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. 2021 Sep 29;597(7878):660–665. doi: 10.1038/s41586-021-03867-8

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© The Author(s) 2021

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 2 — a, TDTR heat dissipation curves of N-layer r-MoS₂ films. Inset: TDTR sample geometry. b, Measured thermal resistances across r-TMD films, where the error bars are the TDTR measurement uncertainties. The thermal conductivities for r-MoS₂ and r-WS₂ are calculated from the slope using the formula R_TDTR = R₀ + Nd/κ_⊥, whereby R₀ is the total interfacial thermal resistance. c, Experiment and MD simulation results of κ(T) of MoS₂ and r-MoS₂ films. The error bars to the MD simulations originate from the simulation uncertainties. The dotted lines connecting the individual data points are guides to the eye. d, LA (top) and TA (bottom) phonon dispersion curves of r-MoS₂ along the Γ–A direction. The dotted lines denote the acoustic curves corresponding to bulk MoS₂. e, Lifetime of LA and TA phonons parallel to the Γ–A direction in bulk and r-MoS₂. The dashed line is the LA mode vibration period derived from the dispersion curve in d.

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