Skip to main content
Nature Communications logoLink to Nature Communications
. 2019 Sep 27;10:4465. doi: 10.1038/s41467-019-12471-4

Publisher Correction: An electrochemical thermal transistor

Aditya Sood 1,2,#, Feng Xiong 1,3,9,#, Shunda Chen 4, Haotian Wang 1,10, Daniele Selli 5,11, Jinsong Zhang 1, Connor J McClellan 3, Jie Sun 1,12, Davide Donadio 4,6, Yi Cui 1,7,, Eric Pop 1,3,8,, Kenneth E Goodson 1,2,
PMCID: PMC6764990  PMID: 31562331

Correction to: Nature Communications 10.1038/s41467-018-06760-7, published online 30 October 2018.

The original version of this Article contained an error in Fig. 2a in which the label on the y-axis incorrectly read ‘Al/MoS2OiS/2’ rather than the correct ‘Al/MoS2/SiO2’.

Further, the original version contained an error in the last sentence of the seventh paragraph of the Discussion which incorrectly read ‘Reducing the temperature swing can have a significant effect on device reliability as the relationship between ΔT and the number of cycles to failure Nf is strongly non-linear38, Nf ~ ΔT−3,5’. The correct version states ‘ΔT−3.5’ in place of ‘ΔT−3,5’.

This has been corrected in both the PDF and HTML versions of the Article.

Contributor Information

Yi Cui, Email: yicui@stanford.edu.

Eric Pop, Email: epop@stanford.edu.

Kenneth E. Goodson, Email: goodson@stanford.edu


Articles from Nature Communications are provided here courtesy of Nature Publishing Group

RESOURCES