a. Venn diagrams showing the overlap between E/SEs
identified in normal GC B cells, GCB-DLBCL cell lines and ABC-DLBCL cell
lines. The shadowed area marks the subset of E/SEs interrogated in each of
the analyses shown in panels b and c (same row),
and the corresponding number is given for each subset inside the diagram.
The total number of E/SEs identified in GC B cells, GCB-DLBCL cell lines and
ABC-DLBCL cell lines appears outside the Venn diagram, in brackets. b,
c. Sample-based mutation frequency (b) and
percentage (c) of hypermutated E/SEs in primary BL and CLL
specimens grouped based on molecular subtypes (IGHV-unmutated: CLL-UM;
IGHV-mutated: CLL-M). The analysis of different regions (corresponding to
those highlighted in the aligned Venn diagram) is displayed in different
rows. In the graphs, each dot denotes one primary biopsy, and mutation
frequencies are expressed as fold changes vs. background, calculated in the
same sample as described in Methods.
The grey dashed line in panel b represents the background
mutation frequency, set at 1 for each sample (see Methods). All p-values were
calculated by two-sided Wilcoxon rank-sum test after BH correction. Note that 82% of hypermutated SEs in CLL map to the IG loci.