Table 3:
REAPR statistics showing the percentage of error-free bases in the assembly, N50s before and after breaking at breakpoints, the percentage decrease in scaffold N50 after breaking, and the fragment coverage distribution (FCD) errors including errors across gaps
| No. | Assembly name | % error-free | Original N50 (Mb) | REAPR broken N50 (Mb) | % reduction | FCD errors |
|---|---|---|---|---|---|---|
| A1 | w2rap | 80.83 | 0.3 | 0.29 | 2 | 6,065 |
| A2 | w2rap + lmp | 79.10 | 2.61 | 1.13 | 57 | 8,213 |
| A3 | 10x | 85.90 | 5.26 | 1.69 | 68 | 11,379 |
| A4 | 10x + lmp | 85.35 | 10.33 | 1.86 | 82 | 9,095 |
| A5 | w2rap + bionano | 76.05 | 0.85 | 0.52 | 38 | 4,523 |
| A6 | w2rap + lmp + bionano | 78.38 | 5.73 | 2.06 | 64 | 7,392 |
| A7 | 10x + bionano | 84.65 | 10.84 | 2.00 | 82 | 13,068 |
| A8 | 10x + lmp + bionano | 84.75 | 21.00 | 1.86 | 91 | 11,531 |
| A9 | w2rap + 10x | 81.09 | 5.58 | 0.57 | 90 | 7,601 |
| A10 | w2rap + lmp + bionano + 10x | 77.80 | 14.05 | 1.75 | 88 | 9,488 |