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. 2020 Feb 18;11(2):211. doi: 10.3390/mi11020211

Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. Micromachines 2019, 10, 799

José María De Teresa 1,2,*, Pablo Orús 1, Rosa Córdoba 3, Patrick Philipp 4
PMCID: PMC7074676  PMID: 32085657

In Section 3.1 (page 4) [1], on the fourth line, it says “C/cm2”. It should be changed to “μC/cm2”.

The editorial office would like to apologize for any inconvenience caused to the authors and readers.

References

  • 1.De Teresa J.M., Orús P., Córdoba R., Philipp P. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. Micromachines. 2019;10:799. doi: 10.3390/mi10120799. [DOI] [PMC free article] [PubMed] [Google Scholar]

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