BA, Potemski M, Grigorieva IV, Novoselov KS, Guinea F, Fal’ko VI, and Geim AK, Nature (London) 497, 594 (2013). [DOI] [PubMed] [Google Scholar]
  • [13].Diez M, Dahlhaus JP, Wimmer M, and Beenakker CWJ, Phys. Rev. Lett 112, 196602 (2014). [DOI] [PubMed] [Google Scholar]
  • [14].Yankowitz M, Xue J, Cormode D, Sanchez-Yamagishi JD,Watanabe K, Taniguchi T, Jarillo-Herrero P, Jacquod P, and LeRoy BJ, Nat. Phys 8, 382 (2012). [Google Scholar]
  • [15].Xue J, Sanchez-Yamagishi J, Bulmash D, Jacquod P, Deshpande A, Watanabe K, Taniguchi T, Jarillo-Herrero P, and LeRoy BJ, Nat. Mater 10, 282 (2011). [DOI] [PubMed] [Google Scholar]
  • [16].Wallbank JR, Mucha-Kruczynski M, Chen X, and Fal’ko VI, Ann. Phys 527, 359 (2015). [Google Scholar]
  • [17].Williams JR, DiCarlo L, and Marcus CM, Science 317, 638 (2007). [DOI] [PubMed] [Google Scholar]
  • [18].Huard B, Sulpizio JA, Stander N, Todd K, Yang B, and Goldhaber-Gordon D, Phys. Rev. Lett 98, 236803 (2007). [DOI] [PubMed] [Google Scholar]
  • [19].Özyilmaz B, Jarillo-Herrero P, Efetov D, Abanin DA, Levitov LS, and Kim P, Phys. Rev. Lett 99, 166804 (2007). [DOI] [PubMed] [Google Scholar]
  • [20].Klimov NN, Le ST, Yan J, Agnihotri P, Comfort E, Lee JU, Newell DB, and Richter CA, Phys. Rev. B 92, 241301 (2015). [Google Scholar]
  • [21].LaGasse SW and Lee JU, Phys. Rev. B 94, 165312 (2016). [Google Scholar]
  • [22].Young AF and Kim P, Nat. Phys 5, 222 (2009). [Google Scholar]
  • [23].Williams JR, Low T, Lundstom MS, and Marcus CM, Nat. Nanotechnol 6, 222 (2011). [DOI] [PubMed] [Google Scholar]
  • [24].Schmidt H, Rode JC, Belke C, Smirnov D, and Haug RJ, Phys. Rev. B 88, 075418 (2013). [Google Scholar]
  • [25].Amet F, Williams JR, Watanabe K, Taniguchi T, and Goldhaber-Gordon D, Phys. Rev. Lett 112, 196601 (2014). [DOI] [PubMed] [Google Scholar]
  • [26].Taychatanapat T, Tan JY, Yeo Y, Watanabe K, Taniguchi T, and Özyilmaz B, Nat. Commun 6, 6093 (2015). [DOI] [PubMed] [Google Scholar]
  • [27].Rickhaus P, Liu MH, Makk P, Maurand R, Hess S, Zihlmann S, Weiss M, Richter K, and Schönenberger C, Nano Lett 15, 5819 (2015). [DOI] [PubMed] [Google Scholar]
  • [28].Kumada N, Parmentier FD, Hibino H, Glattli DC, and Roulleau P, Nat. Commun 6, 8068 (2015). [DOI] [PMC free article] [PubMed] [Google Scholar]
  • [29].Lee J, Wong D, Velasco J Jr., Rodriguez-Nieva JF, Kahn S, Tsai H-Z, Taniguchi T, Watanabe K, Zettl A, Wang F, Levitov LS, and Crommie MF, Nat. Phys 12, 1032 (2016). [Google Scholar]
  • [30].Ghahari F, Walkup D, Gutiérrez C, Rodriguez-Nieva JF, Zhao Y, Wyrick J, Natterer FD, Cullen WG, Watanabe K, Taniguchi T, Levitov LS, Zhitenev NB, and Stroscio JA, Science 356, 845 (2017). [DOI] [PMC free article] [PubMed] [Google Scholar]
  • [31].Gorbachev RV, Geim AK, Katsnelson MI, Novoselov KS, Tudorovskiy T, Grigorieva IV, MacDonald AH, Watan- abe K, Taniguchi T, and Ponomarenko LA, Nat. Phys 8, 896 (2012). [Google Scholar]
  • [32].Kim S and Tutuc E, Solid State Commun. 152, 1283 (2012). [Google Scholar]
  • [33].Li JIA, Taniguchi T, Watanabe K, Hone J, Levchenko A, and Dean CR, Phys. Rev. Lett 117, 046802 (2016). [DOI] [PubMed] [Google Scholar]
  • [34].Kim S, Jo I, Nah J, Yao Z, Banerjee SK, and Tutuc E, Phys. Rev. B 83, 161401(R) (2011). [Google Scholar]
  • [35].Hu J, Wu T, Tian J, Klimov NN, Newell DB, and Chen YP, Nano Energy 40, 42 (2017). [Google Scholar]
  • [36].Chen S, Han Z, Elahi MM, MasumHabib KM, Wang L, Wen B, Gao Y, Taniguchi T, Watanabe K, Hone J, Ghosh AW, and Dean CR, Science 353, 1522 (2016). [DOI] [PubMed] [Google Scholar]
  • [37].Mueller T, Xia F, and Avouris P, Nat. Photonics 4, 297 (2010). [Google Scholar]
  • [38].Xia F, Mueller T, Lin Y, Valdes-Garcia A, and Avouris P, Nat. Nanotechnol 4, 839 (2009). [DOI] [PubMed] [Google Scholar]
