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. 2022 Mar 1;9(Pt 2):328. doi: 10.1107/S2052252522000501

An advanced workflow for single-particle imaging with the limited data at an X-ray free-electron laser. Corrigendum

Dameli Assalauova a, Young Yong Kim a, Sergey Bobkov b, Ruslan Khubbutdinov a,c, Max Rose a, Roberto Alvarez d,e, Jakob Andreasson f, Eugeniu Balaur g, Alice Contreras h,i, Hasan DeMirci j,k, Luca Gelisio l, Janos Hajdu f,m, Mark S Hunter n, Ruslan P Kurta o, Haoyuan Li p,n, Matthew McFadden i, Reza Nazari d,q, Peter Schwander r, Anton Teslyuk b,s, Peter Walter n, P Lourdu Xavier l,n,t, Chun Hong Yoon n, Sahba Zaare d,n, Viacheslav A Ilyin b,s, Richard A Kirian d, Brenda G Hogue h,i,u, Andrew Aquila n,*, Ivan A Vartanyants a,c,*
PMCID: PMC8895016  PMID: 35371497

An error in the article by Assalauova et al. [IUCrJ (2020), 7, 1102–1113] is corrected.

Keywords: coherent X-ray diffractive imaging (CXDI), free-electron lasers, single particles, XFEL

Abstract

An error in Fig. 3(c) of the article by Assalauova et al. [IUCrJ (2020), 7, 1102–1113] is corrected.


In Fig. 3(c) of the article by Assalauova et al. (2020), the values of PSD function for the manual single-hit selection were not correct (see corrected figure below). This update does not affect any conclusions made in the original paper.

Figure 3.

Figure 3

Classification of diffraction patterns by EM clustering. (c) Averaged PSD functions for EM-based single-hit selection containing 1085 patterns (blue line) and for manual selection containing 1393 patterns (orange line).

References

  1. Assalauova, D. et al. (2020). IUCrJ, 7, 1102–1113. [DOI] [PMC free article] [PubMed]

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