Correction to “Partial Pressure Assisted Growth of Single-Layer Graphene Grown by Low-Pressure Chemical Vapor Deposition: Implications for High-Performance Graphene FET Devices”

There were two errors in our recent online published article, and the corrections are given below. These corrections do not affect the conclusions of the published article.

Correction to Figure 2d: We recently realized that the optical image SC2 sample at 5× magnification used in Figure 2d of the published article was not at the same conditions as described in the text. Therefore, the corrected Figure 2d has been given below.

Figure 2d.

The figure caption is the same as in the published article.

Correction to Figure 4 and its relevant text: Figure 4 in the published article does not belong to the sample SC2 which was an unexpected lapse and was observed after the online publication. Therefore, it is very essential to give the correct Figure 4. This correction reveals the same conclusion as drawn from optical microscopy and Raman spectroscopy, and it will not affect the quality of single-layer graphene. The relevant text (Page no. 22112–22113) regarding this figure has been given as follows:

Figure 4.

(a, b) AFM image with the height profile of (a, b) graphene and (c, d) continuous graphene on the Si/SiO₂ substrate (sample SC2).

“After optical and Raman examination, samples SC2 have been explored using atomic force microscopy (AFM). The thickness and uniformity of the graphene film are confirmed by AFM in contact mode (model: 5500; Agilent Technologies), as shown in Figure 4a,b and 4c,d, respectively. Figure 4a,c shows large area graphene, and Figure 4b,d shows the height profile of graphene. Figure 4b shows the thickness of graphene. Theoretically, the thickness of graphene is 0.345 nm, but here the results show the thickness of 2.5 nm. The theoretically and experimentally extracted thickness difference is due to adsorption of air or water molecules on graphene during the transfer process and a change in cohesive forces between the substrate and graphene films. AFM instrument offset also has an added impact toward showing more than the expected thickness of the graphene film. Figure 4c and 4d shows uniformity of graphene as there is a small variation shown in the height profile of continuously grown graphene.”