  • [39].Fang J, Wang D, DeVault CT, Chung T-F, Chen YP, Boltasseva A, Shalaev VM, and Kildishev AV, Nano Lett. 17, 57 (2017). [DOI] [PubMed] [Google Scholar]
  • [40].Schuler S, Schall D, Neumaier D, Dobusch L, Bethge O, Schwarz B, Krall M, and Mueller T, Nano Lett. 16, 7107 (2016). [DOI] [PubMed] [Google Scholar]
  • [41].Gan X, Shiue R-J, Gao Y, Meric I, Heinz TF, Shepard K, Hone J, Assefa S, and Englund D, Nat. Photonics 7, 883 (2013). [Google Scholar]
  • [42].Yang Y, Cheng G, Mende P, Calizo IG, Feenstra RM, Chuang C, Liu C-W, Jones GR, Hight Walker AR, and Elmquist RE, Carbon 115, 229 (2017). [DOI] [PMC free article] [PubMed] [Google Scholar]
  • [43].Rigosi AF, Glavin NR, Liu C-I, Yang Y, Obrzut J, Hill HM, Hu J, Lee H-Y, Hight Walker AR, Richter CA, Elmquist RE, and Newell DB, Small 13, 1700452 (2017). [DOI] [PMC free article] [PubMed] [Google Scholar]
  • [44].Tzalenchuk A, Lara-Avila S, Kalaboukhov A, Paolillo S, Syväjärvi M, Yakimova R, Kazakova O, Janssen TJBM, Fal’ko V, and Kubatkin S, Nat Nanotechnol. 5, 186 (2010). [DOI] [PubMed] [Google Scholar]
  • [45].Rigosi AF, Liu C-I,Glavin NR, Yang Y, Hill HM, Hu J, Hight Walker AR, Richter CA, Elmquist RE, and Newell DB, ACS Omega 2, 2326 (2017). [DOI] [PMC free article] [PubMed] [Google Scholar]
  • [46].Ribeiro-Palau R, Lafont F, Brun-Picard J, Kazazis D, Michon A, Cheynis F, Couturaud O, Consejo C, Jouault B, Poirier W, and Schopfer F, Nat. Nanotechnol 10, 965 (2015). [DOI] [PubMed] [Google Scholar]
  • [47].Janssen TJBM, Tzalenchuk A, Yakimova R, Kubatkin S, Lara-Avila S, Kopylov S, and Fal’ko VI, Phys. Rev. B 83, 233402 (2011). [DOI] [PubMed] [Google Scholar]
  • [48].Fukuyama Y, Elmquist RE, Huang L-I, Yang Y, Liu F-H, and Kaneko N-H, IEEE Trans. Instrum. Meas 64, 1451 (2015). [Google Scholar]
  • [49].Abanin DA and Levitov LS, Science 317, 641 (2007). [DOI] [PubMed] [Google Scholar]
  • [50].Lohmann T, von Klitzing K, and Smet JH, Nano Lett. 9, 1973 (2009). [DOI] [PubMed] [Google Scholar]
  • [51].Wang L, Meric I, Huang PY, Gao Q, Gao Y, Tran H, Taniguchi T, Watanabe K, Campos LM, Muller DA, Guo J, Kim P, Hone J, Shepard KL, and Dean CR, Science 342, 614(2013). [DOI] [PubMed] [Google Scholar]
  • [52].Park C-H, Yang L, Son Y-W, Cohen ML, and Louie SG, Nat. Phys. 4, 213 (2008). [Google Scholar]
  • [53].Park C-H, Yang L, Son Y-W, Cohen ML, and Louie SG, Phys. Rev. Lett 101, 126804 (2008). [DOI] [PubMed] [Google Scholar]
  • [54].Brey L and Fertig HA, Phys. Rev. Lett 103, 046809 (2009). [DOI] [PubMed] [Google Scholar]
  • [55].Burset P, Yeyati AL, Brey L, and Fertig HA, Phys. Rev. B 83, 195434 (2011). [Google Scholar]
  • [56].Groth CW, Wimmer M, Akhmerov AR, and Waintal X, New J. Phys 16, 063065 (2014). [Google Scholar]
  • [57].Commercial equipment, instruments, and materials are identified in this paper in order to adequately specify the experimental procedure. Such identification is not intended to imply recommendation or endorsement by the National Institute of Standards and Technology or the United States government, nor is it intended to imply that the materials or equipment identified are necessarily the best available for the purpose.
  • [58].See Supplemental Material at http://link.aps.org/supplemental/10.1103/PhysRevB.00.000000 for sample preparation, AFM, additional setup and device images, and simulations of the 150 nm junction profile.
  • [59].Li G, Luican A, Lopes dos Santos JMB, Castro Neto AH, Reina A, Kong J, and Andrei EY, Nat. Phys 6, 109 (2010). [Google Scholar]
  • [60].Wallbank JR, Patel AA, Mucha-Kruczyήski M, Geim AK, and Fal’ko VI, Phys. Rev. B 87, 245408 (2013). [Google Scholar]
  • [61].Hermann K, Phys J: Condens. Matter 24, 314210 (2012). [DOI] [PubMed] [Google Scholar]

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